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← Back to: Supervisors & Reset

What It Solves

This page focuses on output type (push-pull vs open-drain), active polarity (high/low), and cross-domain pull-ups. It addresses back-power during partial power, slow release edges on shared lines, and polarity mismatches across 1.2/1.8/3.3/5 V domains. Window thresholds, delays/debounce, reset tree fanout, and watchdog topics are handled on sibling pages.

Mixed Voltage Domains

MCU/PMIC/FPGA run at different I/O levels (1.2/1.8/3.3/5 V); RESET must cross domains safely.

Action: Prefer OD + pull-up to the target domain for cross-domain reset.

Polarity Mismatch

Devices expose RESET (AH) and RESET#/RST_N (AL). Miswiring causes always-reset or never-reset.

Action: Unify polarity via OD + target pull-up; otherwise use a small inverter/gate.

Pre-bias & Back-power

PP across domains can feed target rails via ESD/clamp diodes during partial power or power-down.

Action: For PP cross-domain, add 100–330 Ω series + Schottky to target VDD and verify no self-bootstrap.

Shared Wire-OR Lines

Mismatched pull-up vs bus capacitance yields slow release and chatter on multi-source resets.

Action: Use single-point pull-up near the load and size RPU for rise-time.

Deliverable: Recipes A/B/C

Three wiring recipes mapped to domains and polarity: OD + target pull-up; PP same-domain; multi-source Wire-OR with RC.

Deliverable: Acceptance

Rise-time, sink current, power-down self-bootstrap ΔV, and cross-domain glitch window are explicitly verified.

Deliverable: Cross-Brand Map

Quick filtering by PP/OD and AH/AL families across the seven brands (datasheets linked with rel="nofollow" in the full page).

Reset problems, risks, and solution paths Left: mixed domains, polarity mismatch, pre-bias/back-power, shared wire-OR. Center: risks—always reset, never reset, self-bootstrap, chatter. Right: paths—OD target pull-up, PP series+Schottky, single-point pull-up with RC. What It Solves Problems Mixed voltage domains Polarity mismatch Pre-bias & back-power Shared wire-OR lines Risks Always reset Never reset Self-bootstrap Chatter & slow release Paths OD + pull-up to target PP + series + Schottky Single-point pull-up + RC
Problems → Risks → Paths. Alt: Key reset pitfalls and mitigation routes across domains and polarities.

Sizing rules: rise-time tr ≈ 2.2·RPU·CLINE, target tr ≤ 0.1·TFEED (or ≤1 µs whichever is stricter). For PP cross-domain, verify power-down self-bootstrap ΔVVDD<100 mV and leakage below clamp limits.

Polarity Basics: Active-High vs Active-Low

Definitions & Notation

AH (active-high) means high level asserts reset; AL (active-low) means low level asserts reset (typical pins: RESET#/RST_N). Datasheets vary in “assert/release” wording—lock BOM polarity, schematic symbol, and firmware comments together.

Selection Logic

  • Prefer AL for flexibility: easy wire-OR and cross-domain with OD outputs.
  • Use AH + PP for same-domain, low-jitter fast edges; add protection when crossing into lower domains.
  • When control and target polarities differ, first try OD + pull-up to the target polarity; otherwise add a small inverter/gate.

Acceptance Points

  • Across cold/hot start and brown-in/out, the assert/release windows remain correct (no polarity inversion glitch).
  • Documentation consistency: schematic, BOM Polarity(AH/AL), firmware comments 1:1 matched; ECO recorded for changes.
Polarity and output type matrix Four quadrants—PP-AH, PP-AL, OD-AH, OD-AL—with typical wiring, pros/cons, and common pitfalls. Corner hints: AL+OD is wire-OR & cross-domain friendly; PP+AH is low-jitter same-domain. Polarity × Output PP-AH Same-domain fast edge; low jitter. Cross-domain requires series + Schottky. PP-AL Needs level guarding into AL inputs. Common pitfall: back-power on lower rails. OD-AH Pull-up to AH domain; size RPU. Rise-time limited by R·C of the bus. OD-AL Wire-OR friendly across domains. Default choice for mixed systems. Hint: AL + OD → cross-domain & shared reset friendly. Hint: PP + AH → low-jitter same-domain; guard when crossing.
Four-quadrant matrix for polarity and output choices. Alt: Typical wiring, pros/cons, pitfalls, and corner hints.

