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State-Variable Filter (SVF): Tunable BP/LP/HP & Notch

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A State-Variable Filter (SVF) is a 2nd-order active filter that provides LP/HP/BP (and notch via HP+LP) from one core, with f0 and Q that can be tuned independently. This guide shows how to design, tune, and verify SVFs so Q, notch depth, and distortion stay stable on real PCBs—not just in simulation.

What is a State-Variable Filter (SVF)?

One-sentence definition

A state-variable filter is a second-order active filter built around two integrators (internal “states”), which lets one signal path produce LP, BP, and HP outputs simultaneously (and a Notch can be formed by combining HP and LP).

Why it is called “state-variable”

The two integrator outputs are internal variables that “carry memory” of the signal over time. Those internal nodes fully describe the filter’s present behavior, so multiple responses can be derived without building separate filters.

  • State #1 (Integrator 1 output): commonly used as the BP response (energy centered around f0).
  • State #2 (Integrator 2 output): commonly used as the LP response (accumulated/averaged content).
  • HP is typically available at the summer (error) node, providing a complementary response.
What each output is used for (engineering view)
HP output

Removes DC/slow drift and keeps fast content; useful for de-trend, edge emphasis, and notch synthesis.

BP output

Concentrates gain around f0; ideal for detection, narrowband extraction, tone tracking, and lock-in style chains.

LP output

Limits bandwidth for anti-alias/denoise; also provides a stable node for feedback and system-level shaping.

Notch (HP + LP)

A notch can be formed by summing HP and LP; notch depth depends on amplitude/phase matching (details belong to the notch chapter).

The two-knob mental model: tune f0 and tune Q

SVF design becomes straightforward when treated as two independent controls: f0 mainly follows the integrators’ time constants, while Q mainly follows a feedback gain/ratio.

  • Tune f0: change the integrator RC (resistor bank, capacitor bank, or a controlled element).
  • Tune Q: change a feedback coefficient (gain/ratio) while keeping the integrator RC stable.
  • Practical rule: keep tuning paths orthogonal; avoid “tuning Q by accident” through loading or mismatched parts.
SVF signal-flow overview (LP / BP / HP + Notch)
State-variable filter block diagram with multiple outputs A summer feeding two integrators produces HP, BP, and LP outputs; a summing block combines HP and LP to form a notch. Separate controls tune f0 and Q. Input Summer (error node) Integrator 1 (State #1) Integrator 2 (State #2) HP BP LP Σ HP+LP Notch Tune f0 (RC) Tune Q (gain)

Key idea: the same two internal states generate consistent LP/BP/HP responses; notch is synthesized by combining HP and LP. f0 and Q are controlled by different knobs.

Why SVF: Multi-Response Outputs & Tunable Q (When to use it)

Choose SVF when any of these is true
Tunable band-pass / tunable notch is required

SVF supports clean tuning of f0 and Q, enabling narrowband extraction or interference suppression without rebuilding the entire network.

Multiple responses are needed from one signal path

LP/BP/HP are derived from the same internal states, keeping the responses aligned (same f0/Q) and reducing cross-filter mismatch.

The system needs controlled selectivity without a high-order filter

SVF is a strong choice for second-order shaping with adjustable selectivity and consistent response family—before moving to cascaded biquads.

Avoid SVF when a simpler or more integrated option is a better fit
  • Ultra-simple fixed LP/HP with minimal parts and power → Sallen-Key LP/HP is often a better match.
  • Fixed LP/HP with stable ratios and predictable Q setting → MFB LP/HP is often easier to keep consistent.
  • Strong electronic tunability / integrated AFE behavior → Gm-C or switched-capacitor filters are usually more appropriate.

These alternatives belong to their own topology pages; this SVF page stays focused on the SVF design and bring-up loop.

What SVF “costs” in real hardware (the hidden constraints)
High-Q sensitivity

As Q increases, finite op-amp bandwidth, phase margin, and loading errors become dominant. “Works in simulation” often fails at high Q without margin.

Notch depth is a matching problem

Notch is synthesized (HP+LP). Deep rejection requires amplitude/phase matching across temperature and aging; trim hooks may be needed for production.

Dynamic range bottlenecks

BP nodes can hit swing limits first; overload recovery can dominate settling. Headroom budgeting must be done at internal nodes, not only at the final output.

Fast decision gate (30-second checklist)
  • Need tunable f0 and tunable Q? SVF is a primary candidate.
  • Need both LP and BP simultaneously? SVF can provide both without cross-filter mismatch.
  • Need a notch that tracks f0? SVF can synthesize it, but plan for matching/trim.
  • Need the simplest fixed LP/HP? SVF is likely overkill.
SVF selection gate (use-case routing)
Decision gate for choosing SVF Requirement cards route to an SVF fit block and to alternative topology tags for simpler fixed filters or integrated tunable filters. Tunable BP / Notch Adjust f0 and Q Multiple outputs LP + BP + HP 2nd-order shaping Consistent responses SVF is a good fit Multi-response Tunable f0 / Q BP / LP / HP / Notch Sallen-Key LP/HP Ultra-simple fixed filters MFB LP/HP Stable ratio control Gm-C / SC Integrated tunability

SVF is strongest when tunability and multiple responses are needed; simpler fixed filters or integrated tunables are better when SVF’s tuning/matching cost is unnecessary.

Canonical SVF Forms: Voltage-Mode vs “K-Controlled” SVF

How to recognize an SVF in a schematic (fast pattern check)
  • Two integrators in series (Integrator 1 → Integrator 2) that create the internal “states”.
  • A summer / error node feeding the integrator chain (the HP response often comes from this node).
  • Multiple outputs exposed from internal nodes: typically BP (state #1) and LP (state #2), plus an HP path.

Both forms below share the same SVF “skeleton”. The key difference is whether Q is mostly fixed by ratios or is explicitly controlled by a single parameter K.

Voltage-mode SVF (classic form)
What it is

A summer drives two integrators. The outputs are taken directly from the error node (HP) and the two states (BP/LP).

Why it is used

Straightforward implementation and predictable behavior when component ratios are stable. Good for fixed or limited-step designs.

What to watch

At high Q, finite op-amp phase margin and loading errors can distort the intended response; margin planning belongs to the non-idealities chapter.

“K-controlled” SVF (Q as an explicit knob)
What it is

The same SVF skeleton, but a single parameter K is inserted in the feedback path so Q (damping/selectivity) can be tuned without rebuilding the integrators.

Why it is used

Tunable filters prefer orthogonal controls: keep f0 tied to RC time constants while Q follows a gain/ratio knob (K).

