Programmable LDO (I²C/PMBus)

Q: Do I need black‑box logging or is STATUS_* enough?

STATUS_* is fine for live supervision, but black‑box logs help post‑mortem analysis and field returns. Use a ring buffer with timestamp source and de‑duplication to limit write amplification. Validate that entries persist across brown‑outs and that replay matches your scope timeline.

Q: Remote sense length limit before ΔV bias breaks specs?

There is no single length: the issue is round‑trip resistance and coupling. Keep the pair short, tightly coupled, and away from high di/dt copper. If leads are long, model the drop, add compensation in calculations, and relocate measurement points close to the actual load pads.

Q: What is a safe auto‑retry policy for short‑circuit events?

Bound the number of retries and include a cool‑down delay to protect the pass device. Thermal faults should take priority over current faults. Many systems use a small fixed number of attempts then latch‑off, requiring host intervention to clear the condition safely.

Q: Which pins should always have test pads for validation?

Provide pin‑tip pads for VIN, VOUT, SDA, SCL, INT/ALERT#, and PG. These allow synchronized scope captures and host logs. Keep pads close to the component pins and label them clearly to avoid probe‑induced errors during bring‑up and production diagnostics.

Introduction & Scope

A programmable LDO exposes VOUT, ILIM, and soft-start (TON/TOFF) via I²C/PMBus, with telemetry (V/I/T), alarms, and optional event logging. This page targets single-rail or few-rail precision supply use. Multi-rail sequencing/margining lives on the Power System Manager page; digital compensation/inductor topics live on the PMBus Digital Buck page.

Scope: programmable soft-start & PG, protection actions (ILIM → foldback → retry/latch), and telemetry/logging for debug & reliability.

Architecture

Control path: I²C/PMBus → registers → DAC → error amplifier → Pass FET → VOUT. Observe path: remote sense → MUX → ADC → telemetry/STATUS → ALERT#/log. Stability notes focus on sampling bandwidth, debounce, and avoiding inner-loop pole/zero from sense RC.

Control path (I²C/PMBus → DAC → EA → Pass FET → VOUT) and observe path (remote sense → ADC → STATUS/ALERT/log). Focus: sampling bandwidth & debounce.

Engineer notes: Keep telemetry refresh, alarm debounce, and register polling in sync; place sense RC near the load return to avoid inner-loop artifacts; limit VOUT step size/interval when using margin high/low under heavy load.

Register Map Essentials

Minimal, practical subset for a programmable LDO with I²C/PMBus. Keep units, steps, accuracy, and update rate explicit to ease validation and automation.

Minimal set: VOUT commands and margins, IOUT warn/fault with debounce/retry, timing (TON/TOFF), status/telemetry, and optional log.

Register	Function	Range / Step	Unit	Accuracy	Update rate	Debounce / Retry	Notes
VOUT_COMMAND	Output setpoint	0.6–5.5 V / 5–10 mV	mV	±1–2%	N/A (static)	—	Clamp within VOUT_MAX
VOUT_MAX	Safety ceiling	≥ setpoint / device limit	mV	—	N/A	—	Blocks illegal writes
MARGIN HI/LO	Test offsets	±1–10% / step 5–10 mV	mV	±1–2%	per write	—	Use small step + dwell under load
IOUT_OC_WARN	Over-current warn	0.1–3 A / 25–100 mA	mA	±5–10%	telemetry tick	debounce ≥2–3 samples	Map to STATUS & ALERT#
IOUT_OC_FAULT	OC fault action	same range	mA	±5–10%	telemetry tick	retry / latch	Foldback or shutdown
TON_RISE / TOFF_FALL	Soft-start/stop	0.5–200 ms	ms	—	per write	—	Set to avoid inrush/undershoot
STATUS_WORD / VOUT / TEMP	Aggregated & domain bits	bitfields	—	—	1–20 Hz	sticky + clear-on-read	Sync with polling period
READ_VIN/VOUT/IOUT/T	Telemetry	—	V/mA/°C	V/T: ±1–2% · I: ±5–10%	1–20 Hz	avg/oversample	Document filter depth
BLACKBOX / LOG_CFG	Event logging	depth 8–256	—	—	on event	—	Time source & retention