Engineering takeaway: Default to OD + AL with the pull-up tied to the target rail to unify polarity and avoid back-power. If low jitter is paramount in a single domain, choose PP + AH but add a series resistor and Schottky clamp when any level crossing is possible. Always validate rise-time vs the feed window and re-check under −40~+125 °C and ±10% supply variation.

Output Stage: Push-Pull vs Open-Drain

Push-Pull (PP)

Active pull-up and pull-down (low output impedance) → fast edges, no pull-up needed. Risks: cross-domain VOH > Vtarget, back-power via input clamps, short-circuit current when fighting other drivers.

Open-Drain (OD)

Sinks only; requires external pull-up to the target domain. Benefits: wire-OR, cross-domain friendly. Tradeoff: rise-time set by RPU·CLINE → too slow causes chatter/late release.

Quick sizing: rise-time tr ≈ 2.2 · RPU · CLINE ; bus capacitance CBUS = ΣCTRACE + ΣCPIN ; sink current Isink ≥ (VPU − VOL,max) / RPU ; temperature domain (−40~+125 °C): tr ≤ 0.1 · TFEED (or ≤ 1 µs, whichever stricter).

PP in Same vs Cross Domains

  • Same-domain: low jitter, fast edges — ideal for AH direct drives.
  • Cross-domain: add 100–330 Ω series + Schottky to target VDD to prevent clamp-diode back-power.
  • Don’t wire-OR PP with other sources; avoid direct PP → low-voltage domains without guards.

OD for Wire-OR & Large Fan-In

  • Single-point pull-up at the load; consider small far-end RC (e.g., 100 Ω / 1–4.7 nF) to tame rebounds.
  • RPU range: 4.7–47 kΩ (use lower values for long traces / large fan-in). Check tr and Isink concurrently.
  • MCU internal pull-ups are not a substitute for external ones (tolerance/temperature/fan-in uncertainty).
Output stage models and rise-time comparison Top-left: push-pull equivalent; top-right: open-drain with pull-up and bus capacitance; bottom: three rise curves for 10k/22k/47k pull-ups with 10–90% markers. PP vs OD · Models & Rise-time Push-Pull (equivalent) Low Rout · active pull-up & pull-down Fast edges; guard when crossing domains Open-Drain (equivalent) RPU (to target) Rise by RPU·CLINE ; flexible cross-domain Rise-time with different pull-ups 10 kΩ 22 kΩ 47 kΩ 90% 10%
PP: low Rout, fast; OD: flexible with RPU·CLINE limits. Alt: Equivalent circuits and rise-time comparison.

Design Gates & Acceptance

  • Environment sweep: −40/25/85/125 °C, ±10% supply, pre-bias and power-down conditions.
  • Pass lines: tr ≤ 0.1·TFEED (or ≤1 µs), Isink ≥ spec, no ping-pong or false release, conflict current < protection limits.
  • Documentation: record RPU, CBUS estimate, worst-node waveforms & trigger conditions.

Level Domains & Cross-Domain Pull-Ups

Core Principles

  • OD: always pull up to the target domain (e.g., RESET#=1.8 V → pull-up to 1.8 V).
  • PP (source > target): add 100–330 Ω series + Schottky to VDDtarget to prevent clamp-diode back-power.
  • Power-up order: “disconnect then power” — pull-up rail last or synchronized with the target domain.

Clamp Paths & Self-Bootstrap

PP VOH can feed the target VDD via input clamps, lifting the rail during partial power. Validate especially in power-down and half-powered states with dual-channel probing (VDD vs RESET).

Acceptance & calculations: back-power current Ibp (target domain off) must keep ΔVVDD < 100 mV and remain below the device clamp limit; cross-domain glitch window (dV/dt overlapping threshold) < 50 µs or per your system budget.

Cross-domain strategies and back-power paths Three scenarios: OD to any domain with target pull-up; PP down-leveling with series resistor + Schottky; power-down self-bootstrap detection with probe points and arrows. Cross-Domain Strategies OD → any domain Pull-up goes to target rail Size RPU for tr and Isink PP → lower domain 100–330 Ω Series + Schottky to VDDtarget Prevents clamp-diode back-power Power-down self-bootstrap Probe VDDtarget Probe RESET line Probe pull-up source ΔVVDD < 100 mV Ibp below clamp limit Glitch window (dV/dt × threshold overlap) < 50 µs Notes Series: 100–330 Ω (tune vs edge conflict); Schottky: low VF/low leakage; Pull-up: E96 1% preferred.
OD uses target-rail pull-up; PP down-leveling needs series + Schottky; measure self-bootstrap on power-down. Alt: Three cross-domain patterns with probe points.

