← Back to: Supervisors & Reset
What It Solves in Vehicles
Map vehicle electrical events—cold crank, load dump, and ISO-7637-2 3a/3b spikes—to supervisor/reset IC duties: precise thresholds, adequate hysteresis, robust deglitch (tDEB), and safe RESET semantics (tRST). Prefer monitoring on post-regulation rails; VBAT-side sensing is for coarse under-voltage alerts only.
Vehicle Events
Cold-crank valley and recovery ripple; load-dump high-energy pulse; ISO-7637-2 fast transients (3a/3b).
Effects on Rails
VBAT sag/overshoot, slow ramps, coupled spikes → risk of false resets or missing resets.
Supervisor Role
Detect → filter/deglich + hysteresis → assert/reset semantics → log to upper layer.
| Scenario | Primary Effect | Supervisor Function | Note |
|---|---|---|---|
| Cold crank | VBAT valley + slow recovery | Vth, ΔHyst, tDEB, tRST | monitor post-reg rails |
| Load dump | long high-energy hump | ΔHyst, tDEB | post-protection residuals |
| ISO-7637 3a/3b | fast transient spikes | windowed deglitch | tDEB ≥ 2×burst spacing |
Rail Checklist
List Vnom, Vmin,crank, Noisepk-pk, trise,slow, Reset(Y/N) for VBAT / 5V / 3.3V / AUX.
Quick Recipes
- tRST ≥ tPLL_lock + N×tCLK_DOM (N≈3–5)
- tDEB ≥ max(ripple half-period, DC/DC soft-start glitch)
- Monitor post-reg rails for accurate decisions
ISO-7637 / Load-Dump → Electrical Requirements
Translate automotive pulses into supervisor-side parameters: Vth, ΔHyst, tDEB, tRST, and dV/dt immunity. Consider the difference between pre-protection and post-protection residuals, and choose the sampling point wisely (VBAT side vs post-regulated rails).
| Event | Residual (post-protection) | Vth (min/max) | ΔHyst (est.) | tDEB (window/single) | tRST hint | Notes |
|---|---|---|---|---|---|---|
| Pulse 1 (neg.) | limited dip after clamp | set for minimum operating voltage | ≥1.5×(ripple+noise) | short; single-pole OK | ensure release margin | avoid chatter near Vth |
| Pulse 2a/2b (pos.) | capped positive surge | no trip; check comparator headroom | small to moderate | short; single or window | none or short stretch | watch dV/dt coupling |
| Pulse 3a/3b (fast) | narrow spikes remain | unchanged | low; rely on window filter | windowed; ≥2×burst spacing | no extra unless MCU needs | primary mitigation via tDEB |
| Load dump | long hump; reduced by clamps | no trip; design headroom | moderate | longer; single or window | ensure tRST covers settle | check regulator settle time |
| Sampling Point | Benefit | Risk | When to Use | Notes |
|---|---|---|---|---|
| VBAT side | sees raw events; early coarse alert | false trips; needs larger ΔHyst | rough undervoltage detection | log only; avoid direct reset decision |
| Post-regulated rail | accurate decision near MCU domain | may miss raw VBAT events | primary reset decision point | pair with VBAT tag if needed |
Quick Parameter Recipes
ΔHyst ≥ 1.5×(Ripplepk-pk + MeasNoiseeq) · tDEB ≥ 2×burst spacing for 3a/3b · Vth_tol ≤ 0.5×usable headroom · tREL ≥ tReg_settle + tMCU_bootstrap.
Thresholds, Windows & Delays under Cranking
Use window thresholds with hysteresis and well-chosen assert/release/stretch delays to avoid reboot storms during slow ramps and recovery ripple. Prefer windowed sampling for slow slopes.
Single vs Window
Window adds Vlow/Vhigh limits with hysteresis; better immunity to slow ramps and ripple than a single threshold.
Dynamic Hysteresis
Cold start: ΔHystcold = k×ΔVcrank (k≈0.3–0.5), decay to nominal within tdecay.