Typical implementations

K can come from a resistor ratio, a programmable gain block, or a controlled element (digipot/VGA). Detailed tuning trade-offs belong to the tuning chapter.

SVF form recognition: classic vs K-controlled (side-by-side)
Side-by-side SVF forms: voltage-mode and K-controlled Two SVF block diagrams share the same summer and two-integrator chain. The K-controlled form adds a highlighted K feedback path to tune Q. Voltage-Mode SVF K-Controlled SVF Input Summer Integrator 1 R,C Integrator 2 R,C HP BP LP Σ HP+LP Notch Σ Input Summer Integrator 1 R,C Integrator 2 R,C HP BP LP Σ HP+LP Notch K Σ K

Both forms expose the same response family (HP/BP/LP, plus notch by summation). The K-controlled form makes Q an explicit tuning handle while keeping the integrator RC blocks recognizable and reusable.

Transfer Functions You Actually Need (f0, Q, Gain Mapping)

What sets the center frequency f0 (minimum actionable mapping)

In an SVF, f0 is primarily set by the two integrators’ time constants. In most practical designs, the tuning direction is “RC up → f0 down” and “RC down → f0 up”. This mapping is sufficient to pick R/C values and to plan trim ranges.

  • Design action: pick capacitor values first (size, leakage, availability), then solve for resistor values that land in a noise- and drive-friendly range.
  • Verification hook: treat R/C tolerance as a direct f0 error term; confirm with a quick sweep around the target frequency.
What sets selectivity Q (why K is a practical knob)

Q is primarily set by a feedback coefficient (often represented as K in a K-controlled SVF). Increasing that coefficient typically increases selectivity: K ↑ → Q ↑ (narrower passband / deeper resonance around f0).

  • Design action: keep Q-setting elements separate from the integrator RC elements to avoid coupling “tune Q” into “shift f0”.
  • Production note: plan a small trim range on K (or the ratio that creates K) if a tight Q target must hold across tolerance and temperature.
Output gain mapping (what differs between HP / BP / LP)

The three primary outputs come from different internal nodes, so their peak amplitudes and headroom limits are not identical. A practical SVF budget treats internal nodes as first-class signals, not as “hidden implementation details”.

  • BP node: often shows the strongest concentration around f0; it can clip first when Q is increased.
  • LP/HP nodes: are complementary in shape; they may look “fine” while BP is already non-linear.
  • Design action: allocate swing margin at BP and at the summing node before concluding the final output has enough headroom.
Notch output: why “Notch = HP + LP” becomes a matching problem

A notch output can be synthesized by summing HP and LP. In theory this can create deep rejection at f0, but in hardware the depth is set by amplitude and phase matching between the two paths. Small mismatches (tolerance, temperature drift, loading) directly translate into a shallower notch.

Parameter mapping: tune f0, tune Q, read outputs (LP/HP/BP/Notch)
SVF parameter mapping panel Two knobs control f0 and Q. f0 is linked to RC time constants; Q is linked to feedback gain K. Outputs include LP, BP, HP, and a synthesized notch from HP+LP. SVF Core Summer + 2× Integrators Tune f0 RC time constants Tune Q K / feedback gain K Outputs LP BP HP Notch Key mappings f0 ↔ RC Q ↔ K

This page only uses the minimal mapping needed for design and verification: f0 is an RC time-constant outcome, Q is a feedback-coefficient outcome (often represented by K), and notch depth is controlled by HP/LP matching.

Step-by-Step Design Workflow (Specs → Topology → Values)

Spec inputs (minimum set to avoid redesign loops)
  • Response: BP / LP / HP / Notch (define the primary output node).
  • Target: f0 and either BW or Q (choose one representation).
  • Signal limits: input amplitude range, source impedance, expected load (ADC input / cable / next stage).
  • Latency constraint: allowable group delay / step response behavior if the system is time-sensitive.
  • Supply & headroom: rails, output swing requirement, common-mode constraints (single-supply chains need explicit CM planning).
  • Quality targets: noise floor or SNR target, distortion/SFDR target, environmental range (temperature drift expectations).
  • Tuning requirement: fixed / stepped / continuous tuning for f0 and/or Q.

This workflow converts these inputs into R/C/K values, op-amp requirements, and a short verification checklist.

Step 1 — Lock the response goal (what must be true on the bench)
Define pass conditions

Specify f0 tolerance, Q/BW tolerance, and the expected amplitude range where those specs must hold.

Guard latency if needed

If the chain is closed-loop or time-critical, define an upper bound on group delay or step response ringing.

Step 2 — Choose the SVF form (fixed vs independently tunable Q)
  • Need independent Q tuning: prefer a K-controlled SVF so Q can move without dragging f0.
  • Mostly fixed Q: classic voltage-mode SVF is often sufficient and straightforward to implement.
  • Output usage: decide early which node is the primary deliverable (BP vs LP vs notch synthesis) to avoid headroom surprises later.

Navigation only: if the need is “simplest 2nd-order LP/HP”, Sallen-Key or MFB pages are better entry points.

Step 3 — Pick capacitors first (stability, leakage, and practical tuning ranges)
  • Stability: capacitor value stability and matching dominate repeatability of f0 and notch alignment.
  • Leakage sensitivity: low-frequency or high-impedance designs magnify leakage and bias-current effects; larger C may reduce required R.
  • Manufacturability: choose a preferred capacitor family/value grid so tuning can be done via banks (C bank) or by solving R.
Step 4 — Solve resistors (stay in a noise- and drive-friendly range)
Directionally correct rule

After choosing C, R follows from the target f0. The practical goal is to keep R away from extremes where either thermal noise and leakage dominate (too large) or op-amp drive and distortion dominate (too small).

Two failure modes to avoid
  • R too high: higher in-band noise contribution, larger bias/leakage error, higher parasitic sensitivity.
  • R too low: heavier loading on the amplifier, higher current, earlier distortion under swing.
Step 5 — Set Q using the feedback coefficient (K network)
  • Q is a loop outcome: treat K (or the ratio that implements it) as a controlled design knob.
  • Guardband: if Q must be stable across tolerance/temperature, plan trim headroom on K rather than reworking integrator RC.
  • Headroom planning: higher Q raises internal BP amplitude; allocate swing margin at internal nodes, not only at the final output.
Step 6 — Non-ideal checks (turn “works on paper” into “works on PCB”)
Stability & bandwidth margin

Ensure the op-amp has sufficient GBW and phase margin for the intended Q and loading. High-Q behavior is especially sensitive to phase lag.