# Minimal init (sequence)
write VOUT_MAX := safe_ceiling_mV
write VOUT_COMMAND := target_mV
write TON_RISE := softstart_ms
write IOUT_OC_WARN_LIMIT := warn_mA (debounce=3)
write IOUT_OC_FAULT_LIMIT := fault_mA (action=retry)
clear STATUS_WORD; configure LOG_CFG

# Polling loop
loop:
  read READ_VOUT, READ_IOUT, READ_TEMPERATURE
  read STATUS_WORD; if changed: capture timestamp, clear sticky, store to LOG
  sleep poll_ms

Programmable Sequences

Three reusable flows: (1) single-rail soft-start with PG/UV debounce, (2) ratiometric/tracking to a neighbor rail, (3) brown-out mitigation and safe rollback.

A) Single-rail: soft-start + PG + UV debounce

Step	Register	Value	Reason	Expected readback
1	VOUT_MAX	≥ target	Guard vs mis-writes	—
2	VOUT_COMMAND	target mV	Nominal setpoint	READ_VOUT ≈ target
3	TON_RISE	e.g., 10–50 ms	Limit inrush/undershoot	PG near end-of-ramp
4	UV debounce	≥ 2–3 samples	Suppress false UV	STATUS_VOUT clean
5	STATUS_WORD	clear	Baseline	all zeros

write VOUT_MAX := safe_ceiling
write VOUT_COMMAND := target_mV
write TON_RISE := softstart_ms
config UV_debounce := 3
clear STATUS_WORD
power_on()
wait_until(READ_VOUT within ±Δ and PG=1)

B) Multi-rail: ratiometric / tracking with a neighbor rail

Step	Register	Value	Reason	Expected readback
1	TON_RISE	match both rails	Ratiometric ramp	PG windows aligned
2	MARGIN HI/LO	± small	Fine-align endpoints	ΔV within spec
3	VOUT_COMMAND	step + dwell	Tracking follow	READ_VOUT tracks peer
4	STATUS_WORD	monitor	Detect anomalies	no WARN/FAULT

sync(TON_RISE_peer)
for each step in plan:
  write VOUT_COMMAND := prev + ΔmV
  sleep dwell_ms
  ensure |READ_VOUT - peer_V| ≤ ε
if anomaly: abort_and_restore()

C) Field tuning: brown-out mitigation and safe rollback

Step	Register	Value	Reason	Expected readback
1	STATUS_VOUT	check UV_WARN	Detect brown-out	bit set then clears
2	MARGIN HIGH	+ small	Temporary uplift	READ_VOUT increases
3	UV debounce	increase	Filter transients	reduced chatter
4	LOG_CFG	enable event	Post-mortem trace	entry appended
5	VOUT_COMMAND	small-step rollback	Return to nominal	no new WARN/FAULT

if STATUS_VOUT.UV_WARN:
  write MARGIN_HIGH := +ΔmV
  increase UV_debounce
  enable LOG_CFG
  while VOUT_nominal_not_met:
    write VOUT_COMMAND := current - step_mV
    sleep dwell_ms
    assert STATUS_WORD clean

Engineer notes: Keep telemetry update, alarm debounce, and host polling aligned. Under heavy load, cap per-step ΔV and enforce minimal dwell to avoid secondary trips.

Telemetry & Alarms

Balance refresh rate and bandwidth: use averaging to tame noise, then map conditions to STATUS_* and an interrupt pin (ALERT#). For reliability, keep a ring-buffer log with timestamps and write-amplification control.

Telemetry averaging at 1–20 Hz drives STATUS and ALERT#; a ring-buffer event log retains key transitions with timestamps.

