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Scenario & problem statement: why wearables need a nano-leakage charger

Wearables run on very small cells (typically 50–200 mAh, sometimes even 30–80 mAh). Users also leave them idle for a whole weekend or keep them in warehouse/storage for 1–3 months. In these intervals, even a few microamps from the charger itself (not the MCU) can eat a big portion of the battery. That is why we need a nano-leakage charger that sleeps together with the system.

Typical field complaints come from three patterns: (1) the MCU already entered deep-sleep but the charger did not; (2) an NTC divider or TS pin is permanently enabled and keeps stealing current; (3) the wearable is not docked (VBUS = 0) but the front-end detect circuit is still waiting for a wake. Our target for this page is to make all three visible and to write current limits directly into the BOM.

Minimum BOM-level requirements we will enforce in later chapters:

  • Shipping / storage current of the charger IC: ≤ nA–a few µA @ VBAT = 4.2 V, system off.
  • Charger quiescent current must be stated with VBAT = 4.2 V, no system load, NTC gated.
  • Wake-on-VBUS / wake-on-button must not leave the charger in a high-current steady state after charge completion.

We do not expand JEITA here (only one sentence: wearable chargers shall still expose JEITA zone). We do not talk about high-voltage / 6S / 12S / automotive packs. We do not cover USB-C PD power-path coordination because that belongs to the USB-C sink + charging page.

Nano-leakage charger scenarios for wearables Three wearable battery scenarios showing why a nano-leakage charger is required to avoid weekend battery drain. Nano-Leakage Charger — Wearable Scenarios Smart Band 100 mAh / 3 days shelf Weekend drain sensitive 50–200 mAh Charger must also sleep Medical wearable Do not drain when not used Storage / shipping current critical Ship <= 1–2 µA with NTC gated Industrial tag Wake on dock / NFC / VBUS Detect without draining VBUS / button / timed wake later chapters
Figure — Three wearable battery scenarios showing why a nano-leakage charger is required to avoid weekend battery drain.

Takeaway for purchasing: “Charger must also sleep” is a BOM-level requirement, not only a firmware feature. Do not approve alternatives that lack a documented ship-mode / deep-sleep current.

Operating states timeline for nano-leakage wearable chargers

A wearable charger does not live in a simple ON/OFF world. It moves along a low-power timeline: Shipping → Storage → User attach / dock detect → Charging (pre / fast) → Back to deep-sleep. At each state, the allowed leakage is different and the ability to report telemetry is different. Only certain wake sources are allowed to pull the charger out of deep-sleep.

Shipping

Target: ≤1 µA total

May skip telemetry; wake by VBUS / button.

Storage

Target: ≤2–3 µA incl. NTC gating

Do not keep NTC divider on in this state.

Dock detected

Temporary active, <200 µA

Used to confirm real charge intention.

Charging

Normal charger mode

Must report charging state + JEITA zone.

Deep-sleep return

Back to µA range

After charge: do not stay mA-level.

Operating states timeline for a nano-leakage wearable charger Timeline of shipping, storage, dock-detected, charging, and deep-sleep states for a nano-leakage wearable charger. Nano-Leakage Wearable Charger — State Timeline Ship ≤1 µA total Storage ≤2–3 µA incl. NTC Dock temp active <200 µA Charge report state + JEITA Deep back to µA range VBUS / dock Button Timed (RTC / gauge)
Figure — Operating states timeline for a nano-leakage wearable charger. Only VBUS, button, or timed events are allowed to wake low-leakage states.

Disallowed for this page:

  • No long-idle power-path priority for large batteries.
  • No multi-cell re-enumeration logic.
  • No cloud-OTA wake-up flow (handled in cloud/coordination page).

BOM takeaway for purchasing: “Wake-on-VBUS / button shall not increase steady-state current above µA range after charge completion.” If a replacement charger does not document this behavior, it shall not be approved.