Large-signal integrity

Check slew-rate, output swing, recovery, and input common-mode range. Monitor the BP internal node for early compression.

Noise budget entry point

Combine resistor thermal noise, amplifier noise, and the effective bandwidth around the target response. Do not assume the final output node tells the whole story.

Deliverables (what this workflow must produce)
  • Component set: R/C values plus K (or ratio) for the target Q, with a tuning/trim range if required.
  • Op-amp requirements: GBW/phase margin expectation, SR, headroom limits, input common-mode constraints, noise/distortion focus points.
  • Bench checklist: quick sweep around f0 to extract Q/BW, large-signal check for BP compression, and stability/ringing observation.
6-step SVF design workflow (specs → R/C/K + op-amp requirements)
Six-step SVF design workflow A six-step flow from specs to topology, capacitor selection, resistor solving, Q setting via K, and non-ideal checks. The output is R/C/K values and op-amp requirements. Step 1 Lock specs Type + f0 + Q/BW Step 2 Choose form Classic vs K-controlled Step 3 Pick C Stability / leakage Step 4 Solve R Noise & drive range Step 5 Set Q (K) Guard headroom Step 6 Non-ideal check GBW / SR / swing Output package R / C / K Op-amp requirements

The flow intentionally forces decisions in the order that prevents coupling: lock the response goal, pick a form, choose C, solve R, set Q via K, then validate non-ideal margins before finalizing.

Practical Tuning: How to Tune f0 and Q Without Breaking It

Tuning f0 (three practical paths and what they trade)
R bank (stepped)

Predictable and repeatable. Watch switch parasitics and keep resistor values within a noise/drive-friendly window.

C bank (stepped)

Keeps R unchanged while moving f0. Matching and switch injection become the main risks at higher Q or higher frequency.

Digipot (convenient, but performance-limiting)

Fast for field tuning, but can degrade linearity and add resistance-dependent noise; validate distortion and bandwidth at each tuning extreme.

Tuning Q (keep it on the feedback knob, not inside the integrators)
  • Preferred: tune Q via K / feedback gain (ratio network, programmable gain block, VGA).
  • Reason: preserve orthogonality—move Q without unintentionally shifting f0 or changing the integrator noise profile.
  • Limit: cap the maximum Q to what the op-amp margin and internal node headroom can sustain.
Tuning rules (the sequence that prevents “tunes but breaks”)
  1. Tune f0 first, then tune Q (center the response before sharpening it).
  2. Watch internal BP headroom (BP often clips first even if the final output looks fine).
  3. Re-verify after each change with a minimal sweep around f0 (extract f0, Q/BW, and check ringing/settling).
Tuning pass criteria (observable checks)
  • f0 window: measured f0 stays inside the target tolerance across tuning codes.
  • Q/BW window: extracted Q (or -3 dB BW) stays inside the target tolerance without instability.
  • No compression: BP node does not show early clipping or slow recovery under the maximum intended signal amplitude.
  • Stability behavior: step response shows controlled ringing (no sustained oscillation).
  • Notch tracking: notch dip moves with f0 (depth limits are addressed in the notch chapter).
Tuning paths: f0 path (RC) vs Q path (K) + Do/Don’t tags
SVF tuning paths for f0 and Q Two highlighted tuning paths feed an SVF core: f0 tuning via RC banks or digipot, and Q tuning via K/feedback gain. Output ports are shown with a caution to monitor BP headroom. Do and don’t labels summarize rules. SVF Core Integrator RC + feedback Tune f0 path R/C selection R bank C bank Digipot (validate THD/noise) Tune Q path K / feedback gain Gain block (K) K Outputs LP BP HP Notch (HP+LP) Watch BP headroom first Do: tune f0 via RC Do: tune Q via K Don’t: tune Q by integrator R

The tuning strategy keeps controls orthogonal: move f0 with RC choices (banks or carefully validated digipots) and move Q with feedback gain (K). This prevents “tuning works but performance collapses”.

Non-Idealities That Kill SVF (GBW, SR, Saturation Recovery, Component Tolerance)

Fast symptom-to-root-cause map (why it simulates fine but fails on PCB)
  • Q won’t build / peak looks soft: insufficient GBW or phase margin under actual loading.
  • Response changes with amplitude: slew-rate or headroom limits causing BP compression/clipping.
  • Long tail after overload or switching: saturation recovery dominates settling time.
  • Same schematic, different behavior: tolerance coupling in ratios; mismatch shifts Q and notch alignment.

This section focuses on mechanisms + test hooks + fixes. Notch depth limits and matching strategy are handled in the notch-focused chapter.

GBW / Phase Soft peak / f0 shift
Symptom

Q does not reach target; peak becomes blunt; f0 shifts under real load or when Q is increased.

Quick check
  • Small-signal sweep around f0: peak height and width vs expected.
  • Repeat with a different load or probe point; look for peak shape change.
Fix
  • Increase GBW/phase margin headroom or reduce effective loading.
  • Reduce target Q or reduce internal gain that amplifies phase lag sensitivity.
Pass criteria

Peak shape and f0 remain consistent across intended load and input amplitude; no “mystery Q” loss when tuning.

Slew Rate BP clipping / “fake Q”
Symptom

Under large signals, the BP node clips or shows slope-limited edges; the measured bandwidth/peak appears to change with amplitude.

Quick check
  • Increase input amplitude in steps and watch the BP node waveform first.
  • If peak/Q changes with amplitude, treat it as a large-signal limit, not a small-signal design issue.
Fix
  • Reduce internal BP swing (gain distribution) or cap maximum Q.
  • Increase SR/headroom margin; reduce loading that forces high output current.
Pass criteria

At maximum intended amplitude, BP shows no clipping/slope limit; frequency response does not drift with amplitude.

Saturation Recovery Long tail settling
Symptom

After overload or switching, the output takes a long time to return to steady-state; notch/BP measurements show “tails”.

Quick check
  • Apply a step or abrupt amplitude change; measure time-to-settle to the steady band.
  • Probe internal nodes; identify which node hits a rail first (BP is a common trigger).
Fix
  • Increase internal headroom (avoid rail hits), reduce Q or redistribute gain.
  • Set adequate measurement settle time; validate recovery at worst-case stimuli.
Pass criteria

After worst-case overload, settling returns within the allowed window and stays there without “creep”.

Tolerance / Mismatch Spread / notch drift
Symptom

Q and f0 vary across builds; notch alignment shifts. Ratio-sensitive networks amplify small component errors.