Item	Typical update	Averaging	Effective BW	Accuracy (typ.)	Alarm debounce	Notes
READ_VOUT	5–20 Hz	N=4–8	~1–3 Hz	±1–2 %	2–3 samples	Align with PG/UV thresholds
READ_IOUT	5–10 Hz	N=4–8	~1–2 Hz	±5–10 %	2–3 samples	Prefer WARN early, FAULT fast
READ_TEMPERATURE	1–2 Hz	N=8–16	<0.5 Hz	±2–3 °C	2–3 samples	Larger window reduces chatter
READ_VIN	1–10 Hz	N=4–8	~0.5–2 Hz	±1–2 %	2–3 samples	Increase during bring-up

# ALERT# ISR (debounced by device)
on_alert():
  s = read STATUS_WORD
  if s != prev_s:
    v = read READ_VOUT; i = read READ_IOUT; t = read READ_TEMPERATURE
    log_append(type=STATUS_CHANGE, s, v, i, t, timestamp())
    clear_sticky_bits()
    prev_s = s

# Background poll (align with update rates)
every poll_ms:
  v,i,t = read READ_VOUT, READ_IOUT, READ_TEMPERATURE
  if out_of_range(v,i,t): raise WARN (debounce)

Protections

Program thresholds for UV/OV, OC warn/fault, and thermal. Recommended action chain: current limit → foldback → latch or timed auto-retry. Use debounce for WARN; keep FAULT responsive.

Program UV/OV/OC/Temp thresholds; chain actions as limit → foldback → latch or auto-retry with sensible debounce and delays.

Condition	Threshold(s)	Debounce	Primary action	Secondary	Retry / Latch	Notes
UV (undervoltage)	WARN > FAULT (separate)	2–3 samples	Limit / hold ramp	Foldback if persistent	Retry with delay	Align with PG; step VOUT cautiously
OV (overvoltage)	WARN < FAULT (fast)	short / none	Shut or foldback	—	Latch preferred	Protect downstream ICs
OC (overcurrent)	WARN below FAULT	2–3 samples	Current limit	Foldback	Retry 3–5, then latch	Thermal monitors in loop
Thermal	WARN / SD with hysteresis	2–3 samples	Foldback / shut	—	Latch until cool	Give thermal priority

state = NORMAL
on_tick():
  s = read STATUS_WORD
  if s.UV_FAULT or s.OV_FAULT or s.OC_FAULT or s.TEMP_SD:
    state = PROTECT
    start_timer()
    apply current_limit()
    if oc_persistent(): apply foldback()
    if fatal(): latch_off()
  elif s.any_WARN_debounced:
    log_event(WARN, s, timestamp())

PROTECT:
  if recoverable() and retries <= max_retries:
    wait retry_delay_ms
    retries += 1
    restore_nominal()
    state = NORMAL
  else if not recoverable():
    latch_off()

Stability & Loop Interaction

Keep the programmable pieces from fighting the analog loop: align Sense RC with the ADC sample window, avoid creating inner-loop poles/zeros via filtering, and account for remote-sense lead resistance that biases ΔV/ΔI.

Align Sense RC with sampling; keep averaging/debounce from adding dangerous delay; compensate wire resistance to avoid biased readings.

Parameter	Lower bound	Upper bound	Effect if violated	Quick fix
Sense RC cutoff	≥ 3× sample rate	≤ 1/3 sample rate	Inner-loop pole/zero → PG chatter	Raise f_RC or narrow sample window
Averaging window	N=4 (min)	N=16 (typ)	Too small: noisy WARN; too large: slow FAULT	Use small for FAULT path, larger for WARN
UV debounce	≥ 2 samples	≤ 6 samples	Too low: false UV; too high: late abort	Tune with step load traces
Margin step ΔV	≤ 10 mV	≤ 2% of VOUT	Large step → undershoot/OC chain	Reduce ΔV; add dwell ≥ 1–2× update period
Sense lead R	short / thick	> 100 mΩ round trip	ΔV/ΔI bias vs real load point	Compensate in calc; route closer to load