Ultra-low leakage strategy: the charger side must also sleep

Many wearable failures come from reading the charger datasheet only at Iq (EN = 1) and assuming it is the real shipping / storage current. That value is often measured in an enabled, normal-bias condition and does not reflect what the device will draw when the MCU has already entered deep-sleep and the user is not docking the device. In this chapter we pin down the leakage sources and the exact 4-point test that must be written into the BOM.

Where leakage comes from

1) Charger internal bias / monitors

Reference, safety and status circuits that stay alive even when the system is off. Must have a published shipping current number.

2) NTC / TS divider

Most wearables leave the temperature divider powered; this alone can burn 10–50 µA. In ship-mode the divider must be gated.

3) Dock / VBUS detect front end

Magnetic / pogo detect circuits waiting for a charger. If they are always on, they defeat the purpose of nano-leakage.

How to read charger leakage specs

If the datasheet only gives you Iq (EN = 1) or IBAT quiescent at 25°C, that is not enough for a wearable. We must force the vendor (or ourselves) to test under the real shipping condition and to check it again at elevated temperature.

  • Look for a distinct shipping / storage current spec.
  • If the TS pin / NTC is enabled in the example circuit, ask what the current becomes when TS is gated.
  • If the device has a “VBUS present” low-power mode, specify that we need the numbers with VBUS = 0 and the device waiting for a dock.

BOM 4-point test condition (write this exactly)

These 4 conditions must be in the BOM so purchasing, factory and FAE all measure the same thing:

  1. VBAT = 4.2 V (full cell condition)
  2. SYS = no load (system fully off / disconnected)
  3. NTC = not permanently driven (divider gated in ship-mode)
  4. Shipping pin / ship command = asserted (real low-leakage state)

Optional but recommended: repeat measurement at 40–50°C, because some parts meet the number only at 25°C.

Must-shut-down paths

1) Input / VBUS detect branch
In ship-mode this branch must be off. “Always-on detect” is not acceptable for sub-200 mAh wearables.

2) System-side LDO / bias
If SYS is off, bias must also be off. Do not accept parts that keep bias alive with no system load.

Don’t approve… alternatives that (a) only specify Iq with EN=1, (b) do not tell NTC / TS divider current in ship-mode, or (c) cannot disable dock-detect front ends in shipping state.

Leakage paths in a nano-leakage wearable charger Block diagram highlighting leakage sources in a nano-leakage charger: NTC divider, dock detect front end, and charger bias. Battery 1S, 50–200 mAh Nano-leakage charger VBAT=4.2V, ship-mode Internal bias / monitors System MCU / BLE / sensors must be off in ship NTC / TS divider OFF in ship-mode Dock / VBUS detect must be µA-level Cloud / telemetry not always on
Figure — Block diagram highlighting leakage sources in a nano-leakage charger: NTC divider, dock detect front end, and charger bias. Charger side must also sleep.

Ship-mode / deep-sleep wake path design

After we make the charger sleep, we must still be able to wake it. Wearables typically need exactly three wake sources: VBUS / pogo pad detect, user button / touch, and timed (RTC or gauge) wake. All of them must follow the same pattern: wake → charge / report → sleep again. A wake event must not leave the charger in a mA-level standby state.

Three wake paths & when to use them

VBUS / pogo pad detect

For magnetic / dock charging. Must detect attachment but return to µA after charge.

User button / touch

For user-driven wake. Short active period only, no permanent mA standby.

Timed (RTC / gauge event)

For periodic reporting to cloud / gateway. Must expose the wake reason.

Post-wake power limit

Every wake must converge back to the same low-leakage goal. We can write it as a BOM line:

“Wake-on-VBUS / button / timed shall return to µA-range within T = 1–3 s after charge completion or user detach.”

Wake reason telemetry (for cloud mapping)

Because we are in the BMS branch, cloud-side mapper must know which source woke the charger. Minimum fields to expose:

  • wake_source (VBUS / button / timed)
  • charging_state (pre / fast / done / fault)
  • JEITA_zone (to keep thermal control even in wearables)

If we swap across TI / ST / NXP / Renesas / onsemi / Microchip / Melexis and the wake reason is encoded differently, the cloud-side telemetry mapping must be updated before production.