Quick check
  • Monte Carlo or tolerance sweep for f0 and Q distribution.
  • On-board statistics: compare multiple builds at the same measurement conditions.
Fix
  • Use matched/ratio-stable networks and stable capacitor families; keep layout symmetric.
  • Reserve trim hooks for K/ratios; treat notch depth as a matching-and-cal problem (next chapter).
Pass criteria

f0 and Q remain inside the required windows across tolerance and environment; notch alignment is stable enough for the target depth strategy.

Failure mechanisms: symptoms as wave thumbnails (GBW / SR / Recovery / Tolerance)
SVF failure mechanisms and symptoms A 2-by-2 set of failure cards. Each card shows a minimal waveform thumbnail: soft resonance peak for GBW, clipped sine for SR, long tail settling for saturation recovery, and spread of responses for tolerance/mismatch. GBW / Phase Symptom Soft peak / Q loss f0 shifts with load Slew Rate Symptom BP clipping “Fake Q” shift Saturation Rec. Symptom Long tail settling Slow recovery Tolerance / Mismatch Symptom Spread in f0/Q Notch drift

Use the thumbnail patterns as triage: soft peaks point to GBW/phase, amplitude-dependent changes point to SR/headroom, long tails point to recovery, and wide build-to-build spread points to tolerance coupling.

Practical priority order (to stop endless rework)
  1. Prove GBW/phase margin at the intended load and tuning range.
  2. Prove large-signal integrity by watching BP headroom and SR limits.
  3. Prove recovery behavior with an overload/step test and set settle rules.
  4. Only then optimize tolerance/matching for notch depth and consistency.

Noise & Distortion Budget (BP Noise Peak, Dynamic Range, THD/SFDR)

Why SVF often fails at BP first (noise peak + dynamic bottleneck)
  • Energy concentration: BP emphasizes a narrow band, making both noise and nonlinearity more visible around f0.
  • Headroom stress: internal BP swing can exceed the final output swing, causing early compression and “mystery” THD/SFDR loss.
  • Budget perspective: treat SVF as a multi-node system; the first node to hit its limit defines system performance.
A practical budgeting method (node-first, not “datasheet-first”)
Step A — List nodes

Track HP, BP, LP, notch-sum, and any internal integrator outputs you can probe reliably.

Step B — For each node, write two lines
  • Noise contributors: amplifier en/in, resistor thermal noise, leakage/DA flags (only as a risk marker).
  • Distortion drivers: swing/headroom, common-mode motion, loading, ratio network nonlinearity.
Step C — Guardband and decide ownership

Add headroom and noise guardband. The first node that violates the target owns the redesign action.

Node checklist (where to probe and what usually breaks)
Node Noise risk Distortion / headroom risk Probe hint
BP Often highest (narrowband emphasis) Often highest (internal swing bottleneck) Watch for early clipping and amplitude-dependent Q
LP Moderate (depends on R range) Load and swing dependent Check step response ringing vs load
HP Moderate (op-amp noise shows up) Common-mode and swing dependent Compare small vs large signal behavior
Notch sum Depends on sum alignment Mismatch drives residual tone Depth strategy is covered in the notch chapter
If the budget fails: choose the lever by the first limiting node
Noise levers
  • Keep resistor values within a reasonable range; avoid extreme high impedance designs without leakage control.
  • Choose an amplifier noise profile that matches source impedance and target in-band noise.
Dynamic range levers
  • Redistribute gain so BP internal swing stays below the first headroom limit.
  • Cap maximum Q to what SR/headroom and stability margins can support.
Distortion levers
  • Reduce loading, control common-mode motion, and avoid ratio-network nonlinearity in the tuning path.
  • Validate THD/SFDR at tuning extremes; do not trust mid-code performance as worst-case.
Budget view (no numbers): contributors → swing bottlenecks → distortion drivers
SVF noise and distortion budget view Three-column stacked blocks: noise contributors, signal swing nodes, and distortion drivers. BP is highlighted as a common bottleneck. No numeric values are shown; the chart is qualitative. Noise contributors Signal swing nodes Distortion drivers op-amp en op-amp in R thermal leakage / DA HP node BP node bottleneck LP node Notch sum swing / headroom CM motion loading ratio nonlinearity

The diagram is qualitative by design. The correct workflow is to identify the first limiting node (often BP), then apply the lever that fixes that node without breaking tuning orthogonality.

Notch with SVF: Depth, Matching, and Temperature Drift

Key idea: deep notch is not “free” — it is a cancellation spec

SVF notch is formed by Notch = HP + LP. A deep notch only happens when amplitude and phase are well matched at the target frequency. Any mismatch or drift creates a residual tone that “fills” the notch.

Minimum conditions for cancellation (what must be true at the notch frequency)
Amplitude match

At the notch frequency, |HP| ≈ |LP|. Residual depth collapses quickly when the two paths are unbalanced.

Phase match

At the notch frequency, phase alignment must satisfy cancellation. Small phase errors become large residual tones.

Stability over environment

Matching must hold over temperature, aging, and parasitics. A “deep at room temp” notch is not a production-ready notch.

Three common notch killers (what makes a deep notch become shallow)
Layer 1 Tolerance / ratio mismatch
  • Symptom: different boards show different notch depth and notch frequency.
  • Quick check: sweep multiple units; observe spread in depth and notch location.
  • Core issue: notch depth is dominated by ratio accuracy, not absolute values.
Layer 2 Temp drift not tracking
  • Symptom: deep at room temp, shallow when warm or during warm-up.
  • Quick check: log notch depth vs temperature/time; look for systematic depth loss.
  • Core issue: what matters is drift tracking between HP and LP paths.
Layer 3 Parasitics / asymmetry
  • Symptom: simulation predicts deep notch, PCB shows shallow notch; probing changes depth.
  • Quick check: compare probe points/grounding; check for asymmetric routing or loading.
  • Core issue: cancellation specs are fragile — any asymmetry becomes residual.
Practical strategies (component choice + trim hooks + production scan)
A) Component discipline
  • Use stable capacitor families for the integrators (NP0/C0G when applicable).
  • Prefer matched resistor networks for ratio-critical paths.
  • Keep paired parts close and in the same thermal zone to improve drift tracking.
B) Reserve trim points (for depth, not for a nominal value)
  • Trim R ratio to re-balance HP vs LP amplitude/phase at the notch frequency.
  • Digipot / resistor bank for repeatable and field-serviceable tuning.
  • EEPROM coefficients to store production calibration parameters (details in the calibration chapter).
C) Production scan to lock the deepest point
  • Coarse sweep to locate the notch neighborhood, then narrow sweep to maximize depth.
  • Use 2-point/3-point checks around the notch to detect drift and avoid “overfitting” to a single point.
  • Record notch frequency and depth as traceable fields for yield analysis and re-cal triggers.
Notch depth “matching funnel”: from ideal cancellation to real-world residual
SVF notch depth matching funnel A funnel diagram showing notch depth collapsing due to mismatch layers: ratio tolerance, temperature drift tracking, and parasitic asymmetry. A set of trim knobs on the right shows calibration and tuning options. Ideal deep notch Layer 1: ratio mismatch amp / phase error Layer 2: drift not tracking temp / warm-up Layer 3: parasitics Residual tone Depth Trim / Calibration knobs Trim R ratio Digipot / bank EEPROM coef Maximize depth at fnotch

Treat notch depth as a cancellation specification. The correct approach is to control symmetry (parts + layout) and reserve trim knobs so production can maximize depth at the real best point, not at an assumed nominal.