# Safe programmable stepping (margin or tuning)
window = averaging_samples()        # e.g., 8
update = telemetry_update_hz()      # e.g., 10 Hz
dwell  = max(150, 1000*window/update)  # ms
step_mV = min(10, 0.02 * VOUT_nominal_mV)

while target != current:
  next = approach(current, target, step_mV)
  write VOUT_COMMAND := next
  sleep dwell
  assert STATUS_WORD clean and READ_VOUT within ±ε
  current = next

Validation Playbook

Copy-ready plan: configure registers → exercise step loads → align READ_* with scope traces → check STATUS_* consistency, then run A/B scenarios (brown-out / thermal run-away / short). Verify log completeness and replay.

Validate by linking register plans to scope traces, aligning timestamps, then contrasting brown-out, thermal, and short-circuit behaviors.

Test Matrix

Scenario	Stimulus	Expected STATUS/ALERT	Pass criteria	Notes
Brown-out	VIN ramp-down then restore	UV_WARN (debounced) → UV_FAULT if severe; ALERT# pulse	Clean WARN before FAULT; recovery without chatter	Log entry with time source, no duplicates
Thermal run-away	High load soak to elevate T	T_WARN → TEMP_SD; action foldback	Foldback limits power; latch or timed retry as set	Thermal has priority if OC also trips
Short-circuit	Hard short at output	OC_FAULT immediate; ALERT#; optional retry	Limit → foldback within spec time; no oscillation	Retry N≤5 then latch is acceptable

Timeline Alignment Log

Signal	T_trigger	Δt to PG	Δt to ALERT#	Δt to READ_VOUT	Δt to STATUS change	Notes
Load step ↑	t0	+x ms	+y ms	+z ms	+w ms	Use common trigger for scope & host
VIN dip	t0	+x ms	+y ms	+z ms	+w ms	Document debounce settings
Thermal event	t0	—	+y ms	+z ms	+w ms	Check foldback entry/exit

# 1) Configure baseline
write VOUT_MAX, VOUT_COMMAND, TON_RISE
write UV/OV debounce, IOUT_OC WARN/FAULT, LOG_CFG
clear STATUS_WORD; note config_hash()

# 2) Step-load sweeps (up & down)
for each ΔI in plan:
  apply_load_step(ΔI)
  capture scope: Vout, PG, ALERT#
  poll READ_VOUT/IOUT/T with timestamps
  align_timebases(); compare thresholds to STATUS_*

# 3) Scenarios (A/B)
run brown_out(); run thermal_runaway(); run short_circuit()
score pass/fail per matrix; export report + logs

# Replay integrity
events = read_log_all()
events = merge_duplicates(events, min_interval_ms=1000)
assert chronological(events)
assert counts_by_type(events) match expected_matrix
replay(events) -> reconstruct STATUS timeline
compare against scope-aligned timeline (Δt within tolerance)

Layout Checklist (Copy-Ready)

Keep I²C quiet and the analog loop honest: place pull-ups close to the host, star-tie AGND-PGND, route remote-sense as a tight pair away from high-di/dt copper, and tame LOG/INT with light filtering.

I²C pull-ups & address straps AGND–PGND single-point Remote-sense pair High-current loop split LOG/INT EMI mitigation Decoupling islands Thermal vias ESD/TVS at edge Silkscreened I²C address Scope/PIN-tip test pads

Keep sense differential and quiet; keep power copper short and wide; star-tie grounds and filter LOG/INT.