Delay Family
assert / release / stretch windows; set tREL ≥ tReg_settle + tMCU_bootstrap.
| Rail | Vnom | Vmin,crank / ΔVcrank | ΔHystcold(k,tdecay) | Vlow / Vhigh | tDEB(assert/release) | tRST(assert/release/stretch) | Sampling | Notes |
|---|---|---|---|---|---|---|---|---|
| 3.3 V | 3.3 | — / — | k=0.4, tdecay=100–300 ms | Vlow≥Vmin,oper+M; Vhigh≤Vabs,max−M | — / — | assert≥min; release≥tReg+tMCU; stretch as needed | window | fill per design |
| 5 V | 5.0 | — / — | k=0.3, tdecay=150–400 ms | Vlow/Vhigh with margin | — / — | stretch covers PLL lock | window | fill per design |
| AUX | var | — / — | k=0.5, tdecay=50–200 ms | limit for sensor/camera domain | — / — | stretch for long settle rails | window | fill per design |
Reset Semantics (OD/PP, Hold, Stretch, Latch)
Design RESET as a cross-domain interface: choose OD vs PP, calculate RPU vs bus capacitance for edge targets, avoid back-power, and use hold/stretch/latch windows to prevent chain resets.
| Domain (V) | Edge Target (ns) | RPU (kΩ) | Cbus (pF) | tRC (ns) | OD/PP | Risk | Mitigation |
|---|---|---|---|---|---|---|---|
| 3.3 | ≤ 200 | 4.7–22 | calc | RPU×Cbus | OD | slow edge / EMI | tune RPU, segment/buffer |
| 5.0 | ≤ 150 | 2.2–10 | calc | RPU×Cbus | PP | back-power | series/clamp/level shift |
| AUX | spec | spec | spec | calc | OD/PP | fanout overload | segment lines, add buffer |
ASIL-Friendly Interfaces & Diagnostics
Build supervisors as measurable, diagnosable, and traceable safety interfaces: redundant thresholds, explicit PG/FAULT semantics, and power-fail time tags. Keep a clean boundary with upper-layer ASIL mechanisms (signals and timing only).
Dual-Channel Consistency
Monitor Vth_A/B mismatch. Trigger FAULT when |Vth_A−Vth_B| > min(εabs, εrel·Vnom) sustained for tconfirm.
Power-Fail Tag
On brown-out, write a minimal set: rail_id, seq/ts, state, reason, CRC. Ensure twrite ≤ tholdup.
Self-Test Hooks
Power-on self-test bit; periodic test via forced RESET low or virtual UV injection. Schedule with Tselftest within service strategy.
| Signal | Level Domain (V) | Timing (assert/release) | Self-Test Method | Fault-Tag Fields | Notes |
|---|---|---|---|---|---|
| RESET_OUT | 3.3 / 5.0 | tassert/trelease/stretch | force low window | source_id · seq/ts · reason | log last_assertor |
| PG_rail_i | per rail | qualify window | UV simulate | rail_id · state | AND into PG_agg |
| FAULT | host domain | latched until clear | reason inject | reason · seq/ts · CRC | explicit clear policy |
PCB/Layout Rules for Immunity
Route supervisors to be hard-to-spook and decision-accurate under ISO-7637 noise: minimize loop area, place sampling near regulated outputs, protect RESET/PG lines, and use Kelvin sense with proper ground returns.
| Risk | Symptom | Layout Action | Check | Notes |
|---|---|---|---|---|
| Coupling from SW node | false reset spikes | reroute away; add series-R / RC / TVS | probe at RESET line; ISO-7637-3 inject | RC time ≤ tDEB/10 |
| Large loop area | chatter, EMI pickup | parallel return; ground fence vias | current-return visualization | single-point ground |
| Over/undershoot at input | window trip errors | RC snub; move sense post-filter | scope residuals pre/post filter | keep sensor path short |
Cross-Brand Selection Matrix
Multi-voltage / cross-domain boards → prefer OD output and pull up to the target I/O domain.
Heavy cranking ripple → increase ΔHyst and extend tDEB / tRST.
Camera/SoC domains → consider SBC/PMIC families with multi-rail supervision.