Pass criteria (production-friendly, no magic numbers)
  • Notch depth remains usable across temperature and warm-up; depth does not collapse under normal environmental change.
  • Notch frequency does not drift beyond the system’s tracking or re-cal range.
  • Depth maximization is repeatable across units using the reserved trim hooks and sweep procedure.

Differential / FDA-Based SVF (for ADC Front-Ends)

When SVF should be differential
  • ADC differential inputs: easier headroom planning and lower distortion for a given dynamic range.
  • Noise/EMI environments: controlled common-mode improves robustness for real cables and real grounds.
  • High linearity targets: symmetric signal handling reduces even-order distortion and CM coupling.

This section focuses on how SVF lands in a differential chain, not a general survey of differential filter topologies.

Two practical implementations
Option A SE→Diff (FDA) → SVF
  • FDA sets VOCM and provides differential drive authority.
  • SVF operates in a controlled differential domain with symmetric loading.
  • Best when the source is single-ended and ADC requires strict input common-mode.
Option B Direct differential SVF
  • SVF is built as a symmetric differential structure (summer + integrators mirrored).
  • Common-mode control must be explicit (FDA, CM servo, or a defined VOCM reference scheme).
  • Best when the full chain is differential and symmetry can be maintained end-to-end.
Key constraints checklist (what breaks differential SVF in real ADC front-ends)
VOCM compatibility

FDA/VOCM must land inside the ADC input common-mode window across tuning extremes and temperature.

Headroom and internal swing

Differential swing plus common-mode motion must not push any internal node into compression or rail recovery (BP often fails first).

Symmetry and matching

Pair critical R/C elements and keep the two halves physically symmetric; asymmetry becomes CM leakage and distortion.

ADC input load interaction

The ADC presents sampling capacitance and transient loading. Define the isolation strategy (small series R/RC/buffer) so tuning does not destabilize the chain.

Layout rules (differential SVF is a symmetry game)
  • Route differential pairs with matched environment; keep return paths consistent.
  • Place paired components close and oriented consistently to reduce thermal gradients.
  • Keep VOCM routing clean and quiet; prevent digital noise from modulating common-mode.
  • Make test points symmetric; otherwise measurements create false imbalance.
  • Avoid asymmetric stubs and probe loading near high-impedance nodes.
SE↔Diff + SVF + ADC chain (VOCM / symmetry / ADC load highlighted)
Differential SVF chain for ADC front-ends A left-to-right block diagram: single-ended source, FDA with VOCM reference, differential SVF core, and ADC input load. Key labels highlight VOCM set, symmetry/matching, and ADC sampling load. SE Source Vin FDA SE → Diff VOCM OUTP OUTN Differential SVF Summer Int 1 Int 2 HP LP BP Notch Symmetry / matching ADC Cin ADC load VOCM set

The chain highlights three non-negotiables: VOCM alignment, symmetry/matching, and ADC sampling load interaction. Treat them as first-class requirements before tuning f0/Q.

Verification hooks (what to test in the correct order)
  1. Small-signal sweep: confirm target response and symmetry (OUTP/OUTN balance).
  2. Large-signal linearity: validate THD/SFDR at tuning extremes and intended loads.
  3. Common-mode behavior: confirm VOCM stability and low CM leakage into differential output.
  4. ADC integration: repeat tests with the real ADC load; confirm no “only fails when ADC is connected” behavior.

H2-11. Applications (Anti-alias, denoise, sensors, audio/measurement)

Copyable application recipes (only what Sallen-Key owns)

This section provides reusable chain templates for where a 2nd-order Sallen-Key LP/HP is the right tool: gentle anti-alias roll-off, bandwidth shaping for denoise, and low-to-mid Q shaping for audio/measurement. When targets require steeper roll-off or strict group delay, link out to cascaded biquads or phase equalizers.

A) Anti-alias front-end recipes (3 templates)

AA-1: Robust 2nd-order LP (stability + settling first)
Use case: first-stage roll-off before an ADC; moderate attenuation needs; low-to-mid Q only.
Goal: reduce alias energy while keeping settling within the acquisition window under real ADC kickback.
Core choices: place fc conservatively vs signal BW; avoid aggressive peaking; treat headroom as part of the filter spec.
Interface notes: include Riso and validate both nodes (filter output and ADC pin) under sampling.
Verification: AC sweep + step-to-window + load toggle (resistor load ↔ ADC network).
Pass criteria: alias leak < X and |settling error| < X by time T (X,T from system budget).
Example op-amp BOM (starting points; verify under your load)
• TI OPA320 (RRIO precision) — OPA320
• TI OPA350 (RRIO high-speed) — OPA350
• ADI ADA4807-2 (RRIO high-speed) — ADA4807-2
AA-2: 2nd-order LP as “first roll-off”, reserve higher-order later
Use case: a clean, low-risk first pole-pair; steeper attenuation is handled by cascaded biquads downstream.
Goal: shape BW without destabilizing the ADC drive; keep group delay moderate (not “strict”).
Core choices: set the 2nd-order stage for predictable behavior across tolerance and load.
Interface notes: if the downstream stage is a driver/FDA, validate inter-stage loading.
Verification: measure fc/Q drift over temperature and unit spread; confirm it does not break alias margin.
Pass criteria: fc/Q spread stays within allowed guardband; no peaking-induced clipping.
Link-out triggers (do not expand here)
Need steeper roll-off → Cascaded Biquads Need strict group delay → All-Pass / Phase EQ
AA-3: HP + LP “band window” (drift removal + alias shaping)
Use case: remove DC / slow drift first, then limit BW for noise and alias.
Goal: prevent low-frequency drift from consuming headroom while keeping the passband clean.
Core choices: HP corner must preserve the lowest useful signal content; LP corner must match the sampling plan.
Interface notes: HP stages can be leakage- and bias-current sensitive; validate in the real environment.
Verification: drift step test + step response + FFT at target amplitude.
Pass criteria: drift-induced offset is bounded; no early clipping from peaking/headroom loss.