I²C: Place SDA/SCL pull-ups at host; address resistors (ADDR0/1) next to the LDO; keep I²C over calm reference copper.
AGND–PGND: Single-point star tie; keep reference/ADC returns on AGND only.
Remote-sense: Route VOUT_SNS± as a tight pair, no vias over hot copper; RC at LDO pins.
Split loops: High-current output loop outside; keep sense/LOG/INT inside isolated corridor.
LOG/INT: Add 22–100 Ω series + small RC; optional weak pull to avoid float.
Decoupling: Input/Output MLCC close; digital vs analog caps in separate islands.
Thermal: Copper spreaders + via array under pass FET pad; don’t cross sense pair.
ESD/TVS: Put clamps at connector edge; return path not through reference nets.
Silkscreen: Fix I²C address on silk; 0 Ω options for A/B/C addressing.
Test pads: VIN/VOUT/SDA/SCL/INT/PG pin-tip pads; scope + READ_* timestamp alignment.

Mini IC-Selection Pointers

Only parts with I²C/PMBus-programmable LDO functions and usable status/telemetry are listed. Independent LDO means the LDO channel is addressable/configurable at run-time; PMIC LDO means controlled via the PMIC register map.

Quick-scan badges: interface, telemetry set, and automotive grade.

Brand	Series / Part	Interface	VIN / VOUT Range	Step / Accuracy	ILIM (Prog)	TON / Soft-start	Telemetry Items	AEC-Q100	Pkg / Temp	Notes
TI	TPS6594-Q1 (PMIC LDO)	I²C	VBAT → LDOs up to ~3.3/5.0	mV-step (per LDO) / typ. ±2–3%	Prog limit / foldback	Prog TON / sequencing	STATUS, PG, temp; log via host	Yes (-Q1)	FC/QFN • -40~125 °C	PMIC LDO Multi-rail SoC power
TI	TPS65219 / TPS6521905	I²C	2.8–5.5 / 0.5–3.3 (LDO)	mV-step / typ. ±2–3%	Warn/Fault levels	Soft-start via regs	STATUS, PG; READ_* limited	—	QFN • -40~105 °C	PMIC LDO MCU/MPU companions
ST	STPMIC1 (e.g., STPMIC1A)	I²C	VIN 2.8–5.5 / LDO 0.8–3.3	mV-step / typ. ±2–3%	Warn/Fault via map	Prog TON & order	STATUS, PG, temp flag	—	QFN • -40~105 °C	PMIC LDO STM32MPx power
ST	STPMIC2 / STPMIC2x	I²C	Wide / LDO multi-rails	mV-step / typ. ±2–3%	Prog thresholds	SS/TON in regs	STATUS, PG	—	QFN • -40~105 °C	More rails, richer map
NXP	PF5020	I²C	3.3–5.5 / LDO up to 3.3	mV-step / typ. ±2–3%	Prog warn/fault	Power-up profile	STATUS, PG; temp	—	HLQFN • -40~105 °C	PMIC LDO i.MX support
NXP	PF1550	I²C	USB-in / LDO 0.8–3.3	mV-step / typ. ±2–3%	Prog levels	Soft-start via regs	STATUS, INT	—	WLCSP/QFN • -40~85 °C	Wearables/portable
Renesas	RAA215300	I²C	Wide / LDO multi-rails	mV-step / typ. ±2–3%	OC warn/fault	Programmable	STATUS, PG, temp	—	FC/QFN • -40~105 °C	PMIC LDO RZ/MPU
Renesas	DA9063 (Dialog)	I²C	2.8–5.5 / LDO up to 3.3	mV-step / typ. ±2–3%	OC map	Seq & delays	STATUS, INT	—	VFBGA • -40~105 °C	Classic multi-rail PMIC
onsemi	FAN53880	I²C	2.5–5.5 / LDO multi-rails	mV-step / typ. ±2–3%	OC warn/fault	Soft-start in regs	STATUS, INT	—	WLCSP • -40~85 °C	Camera/handheld
onsemi	NCP6924 / NCP6922	I²C	3.0–5.5 / LDO 0.9–3.3	mV-step / typ. ±2–3%	Prog thresholds	Sequencing	STATUS, PG	—	QFN • -40~105 °C	General PMIC LDOs
Microchip	MCP16502	I²C	2.7–5.5 / LDO 0.8–3.3	mV-step / typ. ±2–3%	OC flags	TON/seq in GUI	STATUS, PG	—	QFN • -40~105 °C	PMIC LDO SAM/MPU power
Microchip	MIC2826 (NRND)	I²C	2.7–5.5 / LDO multi-rails	mV-step / typ. ±2–3%	OC warn	Prog delays	STATUS pins	—	QFN • -40~85 °C	Legacy reference
Melexis	—	—	—	—	—	—	—	—	—	No catalog parts with I²C/PMBus-programmable LDO + telemetry found; focus is sensors/actuators.