Do

  • OD → any domain (pull-up to target); single-point pull-up; verify dV/dt vs threshold window.
  • PP cross-domain with series + Schottky; scope VDD/RESET/pull-up simultaneously.

Don’t

  • PP → low-voltage domain without guards.
  • Multi-point pull-ups on shared lines.
  • Rely on MCU internal pull-ups for timing or fan-in guarantees.

Procurement Notes

Pick Schottky parts with low VF/low leakage and suitable height; series resistors rated for edge conflicts; pull-ups in E96 1% for reproducibility. Keep small-batch second-source options ready.

Design Recipes

Three copy-ready wiring recipes focused on the output stage & cross-domain pull-ups. Use them as implementable defaults. Threshold windows, delays/debounce, and reset-tree topics are covered on sibling pages to avoid overlap.

Recipe A — Cross-domain & Mass-friendly (Default)

Topology: OD output → pull-up to target domain (10–47 kΩ) → far-end small RC (100 Ω / 1–4.7 nF).
Use for: cross-domain, wire-OR, multi-source resets.

Sizing: tr ≈ 2.2·RPU·CLINE, target tr ≤ 0.1·TFEED. Check Isink ≥ (VPU − VOL,max)/RPU.

  • Acceptance: no far-end double-bounce; no power-down back-power.
  • Don’t: multi-point pull-ups on the same bus.

Recipe B — Low-Noise, High-Speed Same-Domain

Topology: PP output + same-domain direct; if crossing down-level, add 100–330 Ω series + Schottky to VDDtarget.
Use for: AH direct drives, jitter-sensitive paths.

Targets: tr, tf < 200 ns (example). Choose series R vs conflict current; Schottky: low VF/low leakage.

  • Acceptance: no reverse conduction beyond limits.
  • Don’t: wire-OR a PP with other drivers.

Recipe C — Multi-Device Wire-OR (Large Fan-In)

Topology: multiple OD sources → single-point pull-up near the load → unified debounce window (RC 1–4.7 nF).
Use for: PMIC + µP + external supervisor combined resets.

Notes: CBUS = ΣCTRACE + ΣCPIN; compute worst-node and back-solve RPU. Use lower R for long traces / large fan-in.

  • Acceptance: worst-node tr meets target; no chatter; bus-C audit table archived.
  • Don’t: rely on MCU internal pull-ups for timing or fan-in guarantees.

Procurement notes: Pull-ups in E96 1% (keep a family of values); debounce C use C0G/NP0 (stable), X7R if tight space; Schottky with low VF/low leakage and height within your mechanical limit. Prefer series-able part numbers for small-batch swaps.

Three practical reset wiring recipes Left: Recipe A (OD + target pull-up + far-end RC). Middle: Recipe B (PP same-domain, series + Schottky when down-leveling). Right: Recipe C (multi-OD wire-OR with single-point pull-up and unified debounce). Design Recipes A / B / C A · OD + target pull-up + RC RPU=10–47 kΩ; RC=100 Ω/1–4.7 nF Use for cross-domain / wire-OR Don’t: multi-point pull-ups B · PP same-domain (+down-level guard) tr, tf < 200 ns (example) Guard for down-level crossing Don’t wire-OR a PP with others C · Multi-OD wire-OR + single pull-up Place pull-up near the load RC=1–4.7 nF as unified window Audit CBUS & worst node
Three recipes: A (OD + target pull-up + RC), B (PP same-domain with down-level guard), C (multi-OD wire-OR, single pull-up, unified RC). Alt: collage of wiring patterns with parameter hints.

Acceptance & Validation

Polarity Consistency

Cold start, hot reset, and brown-in/out with three slew rates. Dual-channel probe RESET vs clock/supply. Assert/release windows remain correct (no inversion glitch).

Pull-Up & Edge Timing

Measure 10–90% tr and check the 0.1·TFEED rule at −40/25/85/125 °C and ±10% supply. Re-validate after BOM changes.

Back-Power Test

With target domain off/half-on, record VDD lift (ΔV) and Ibp. Tune series R / Schottky until ΔVVDD < 100 mV and Ibp below clamp limit.