B) Denoise recipes (3 templates)

DN-1: Sensor bandwidth shaping (LP to reduce in-band RMS noise)
Use case: low-to-mid bandwidth sensors where noise is dominated by wideband content.
Goal: measurable reduction in in-band RMS noise without introducing peaking or long recovery.
Core choices: avoid high Q; keep component ratios stable; treat source impedance as part of the filter.
Interface notes: high-Z sensors require leakage/parasitics control; probe and humidity can change results.
Verification: RMS noise in-band + drift check + Monte Carlo alignment with unit spread.
Pass criteria: noise reduction meets target and fc/Q drift stays within guardband.
Example op-amp BOM (precision / drift control)
• ADI ADA4522-2 (zero-drift) — ADA4522-2
• TI OPA2188 (zero-drift) — OPA2188
• ADI ADA4077-2 (precision) — ADA4077-2
DN-2: Prevent saturation (HP for drift + LP for BW; headroom-aware)
Use case: slow drift or offset steps exist; downstream ADC/PGA clips early without conditioning.
Goal: remove low-frequency “energy” that consumes dynamic range, then limit BW for noise.
Core choices: HP corner is set by the lowest useful signal content; LP corner is set by noise/alias budget.
Interface notes: HP nodes are sensitive to bias current and leakage; avoid extreme resistor values.
Verification: drift step + large-signal recovery + FFT under real amplitude.
Pass criteria: no long recovery after CM/drift steps; no early clipping from peaking/headroom loss.
DN-3: Audio / measurement shaping (low-to-mid Q, distortion-controlled)
Use case: bandwidth shaping for audio/measurement where distortion and transient fidelity both matter.
Goal: predictable response without peaking-induced clipping; keep THD/SFDR controlled under real swing.
Core choices: use conservative Q unless the full tolerance stack is proven; treat output drive as a first-class spec.
Interface notes: strict group delay targets require link-out to all-pass/biquads (no expansion here).
Verification: THD vs amplitude sweep + step response + load sensitivity.
Pass criteria: THD/SFDR meet target at required swing and load; no ringing under final interconnect.
Example op-amp BOM (audio / low distortion)
• TI OPA1656 (audio) — OPA1656
• TI OPA1612 (audio) — OPA1612
• ADI ADA4898-2 (low noise/distortion) — ADA4898-2

C) Failure modes per application (2 common failures each)

ADC anti-alias
Failure 1: Rings / fails settling only when ADC is connected
Likely cause: ADC kickback and capacitive loading reduce phase margin at the filter output node.
Quick check: load toggle (resistor load ↔ ADC network) and probe both nodes (output vs ADC pin).
Fix: tune Riso first; add a small RC/snubber only if ringing is high-frequency dominated; buffer if needed.
Pass criteria: |settling error| < X by time T within the acquisition window (X,T from budget).
Failure 2: Unexpected peaking or fc/Q shift (alias leak rises)
Likely cause: source impedance/parasitics change effective ratios; tolerance stack moves Q.
Quick check: emulate source-Z with precision resistors; AC sweep fc/Q vs source-Z corners.
Fix: rebalance R/C ranges; reduce sensitivity by choosing friendlier ratios; tighten C0G/NP0 and matching.
Pass criteria: fc/Q spread stays within guardband; alias margin stays above X.
Sensor denoise
Failure 1: Drift / touch sensitivity / humidity dependence
Likely cause: leakage and parasitics dominate at high-Z nodes; probing adds capacitance.
Quick check: compare with short wiring and low-C probing; observe fc/Q shifts when probing.
Fix: avoid extreme resistor values; shorten sensitive nodes; isolate with a buffer when required.
Pass criteria: drift and sensitivity stay below X across defined environment.
Failure 2: Early clipping / THD rises after “denoise tuning”
Likely cause: Q peaking increases peak swing; headroom budget was not enforced.
Quick check: sweep amplitude and observe clipping onset vs peaking; FFT vs amplitude.
Fix: reduce peaking; increase headroom; or move shaping elsewhere (do not force high Q here).
Pass criteria: no clipping at target input + margin; THD/SFDR stays within X.
Audio / measurement
Failure 1: Transient fidelity or group delay target not met
Likely cause: strict group delay goals exceed what a simple 2nd-order stage can guarantee.
Quick check: compare step/impulse response against target (overshoot, ringing, decay).
Fix: link out to all-pass / cascaded biquads for phase and higher-order control.
Pass criteria: time-domain error metrics meet X under the defined bandwidth and load.
Failure 2: THD looks fine no-load, fails in system
Likely cause: output current and capacitive loading increase distortion; RRIO behavior degrades near rails.
Quick check: measure THD/SFDR at the required swing with the final interconnect/load.
Fix: choose an op-amp specified for distortion under load; add buffer isolation if needed.
Pass criteria: THD/SFDR meet X at swing/frequency/load corners.
Figure 11 — Application chain assembly (3 reusable chains)
Sallen-Key application chains: sensor, audio, and DAQ Three chain templates: Sensor to Sallen-Key LP to Riso to ADC with kickback arrow; Audio to Sallen-Key HP to ADC; DAQ to Sallen-Key LP to PGA/ADC. Risk tags shown under each chain. Link-out tags show when to use cascaded biquads or all-pass. Recipes are chain-level templates (validate with real source + load) Chain 1 Sensor → SK LP → Riso → ADC Sensor Sallen-Key LP Riso ADC kickback Source-Z drift fc/Q shift Settling window Chain 2 Audio → SK HP → ADC Audio Sallen-Key HP ADC DC removal THD under load Chain 3 DAQ → SK LP → PGA/ADC DAQ Sallen-Key LP PGA / ADC Gain range + BW Settling vs range Need order → Biquads Need phase → All-pass
Each chain must be validated with the real source impedance and the real ADC (kickback + sampling window).

H2-12. IC Selection Logic (Op-amp choice fields + inquiry checklist)

Convert datasheet items into measurable risk control

Sallen-Key success is not “pick a big GBW.” Selection must prove stability and settling under the real load (ADC kickback), then confirm headroom and distortion under the required swing. Use the table and inquiry checklist below to force evidence under your conditions.