How to use: shortlist by interface/telemetry/AEC first, then verify ΔV step, ILIM granularity, and TON profile match your bring-up script. For automotive, prefer latch-off on OV/thermal and bounded auto-retry on OC.

Submit BOM (48h) — Cross-Brand Equivalents

Get a procurement-ready shortlist in 48 hours for programmable LDOs with I²C/PMBus control, including cross-brand equivalents and function-close options when pin-to-pin is not feasible.

Response in 48h on business days; accelerated turnarounds available for urgent cases.
Seven brands covered: TI, ST, NXP, Renesas, onsemi, Microchip, Melexis (included when matching parts exist).
Two-tier results: (1) fully programmable LDO first; (2) function-close with differences noted (interface, step size, temp grade).
Risk notes: EOL/NRND screening, counterfeit risk hints, and suggested safe replacements.
Deliverables: CSV + human-readable summary; criteria include interface, telemetry, ILIM/VOUT steps, TON profile, AEC-Q100, package and lead time.

Submit BOM (48h) See common questions

Use your site form template below to submit requirements (target VOUT, accuracy, ILIM range, AEC-Q100 preference, package, quantities, lead-time, and BOM file).

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Frequently Asked Questions

What qualifies as a “programmable LDO” for this page?

A device must expose I²C or PMBus registers that change operating behavior at run-time, such as VOUT, ILIM, soft-start, alarms, or telemetry. Parts with only Enable/PG pins are excluded. PMICs are included when their LDO rails are individually addressable through a documented register map.

How do I choose step size and accuracy for VOUT margining?

Keep ΔV steps small enough to avoid triggering UV/OV thresholds and allow the loop to settle between steps. Use the device’s nominal accuracy to set your pass/fail bands, and enforce dwell time matched to telemetry update plus averaging window to prevent false violations.

Can I program ILIM at run-time without risking false trips?

Yes, if you combine reasonable step granularity with debounce on fault paths. Avoid abrupt increases at high load and consider temperature drift and foldback behavior. Validate with step-load tests while logging STATUS bits and READ_IOUT to confirm clean entry and exit conditions.

I²C vs PMBus: when does PMBus actually help on a single rail?

PMBus adds standard command semantics, structured status words, and clearer telemetry conventions. For a single rail, PMBus helps when you want portable scripts, richer fault reporting, or reuse across vendors. If you only tweak VOUT occasionally, plain I²C with a simple map can be enough.

How fast should telemetry update to catch brown-outs?

Choose a READ_* rate that exceeds the expected event bandwidth after averaging. Faster is not always better; oversampling with large windows adds latency. A practical approach is to set an update rate several times the worst-case droop duration and confirm by scope-to-telemetry alignment.

Do I need black-box logging or is STATUS_* enough?

STATUS_* is fine for live supervision, but black-box logs help post-mortem analysis and field returns. Use a ring buffer with timestamp source and de-duplication to limit write amplification. Validate that entries persist across brown-outs and that replay matches your scope timeline.

How to avoid PG chatter after enabling averaging or debounce?