Wire-OR Stability

For N-source buses, toggle each source low/release in turn. Ensure no ping-pong/chatter. Far-end RC should visibly damp rebounds.

Default pass lines (adjustable): tr ≤ 1/10 × TFEED (or ≤ 1 µs, stricter wins); ΔVVDD < 100 mV and Ibp ≤ 50% of the clamp spec; on shared pull-ups, any source’s release glitch < 20 µs with no false trigger.

Acceptance waveforms and decision criteria Row1: normal release (pass). Row2: slow edge due to oversized pull-up (fail). Row3: false high from back-power (fail). Right column: checklist of t_r, ΔV_VDD, I_bp, glitch window. Acceptance & Validation 1) Normal release · PASS 10% 90% tr ≤ 0.1·TFEED 2) Slow edge (oversized RPU) · FAIL 10% 90% tr > 0.1·TFEED 3) False high (back-power) · FAIL 0% ΔVVDD > 100 mV
Acceptance examples: normal release (pass), slow edge (fail), false high from back-power (fail). Alt: waveforms with 10–90% markers and a pass-line checklist.

Traceability & Reporting

  • Store waveforms with identical vertical scales; annotate probes, bandwidth limits, and temperature points.
  • Keep a small table: RPU back-solve, CBUS audit, Isink margin, dV/dt × threshold overlap time.
  • Any R/C/Schottky change updates BOM and re-runs the acceptance suite; keep ECO IDs in the report footer.

Cross-Brand Mapping (Output Type & Polarity)

Focus on mainstream automotive/general supervisors. Verify the exact variant (output driver & polarity) in the datasheet; families often offer multiple options.

Brand Family / PN Type Polarity Datasheet Notes
TI TPS3890-Q1 OD AL (RESET#) Datasheet (TI) High-accuracy supervisor; open-drain reset simplifies wire-OR.
TI TPS3808 OD AL (RESET#) Datasheet (TI) Adjustable delay; common for MCU rails, wire-OR friendly.
TI TPS3702 (Window) OD (OV/UV) AL flags Product page (TI) Independent open-drain OV/UV outputs; tie-together possible per DS.
ST STM706 family PP AL / AH (RST / RST) Datasheet (ST) Push-pull reset outputs; variants provide both polarities.
ST STWD100 (WDT+Supervisor) OD / PP (by option) Configurable Product page (ST) Watchdog with selectable output stage; OD suits wire-OR.
NXP VR5510 PMIC Reset outputs (per DS) Typically AL Product page (NXP) Automotive PMIC with monitoring & reset; check pin type per HW guide.
NXP FS5600 (PMIC) Reset/WDT lines (per DS) Per variant Product page (NXP) Window WDT + supervisors; confirm RESET pin driver per DS.
Renesas ISL88013 family PP (RST / RST both) AL / AH Datasheet (Renesas) SOT-23 µP supervisors; complementary reset outputs available.
onsemi NCP301 / NCV301 OD (N-ch) AL / AH (options) Datasheet (onsemi) Ultra-low Iq detectors; OD with selectable active level.
Microchip MCP100 / MCP101 PP (family-dep.) AL / AH (by PN) Datasheet (Microchip) Legacy simple supervisors; choose polarity by suffix.
Microchip MIC811 / MIC812 PP / OD (options) AL / AH (by PN) Datasheet (Microchip) Tiny supervisors with multiple output/polarity options.
Microchip MCP1316 / MCP1317 PP / OD (by option) AL / AH Datasheet (Microchip) Automotive-friendly options and timing variants.
Melexis MLX80050 (LIN SBC) Reset (NRES) AL (typ.) Datasheet (Melexis) SBC with undervoltage reset; confirm NRES drive & level in DS.

Note: Always confirm output driver (push-pull vs open-drain) and active level for the exact orderable PN; families often ship multiple variants under one umbrella page.

BOM & Procurement Notes

Required Fields

  • V_domain (in/out), Polarity (AH/AL), Output (PP/OD), I_sink(min), R_pullup range
  • AEC-Q100 grade, Temp range, Package height, Second-source (Y/N)

Optional

  • Wire-OR count, dV/dt limits, pre-bias behavior
  • Internal PU/PD present? WDT sharing semantics

Risks & Mitigations

  • Semantic/polarity mismatch → align schematic symbol, BOM fields, and firmware comments
  • PP cross-domain back-power → add 100–330 Ω series + Schottky clamp to target VDD
  • EOL / MOQ constraints → pre-approve dual-brand alternatives

Tip: For multi-source wire-OR across domains, prefer OD + pull-up at the target domain; validate I_sink vs R_pullup and ensure t_r ≤ 0.1×T_FEED at −40~+125 °C.