A) Selection table (Spec field → Why → Failure signature → Quick check → Mitigation)

GBW / open-loop behavior Risk: peaking / instability
Why: Sallen-Key noise gain and feedback shape interact; GBW must support phase margin under real loading.
Failure signature: unexpected peaking, ringing, or “works no-load but fails in system.”
Quick check: AC sweep + step response with ADC network connected; compare to resistor-load baseline.
Mitigation: adjust Riso and ratio choices; if PM cannot be secured, buffer or change topology.
Capacitive-load drive / stability notes Risk: kickback oscillation
Why: ADC inputs are dynamic capacitive loads; kickback stresses the output node and PM.
Failure signature: short bursts of ringing at sampling edges; long settling beyond acquisition window.
Quick check: scope trigger on sampling clock; observe output node and ADC pin; run load toggle test.
Mitigation: Riso tuning first; then small RC/snubber if needed; buffer when margins remain insufficient.
Output swing / output current Risk: early clipping
Why: peaking and load current raise peak swing; RRIO stages often degrade near rails.
Failure signature: THD jumps at high swing, recovery slows near rails, or amplitude collapses under load.
Quick check: THD vs amplitude with final load; compare rail headroom corners.
Mitigation: increase headroom, reduce peaking, choose an amplifier specified for distortion under load.
Slew rate (large-signal) Risk: step distortion
Why: step/impulse response and high-frequency large signals can become slew-limited.
Failure signature: slow edges, asymmetric waveform, or distortion that grows with amplitude.
Quick check: time-domain large-signal step and FFT vs amplitude at target frequency band.
Mitigation: reduce required swing, increase headroom, or select a higher SR amplifier.
Input noise (en/in) + 1/f Risk: missed SNR
Why: Sallen-Key shapes bandwidth; the remaining in-band noise must hit system SNR/ENOB targets.
Failure signature: noise floor higher than expected; unit-to-unit spread if bias/leakage dominates.
Quick check: measure in-band RMS noise with a fixed bandwidth; compare against budget template (H2-8).
Mitigation: rebalance R/C, reduce source impedance impact, choose lower-noise parts where needed.
THD/SFDR vs swing + frequency + load Risk: distortion spikes
Why: distortion must be proven under the real amplitude and load, not just “no-load typical.”
Failure signature: spurs appear only at certain loads or when the chain is fully assembled.
Quick check: sweep THD/SFDR with final load model; compare against system spur limits.
Mitigation: select a part specified for low distortion under load; adjust headroom and peaking.
Input bias / input CM range Risk: drift / recovery
Why: HP and biasing networks can become bias/leakage dominated; CM limits can cause long recovery near rails.
Failure signature: slow drift, bias-dependent offset, or long recovery after common-mode steps.
Quick check: bias point sweep + soak test; confirm behavior with real PCB leakage and temperature.
Mitigation: rebalance resistor ranges; choose lower Ib parts; enforce CM margins under worst-case.
“RRIO” caveats (near-rail behavior) Risk: hidden distortion
Why: rail-to-rail does not guarantee linearity or fast recovery close to rails with real loads.
Failure signature: waveform “looks okay” but THD/SFDR is poor; recovery is slow after saturation.
Quick check: test near-rail operation at required load; include the worst-case output current corner.
Mitigation: keep headroom; select parts with distortion specs near rails; or change supply strategy.

B) Vendor questions (copy/paste inquiry checklist)

Request evidence under the actual conditions. Do not accept “typical no-load curves” for a Sallen-Key driving an ADC.
Inquiry template (fill blanks)
Application: Sallen-Key LP/HP Supply: ____ V (single/dual), bias/Vcm: ____ Target fc: ____ , target Q: ____ , gain K: ____ Signal: amplitude ____ , frequency range ____ Load model: – Rload: ____ ohm – Cload: ____ pF (plus ADC input network) – ADC sampling: Cin ____ , switch/kickback present (yes/no) Settling requirement: – acquisition window T: ____ us – required error: < X (define LSB or %FS) Please provide: 1) Stability / phase margin evidence under the above Cload/ADC model 2) Step settling to < X within T under the above load 3) THD/SFDR at the above swing + frequency under the above load 4) Output swing/current capability at the above load and near-rail behavior notes

C) Decision flow (Spec → Risk → Action)

  1. Prove stability under real load: ADC network connected, worst-case Cload corner included.
  2. Prove settling to the window: |error| < X by time T inside the acquisition window.
  3. Prove headroom + distortion: THD/SFDR at the required swing and frequency under final loading.
  4. If any step fails: take the minimal fix first (Riso / ratio / headroom), then buffer, then change topology.
Fail stability → Riso / buffer Fail settling → R/C range + load control Fail THD → headroom + better part Need high Q/steep → change topology

D) Reference part numbers (official links; starting points only)

These part numbers speed up datasheet lookup and lab evaluation. Selection must be proven by the load + window requirements above.

RRIO single-supply / general AAF
• TI OPA320   • TI OPA350   • TI TLV9062
Precision / drift control (sensors, low-frequency)
• ADI ADA4522-2   • TI OPA2188   • ADI ADA4077-2   • TI OPA2140
Audio / low distortion
• TI OPA1656   • TI OPA1612   • ADI ADA4898-2
Fast AAF / ADC-facing (prove load stability)
• ADI ADA4807-2
When the ADC is differential (link-out path)
• ADI ADA4940-1 (fully differential driver; use when the chain is differential)
Figure 12 — Selection flow (Spec → Risk → Decision)
Op-amp selection flow for Sallen-Key filters Three-column flowchart. Left column lists datasheet specs, middle column lists risks/failure signatures, right column lists decisions/actions. Bottom bar emphasizes vendor inquiry under real load and settling window. Prove stability + settling under real ADC load before tuning noise/THD Spec Risk Action GBW / PM Cload drive Swing / Iout SR Noise THD / SFDR Ringing Settling fail Clipping THD rise Noise miss Tune Riso Add buffer Fix headroom Change part Change topology Ask vendor under your load model + settling window (no “typical no-load” answers) Cload / ADC kickback / swing / frequency / T-window / error target
The winning candidate is the one that stays stable and settles inside the real acquisition window with the real ADC network.

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H2-13. FAQs (SVF) — Troubleshooting & Pass Criteria

These FAQs capture SVF-specific long-tail issues without expanding the main content. Each answer follows the same 4-line, testable structure.

Why does Q drop when I tune the center frequency?

Likely cause: The f0 tuning path also changes loop gain/ratio, or op-amp loop behavior shifts with frequency and reduces effective Q.

Quick check: Hold the Q-control network constant and tune only f0; then hold f0 and tune only Q—compare the two sweeps.

Fix: Decouple tuning paths: use R/C banks for f0 and keep Q on a separate K/feedback ratio (digipot only in K path: TPL0501-100, AD5245, MCP4661).