| Brand | Family / Representative PN | VIN Range | Vth Typ / Acc | Window (Y/N) | tRST Options | Output (OD/PP) | AEC-Q100 | Temp Grade | Pkg Height | ASIL Hooks | Notes (why pick) |
|---|---|---|---|---|---|---|---|---|---|---|---|
| TI | TPS3702-Q1 (dual-threshold/window supervisor) | 2.2–18 V (per variant) | UV/OV typ; ± acc (code-select) | Y (independent UV/OV) | Fixed/Selectable delays | OD or PP options | Yes (per suffix) | -40~125 °C | SOT/TSSOP low-profile | PG/RESET split, easy tag | Window + separate outputs simplify source tagging aggregation. |
| ST | STM706/708 (check automotive ordering) | Up to 5.5 V domain | Fixed Vth variants | N (single threshold) | Fixed pulse widths | OD / PP variants | Varies by option | -40~125 °C (typ.) | SOT-23 low-height | Basic RESET/PG | Cost-effective baseline reset for simple rails. |
| NXP | FS65 SBC (e.g., MC33FS6523) | VBAT domain + multiple rails (PMIC) | Config via SPI/I²C (family-specific) | Y (multi-rail) | Programmable / integrated | OD/PP per pin spec | Yes (SBC grade) | -40~125 °C / wider | QFN/PowerQFN | WDT/RESET/Diag ready | All-in-one for SoC/camera power trees with ASIL-friendly hooks. |
| Renesas | ISL88014 (adj. threshold) / ISL88031 (multi-rail) | 3.0–6 V (typ. family ranges) | Adjustable / fixed options | Y/N (per device) | Fixed / selectable | OD / PP variants | Varies by option | -40~125 °C (typ.) | SOT/QFN low-profile | PG/RESET split | Good coverage for adjustable/window use with light BOMs. |
| onsemi | NCV809 (MAX809-class, automotive) | 3.0/3.3/5.0 V variants | Fixed Vth options | N (single threshold) | Fixed pulse width(s) | OD / PP variants | Yes (NCV prefix) | -40~125 °C (typ.) | SOT-23 low-height | Basic RESET | Low-cost edge-domain reset; robust supply chain. |
| Microchip | MCP1316/MCP1317 (check AEC-Q100 codes) | Up to 5.5 V domain | Fixed / selectable codes | N (single threshold) | Short/med/long pulses | PP options for clean edges | Varies by option | -40~125 °C (typ.) | SOT-23 low-height | Basic RESET/PG | Push-pull versions suit fast-edge / higher fan-out needs. |
| Melexis | N/A (use external supervisor) — sensors/actuators integrate POR/BOD internally | — | — | — | — | — | — | — | — | Use with TI/ST/NXP/etc. | Pair with a discrete supervisor for system-level RESET/PG. |
Validation & Corner Cases (Env / Line / Func)
Env (Temperature)
-40 / 25 / 85 / 125 °C: sweep threshold drift and tRST variation; record seq/ts and CRC tag.
Line (Power Profiles)
Cold-crank replay, slow ramps, steps, ripple overlay, load transients; verify ΔHyst and tDEB rules.
Func (Behavior)
False-reset storms, late reset, PG chatter, window mis-trip; ensure logging and clear criteria.
| Case | Setup (waveform / amplitude / source-Z) | Expect (threshold / timing) | Pass / Fail Criteria | Log (event code / ts / temp) |
|---|---|---|---|---|
| ENV-T-Sweep | Chamber −40→125 °C; rail at Vnom | Vth drift ≤ spec; tRST within spec window | No false RESET; PG stable | rail_id, seq/ts, state, reason=ENV, CRC |
| ENV-Hold-Up | Power fail; verify write within t_hold_up | Tag recorded before collapse | Log contains seq/ts; CRC valid | rail_id, seq/ts, state=PF, CRC |
| LINE-Crank-Replay | VBAT low-valley + rebound ripple profile | No reset storm; tDEB filters ripple | ≤1 reset per event; PG converges | event=CRANK, ts, temp |
| LINE-Slow-Ramp | dV/dt = low; ripple overlay 50–200 mVpp | Window + ΔHyst avoid chatter; single RESET | No PG chatter > tDEB | event=SLOW_RAMP, ts |
| FUNC-False-Storm | Inject burst spikes (3a/3b residual) | tDEB prevents multi-fires; tag reasons | Assert ≤1; tag contains source_id | reason=SPIKE, seq/ts, CRC |
| FUNC-Late-Reset | Step droop near Vmin_oper; observe delay | tRST meets release spec; MCU cold start ok | PLL lock margin met; no brown-out relapse | state=RESET, ts, temp |
Coverage Checklist
- Env: thresholds and tRST across −40/25/85/125 °C.
- Line: crank profile, slow ramp, steps, ripple overlay, load switching.
- Func: false-reset storms, late reset, PG chatter, window mis-trip.
- Logging: minimal set = rail_id, seq/ts, state, reason, CRC.