Ship-mode ≠ standby ≠ disabled charger

Many datasheets use standby to mean “charger not running” but still powered; this is not the same as a wearables-grade ship-mode. A real ship/deep-sleep must:

  • pull total current down to the nA–µA range,
  • still be wake-able by one of the three sources,
  • not require system power to wake,
  • and expose the wake cause once the system is online.

Don’t approve… parts where “standby” is advertised as “shipping mode” but no current number is provided, or where standby cannot be woken by VBUS.

MCU handshake (push back to ship)

After a valid wake and charge, the system MCU should ACK the event and force the charger back into ship/deep-sleep. This guarantees that even user-aborted charge attempts do not leave the charger sitting at mA-level.

Wake sources for a nano-leakage wearable charger Three wake sources for a nano-leakage charger in wearables: VBUS detect, user button, and periodic RTC/gauge events. Charger (ship-mode) wake → charge → sleep again VBUS / pogo detect docked by user User button / touch user-driven wake RTC / gauge event periodic reporting System / MCU / Cloud mapper read wake_source + charging_state + JEITA_zone
Figure — Three wake sources for a nano-leakage charger in wearables: VBUS / pogo detect, user button / touch, and periodic RTC / gauge events. All follow the same pattern: wake → charge → sleep again.

Coordination with gauge / NTC / JEITA for low-leakage profiles

Goal for this chapter: you want nano-leakage, but you cannot lose temperature protection. That means the NTC path must be switchable / gated, and when the NTC is shared with a gauge, the gauge must present a high-impedance input in ship-mode. We also keep a minimum JEITA reporting set: “JEITA zone must still be exposed even in ship mode.”

NTC sharing scenarios

NTC on charger side

Charger owns the NTC divider. In ship-mode the divider must be off, otherwise it will dominate the leakage budget.

NTC shared with gauge

Gauge reads the same sensor, but must be high-Z when the charger is in ship-mode. No always-on loading on the divider.

Wake → measure → sleep

On wake, enable NTC, read temperature, expose JEITA zone, then remove the divider again.

JEITA minimal reporting set

We do not expand full JEITA curve here. For this wearable low-leakage branch we only require:

  • charging_state (pre / fast / done / fault)
  • JEITA_zone (cold / cool / warm / hot)
  • source_of_temp (charger-NTC / shared-NTC / gauge) — optional but recommended

This is enough for the BMS branch to keep thermal supervision even when the device is mostly sleeping.

Leakage budget when sharing NTC

Rule: if the device is expected to stay undocked for 2–3 days and the cell is 80–120 mAh, the temperature-sensing branch must not be always-on. Use a gated divider or an NTC power switch, measure in a short window, then go back to high-Z.

Procurement prohibition list

  • Do not approve chargers that only support fixed-temperature charging.
  • Do not approve chargers that require NTC divider to stay powered in ship-mode.
  • Do not approve chargers that cannot expose JEITA zone while in wearable low-leakage profile.
  • Cross-brand alternatives must still support NTC gating and JEITA reporting (TI / ST / NXP / Renesas / onsemi / Microchip / Melexis).
NTC sharing with a nano-leakage charger NTC sharing between a nano-leakage charger and a gauge, with gating in ship-mode to avoid extra leakage. NTC / JEITA coordination for low-leakage wearables Battery 1S wearable Nano-leakage charger Ship-mode: low leakage NTC divider must be gated NTC divider OFF in ship-mode Gauge / monitor high-Z in ship-mode Ship-mode: NTC OFF, divider not powered Wake / charge: NTC ON → read → report JEITA
Figure — NTC sharing between a nano-leakage charger and a gauge, with gating in ship-mode to avoid extra leakage. Wake → enable NTC → report JEITA → disable.