Frequently Asked Questions

How do I pick the pull-up value for an open-drain reset shared by multiple devices?
Choose RPU so the bus meets tr ≈ 2.2·RPU·CBUS ≤ 0.1·TFEED. Estimate CBUS=ΣCTRACE+ΣCPIN, then back-solve RPU. For long traces or large fan-in, prefer the lower end of the range. Validate at the worst node by measuring 10–90% rise-time and archiving a bus-C audit table.
When is push-pull safer than open-drain on mixed-voltage boards?
Use push-pull for same-domain, low-jitter, high-speed reset where a crisp edge is required. Use open-drain for cross-domain and wire-OR cases. If a PP driver must cross down-level, add 100–330 Ω series and a Schottky clamp to the target VDD; never wire-OR PP with other active drivers.
How do I avoid back-power when a 5 V push-pull drives a 1.8 V RESET?
Clamp the down-level input by adding a 100–330 Ω series resistor at the PP source and a Schottky diode to 1.8 V. Alternatively, convert to OD output and pull up to 1.8 V. Acceptance: with the 1.8 V rail off, ΔVVDD<100 mV and Ibp below 50% of the clamp spec.
What active polarity should I choose if the MCU exposes both RESET and RESET#?
Prefer active-low (RESET#) with OD outputs for wire-OR and cross-domain flexibility. For same-domain, low-noise paths, active-high + PP is acceptable. Lock the choice across schematic symbols, BOM fields, and firmware comments to prevent semantic mismatches during layout or procurement.
Can I wire-OR two supervisors to one reset line without chatter?
Yes—use OD outputs, implement a single pull-up point near the load, and add a small far-end RC (1–4.7 nF) for release damping. Validate by toggling each source independently; acceptance is a release glitch < 20 µs and no ping-pong behavior across temperature and supply corners.
How do rise-time and pre-bias interact to create false “release” events?
A slow tr can linger around thresholds while pre-biased nodes appear “high”. Keep tr ≤ 0.1·TFEED, reduce RPU, or add a far-end RC to sharpen crossing. Under brown-in/out slopes, ensure the dV/dt × window overlap stays short; target an effective overlap < ~50 µs for robust immunity.
What sink-current target is safe for OD outputs across −40~+125 °C?
Compute Isink ≥ (VPU − VOL,max)/RPU, then add 20–30% margin for temperature and lot variation. Verify at the hottest corner where VOL,max typically rises. If fan-in or trace length increases, reassess RPU and re-measure worst-node 10–90% rise-time to confirm timing headroom.
Do I need a series resistor on a push-pull reset into a lower-voltage domain?
Yes in most cases. Insert 100–330 Ω in series to limit contention and pair with a Schottky clamp to the lower VDD. Exceptions are rare and require identical domain levels and no back-power path. Always re-test during power-down to ensure ΔVVDD remains below acceptance.
How do I validate polarity through brown-in/brown-out ramps and fast glitches?
Test with three ramp rates (fast/typical/slow). Probe RESET vs VDD/CLK using matched bandwidth limits. The assert/release windows must not invert under any slope or injected glitch. Record timing at −40/25/85/125 °C; acceptance is no polarity inversion and no false releases during fault-injection pulses.
What’s an acceptance criterion for shared pull-ups on long traces?
Measure CBUS and worst-node tr. Accept if tr ≤ 0.1·TFEED, or ≤ 1 µs whichever is stricter. Add a small far-end RC to tame rebounds. Keep a trace-of-record: topology, probe points, cable model, and before/after waveforms for ECO tracking and audits.
How do I document polarity/levels in the BOM to prevent line-side mix-ups?
Add explicit fields: Polarity (AH/AL), Output (PP/OD), V_domain (in/out), Isink(min), RPU range, and Internal PU/PD?. Ensure the schematic symbol and firmware comments use the same wording. For families with variants, capture the orderable suffix that locks output and polarity.
Does an MCU’s internal pull-up replace the external one for OD resets?
Usually no. Internal pull-ups are weak and vary widely, making tr and fan-in margins unpredictable across temperature and lots. Keep an external RPU sized for 0.1·TFEED. On a short, single-source, same-domain path, you may waive it after worst-case timing and noise validation.