Frequently Asked Questions
How do I translate ISO-7637 pulses into threshold, hysteresis, and delay specs?
Start from post-protection residuals: peak, duration, and slew. Map minimum operating voltage to Vth_low, add hysteresis sized to ripple plus measurement noise, and choose a deglitch window that exceeds the inter-spike spacing. For load dump, ensure reset delay covers regulator recovery. Prefer window supervisors when both undervoltage and overvoltage can appear during transients.
What reset pulse width guarantees a clean MCU clock domain after cold-crank?
Use a budget that exceeds clock and power settling: tRST >= tPLL_lock + 3 to 5 times the clock-domain start time, plus regulator settling margin. Include any boot ROM or supervisor release delay. If the power tree reorders during cranking, gate release on both stable voltage and a valid clock-good indicator to avoid partial starts.
When should RESET be open-drain instead of push-pull on mixed-voltage rails?
Choose open-drain when multiple domains or devices must share one reset line or when the receiving logic runs at a higher or different voltage. Pull up to the target I/O rail to ensure level compatibility. Prefer push-pull for single-domain, fast edges, and tight EMI control, but avoid back-powering and overvoltage on cross-domain paths.
How do I avoid chatter during slow ramps and alternator ripple?
Increase hysteresis to exceed ripple plus measurement noise, then apply a deglitch window longer than half the ripple period. Prefer integrating or K-of-M sampling rather than instantaneous comparison on slow slopes. During cranking, temporarily widen thresholds or extend delay, and release reset only after the regulator output is within margin and stable.
How much hysteresis is safe without masking real brown-outs?
Size hysteresis to at least one and a half times the expected ripple plus noise bandwidth, yet keep it below roughly half of the available voltage margin above the true minimum operating level. Validate at temperature corners and under ripple-injected tests. If nuisance trips persist, combine moderate hysteresis with a short deglitch window rather than huge hysteresis.
How do I log power-fail timing when VBAT collapses before the write?
Define a minimal record set and guarantee a hold-up window: rail_id, monotonic sequence or timestamp, state, reason, and CRC. Use a small buffer or capacitor-backed domain to complete the write. Without a secure real-time clock, rely on monotonic counters and rollover handling to maintain ordering and detect tamper or incomplete records.
What’s a robust deglitch filter for fast 3a/3b spikes?
Use a windowed digital filter or K-of-M sampling so isolated spikes do not trigger reset. Set the deglitch time longer than the inter-spike spacing observed after protection. Add a small series resistor and modest input capacitance to limit dV/dt injection, and confirm that the RC time constant remains well below functional delays.
How do I validate threshold accuracy across -40 to +125/150 °C?
Measure at -40, 25, 85, and 125 or 150 degrees Celsius using calibrated sources and the intended wiring harness. Record both threshold and reset timing drift, including pull-up effects on open-drain outputs. Accept parts only if worst-case results stay within data sheet limits and the aggregate margin still protects downstream clock and logic domains.
Can I share a supervisor across two rails without coupling fault domains?
Only if the device provides independent sense inputs and distinct outputs or tags per rail. Avoid tying rails through a single reset where one domain’s noise induces false trips on the other. Prefer multi-channel window supervisors or separate devices, and aggregate power-good signals with explicit source labels to preserve diagnostic clarity.
What’s the safest way to aggregate PG with other ASIL-relevant signals?
Use a directed wired-AND or logic gate so power-good requires all contributing rails to be valid. Attach a source_tag to any fault path and record reason and sequence. Time-align signals with small delays to avoid race conditions, and avoid anonymous OR networks that make root-cause analysis hard during field returns or audits.
How do I choose OD pull-up value to balance speed vs EMI?
Estimate rise time from RPU times bus capacitance and target an RC that meets edge-speed and EMI goals. Typical 3.3 volt domains start between 4.7 and 22 kiloohms and tune by measurement. For long lines or larger fan-out, split the net or buffer the reset to control capacitance rather than forcing very small pull-up resistors.
What procurement red flags indicate a risky “almost-equivalent” part?
Watch for looser threshold accuracy codes, missing AEC-Q100 references, different temperature grades, or taller packages that violate enclosure clearances. Scrutinize fixed delay codes, output type differences, and undocumented hysteresis. Unusual lead times, vague cross references, or relabeled lots are warning signs; demand traceable data sheets and parametric evidence before approval.