Pass criteria: Across the full tuning range, repeated sweeps return to the same Q window at the same settings (no “Q collapse” when f0 moves).

Why is the notch depth much shallower on the PCB than in simulation?

Likely cause: HP/LP mismatch (tolerance, parasitics, thermal gradient, or loading at the sum node) prevents true cancellation.

Quick check: Measure HP and LP around the notch region (same probe/cable path) and check whether depth changes when the load/probe changes.

Fix: Enforce symmetry + matching (same thermal zone, mirrored routing) and add trim hooks (digipot TPL0501-100 or MCP4661 + EEPROM 24LC256 to store trim state).

Pass criteria: Notch depth remains near-target after connecting the final load and after swapping probe setups (depth does not “fill in”).

SVF works at small signal but distorts badly at higher amplitude—why?

Likely cause: Slew-rate/headroom limits cause compression or clipping at internal nodes before the “external” output looks obviously wrong.

Quick check: Run an amplitude sweep at fixed f0/Q and watch BP + integrator outputs; distortion will rise sharply near the first node that approaches the rails.

Fix: Reduce peak node swing (lower Q or redistribute gain) or raise headroom; choose an op-amp with adequate SR/linearity (examples: TI OPA1656, ADI ADA4898-2).

Pass criteria: At maximum specified input amplitude, the waveform shows no clipping and measured distortion remains within the system budget.

Why does the BP output clip first even when LP/HP look fine?

Likely cause: BP is typically the highest-energy/highest-peak node (Q magnifies it), so it hits headroom first while LP/HP still appear acceptable.

Quick check: Probe BP and both integrator outputs and identify which node approaches the rails first at the failing amplitude.

Fix: Lower BP node level (move gain after the SVF, reduce Q, or increase supply/headroom); if needed use a more linear amplifier (OPA1656 / ADA4898-2 as starting points).

Pass criteria: Under worst-case tuning, BP remains linear at the required amplitude and no node exhibits early clipping.

How much op-amp GBW margin do I need for a target Q?

Likely cause: Insufficient loop gain/phase margin at the operating frequency reduces effective Q and warps the response.

Quick check: Repeat the same design with a significantly higher-GBW amplifier; if Q “magically returns,” GBW/phase is the bottleneck.

Fix: Use a conservative GBW starting point on the order of “tens of times (f0×Q)” and confirm with sweep + large-signal checks (example amplifiers to evaluate: OPA1656, OPA1612, ADA4898-2).

Pass criteria: Q and peak shape stay stable across tuning extremes and do not collapse when the final load is attached.

Why does probing the integrator node change the response?

Likely cause: Probe capacitance/leakage loads a high-impedance node and changes the integrator time constant and damping (Q/f0 shift).

Quick check: Compare results using an active probe vs a standard passive probe, or buffer the node and re-measure.

Fix: Design measurement-friendly hooks: add a unity buffer footprint (example: OPA320) or expose a buffered test pad via analog switch (TS5A23157 / ADG1419).

Pass criteria: f0/Q/notch results remain consistent across probe types and the “probe state” no longer determines the outcome.

Why does tuning with a digipot increase noise and shift f0?

Likely cause: Digipots add resistance noise, code-dependent R variation, and temperature behavior; changing R directly shifts the time constant (f0 moves).

Quick check: Sweep digipot codes and log (noise floor, f0); compare against a fixed precision resistor network at the same nominal value.

Fix: Use digipot for small-range K/Q trimming rather than the main integrator R; store selected codes in EEPROM (TPL0501-100 / AD5245 / MCP4661 + 24LC256).

Pass criteria: At any stored tuning state, repeated measurements return to the same f0/Q and noise stays within the budget.

Why does the notch center drift with temperature even with “1% parts”?

Likely cause: “1%” controls initial value, not matched tempco; HP and LP drift differently (plus PCB thermal gradients), shifting cancellation frequency.

Quick check: Temperature sweep and log both notch depth and notch frequency; check whether drift tracks board gradients or tuning states.

Fix: Keep ratio parts co-located and thermally coupled; add trim and store per-unit calibration (digipot MCP4661 + EEPROM 24LC256 as a fixture-friendly approach).

Pass criteria: Notch frequency and depth stay inside the allowed drift window across the specified temperature range.

How do I quickly verify Q without a full network analyzer?

Likely cause: Without a VNA, Q estimation often fails due to inconsistent stimulus and probe/load sensitivity rather than math.

Quick check: Measure BP peak at f0 and collect a few frequency points around it to find the two -3 dB points (repeat with the same fixture).

Fix: Use the -3 dB bandwidth method as the default rule; for portable fixtures, a DDS source (example: AD9833) can generate repeatable stepped tones.

Pass criteria: Q derived from repeated point-measurements matches within repeatability limits and agrees with a sweep when available.

Why does the filter take long to recover after overload?

Likely cause: An internal node saturates; overload recovery plus integrator charge re-balancing creates long tails (BP/notch shows it first).

Quick check: Apply a short overdrive pulse and measure recovery time to normal sweep behavior; identify which node clips first.

Fix: Prevent saturation (reduce peak swing, adjust gain/Q, increase supply), and add a diagnostic bypass path using TS5A23157/ADG1419 to isolate “SVF vs downstream.”

Pass criteria: After the specified overload event, the filter returns to nominal f0/Q/notch behavior within the allowed recovery time.

Can I sum HP+LP anywhere to make a notch, or must it be buffered?

Likely cause: Summing at an uncontrolled impedance point adds loading and phase error, which directly fills the notch.

Quick check: Compare notch depth when summing through a buffered summer vs a direct wire-sum; also compare with/without the final load.

Fix: Sum HP+LP in a controlled summing stage (example buffer/summer op-amp: OPA320) and keep both paths symmetrically loaded; use an analog switch (TS5A23157) if multiple sum points are needed for debug.

Pass criteria: Notch depth remains stable across expected load conditions and does not vary strongly with probing.

How do I keep common-mode stable in a pseudo-differential SVF?

Likely cause: Common-mode is weakly defined; asymmetric loading and bias/VOCM impedance let CM wander, raising distortion and drifting the apparent response.

Quick check: Measure VOCM while tuning f0/Q and during large-signal tests; compare behavior under symmetric vs asymmetric loads.

Fix: Use an FDA to lock CM and drive differential loads (starting points: THS4551, ADA4940-1) and keep routing/component placement symmetric around the differential pair.

Pass criteria: VOCM stays within the target window across tuning and amplitude, and distortion/noise does not jump when the final load is attached.