Keep WARN/FAULT thresholds separated from nominal by a margin larger than the averaged noise. Match debounce length to transient duration and ensure sense RC bandwidth does not create inner-loop artifacts. Confirm stability with step-load sweeps while monitoring PG and STATUS transitions.

Remote sense length limit before ΔV bias breaks specs?

There is no single length: the issue is round-trip resistance and coupling. Keep the pair short, tightly coupled, and away from high di/dt copper. If leads are long, model the drop, add compensation in calculations, and relocate measurement points close to the actual load pads.

What is a safe auto-retry policy for short-circuit events?

Bound the number of retries and include a cool-down delay to protect the pass device. Thermal faults should take priority over current faults. Many systems use a small fixed number of attempts then latch-off, requiring host intervention to clear the condition safely.

Which pins should always have test pads for validation?

Provide pin-tip pads for VIN, VOUT, SDA, SCL, INT/ALERT#, and PG. These allow synchronized scope captures and host logs. Keep pads close to the component pins and label them clearly to avoid probe-induced errors during bring-up and production diagnostics.

How do you score “pin-to-pin vs pin-compatible vs function-close” alternatives?

Pin-to-pin shares footprint and signals with equivalent ratings and safe limits. Pin-compatible may require minor passives or mapping changes. Function-close keeps key behaviors (VOUT/ILIM/TON, telemetry) but differs in details. We label the class and list deltas so you can assess risk quickly.

Can I reuse an MCU driver across brands?

Yes, if you abstract register access behind a small driver layer. Normalize commands such as set VOUT, read STATUS, and clear faults. Keep device-specific maps in tables and gate advanced features behind capability flags to make cross-brand swaps straightforward.

How does AEC-Q100 grading map to my validation effort?

AEC-Q100 focuses on reliability and temperature range, not full application compliance. For automotive or harsh environments, still verify protection timing, telemetry integrity, and logging under thermal soak and brown-out conditions aligned with your vehicle or system test plan.

What MOQ and lead-time should I expect for engineering lots?

Small lots vary by package and brand. Expect reels or cut-tape minimums and multi-week lead-times for specific grades. We label stock tiers and propose alternates with similar registers or telemetry to keep your bring-up on schedule while final parts are inbound.

What information helps you return a 48-hour cross-brand shortlist?

Please share target VOUT range and tolerance, ILIM window, whether I²C or PMBus is preferred, AEC-Q100 and temperature range, package constraints, quantities, and desired lead-time. A current BOM or schematic snippet accelerates matching and improves alternative quality.

Programmable LDO (I²C/PMBus)

Programmable LDO (I²C/PMBus)

Introduction & Scope

Architecture

Register Map Essentials

Programmable Sequences

A) Single-rail: soft-start + PG + UV debounce

B) Multi-rail: ratiometric / tracking with a neighbor rail

C) Field tuning: brown-out mitigation and safe rollback

Telemetry & Alarms

Protections

Stability & Loop Interaction

Validation Playbook

Test Matrix

Timeline Alignment Log

Layout Checklist (Copy-Ready)

Mini IC-Selection Pointers

Submit BOM (48h) — Cross-Brand Equivalents

Request a Quote

Accepted Formats

Attachment

Frequently Asked Questions

Explore

Categories

Get in Touch

Programmable LDO (I²C/PMBus)

Programmable LDO (I²C/PMBus)

Introduction & Scope

Architecture

Register Map Essentials

Programmable Sequences

A) Single-rail: soft-start + PG + UV debounce

B) Multi-rail: ratiometric / tracking with a neighbor rail

C) Field tuning: brown-out mitigation and safe rollback

Telemetry & Alarms

Protections

Stability & Loop Interaction

Validation Playbook

Test Matrix

Timeline Alignment Log

Layout Checklist (Copy-Ready)

Mini IC-Selection Pointers

Submit BOM (48h) — Cross-Brand Equivalents

Recommended topics you might also need

Request a Quote

Accepted Formats

Attachment

Frequently Asked Questions

Explore

Categories

Get in Touch