Safety & BMS linkage for 30–200 mAh wearable cells

Very small batteries are not afraid of one big charge cycle; they are afraid of “looks like off but actually trickling” and “looks like storage but actually leaking through sensing branches.” To prevent this, the wearable charger must stay aligned with the BMS branch and always be able to upload: charging state, JEITA zone, and wake reason. As soon as we swap TI ↔ ST ↔ onsemi or any of the seven brands, the cloud-side telemetry mapping must be updated.

Typical risks for small cells

Looks off but is slowly charging

Dock detect or charger bias never returned to µA → weekend drain or storage drain.

Looks like storage but NTC is on

TS divider is permanently enabled. After 1–3 months the cell is flat.

Cross-brand payload mismatch

Charger changed → field names changed → cloud did not → data is wrong.

Mandatory fields to upload

For this nano-leakage wearable charger page, we keep exactly 3 fields aligned with the BMS mainline:

  • charging_state — so the cloud knows the device is actually charging, not passively leaking.
  • JEITA_zone — so thermal derating is still visible even in low-leakage mode.
  • wake_reason — VBUS / button / timed; without it cloud cannot classify the event.

This also makes it possible to detect “suspicious” events such as a device waking up from storage too often.

What the cloud mapper does here

Different vendors encode charger telemetry differently. TI might expose charging_state + temp_code, ST might expose chg_status + bat_temp, and onsemi might expose chrg_evt + jeita_zone. The cloud-side mapper takes these different payloads and normalizes them into a single wearable charging schema.

Cloud-side telemetry mapping must be updated before cross-brand alternatives. Otherwise the cloud will misread charging-state / JEITA / wake-origin and the safety logic will be ineffective.

Cloud telemetry mapper for wearable chargers Cloud telemetry mapper normalizing charger payloads from TI, ST, and onsemi into a single wearable charging schema. TI charger charging_state temp_code ST charger chg_status bat_temp onsemi charger chrg_evt jeita_zone Cloud telemetry mapper normalize vendor payloads • map charging state • map JEITA zone • map wake source update before cross-brand alternatives Unified wearable charging schema charging_state JEITA_zone wake_source timestamp
Figure — Cloud telemetry mapper normalizing charger payloads from TI, ST, and onsemi into a single wearable charging schema (charging_state + JEITA_zone + wake_source).

BOM takeaway: “Before approving TI / ST / NXP / Renesas / onsemi / Microchip / Melexis charger alternatives, synchronize the cloud-side telemetry mapper with the new payload.”

Small-batch procurement & cross-brand alternatives

For wearable nano-leakage chargers we only allow replacement inside the seven brands: TI / ST / NXP / Renesas / onsemi / Microchip / Melexis. Every replacement must keep: (1) real ship/deep-sleep, (2) µA-level leakage with NTC gated, and (3) telemetry fields (charging_state, JEITA_zone, wake_reason). Cloud-side telemetry mapping must be updated before using cross-brand alternatives.

Mistake 1: no ship-mode

Picking a classic linear charger (e.g. MCP73831) to replace TI BQ25180 without adding ship-mode gating.

Mistake 2: standby ≠ ship

Approving parts where “standby = 20–50 µA” and calling it “shipping current”.

Mistake 3: 25 °C only

Checking leakage only at 25 °C; warehouse 40–45 °C will drain small cells.

Mistake 4: NTC always powered

Not verifying if NTC/TS divider can be gated in ship-mode.

Preferred parts by brand (nano-leakage / wearables)

TI → BQ25180, BQ25185, BQ25120A
ship-mode, ultra-low Iq, wearable-grade

ST → STBC15, STBC08, STBC28
single-cell, low-power, NTC-capable

NXP → PF1550 / MC34PF1550Axx (charger part)
needs low-power profile enabled

Renesas → ISL9205A, ISL9205D, ISL9220A
single-cell charger, add NTC gating

onsemi → NCP1852, NCP1855 + LC709204F (gauge)
USB/dock wake, set post-charge low-power

Microchip → MCP73831, MCP73871
must add NTC/power gating for nano-leakage

Melexis → MLX91216 / temp-sensing nodes
keep telemetry sensor when charger swapped

Three replacement paths

A → A (same brand, same series)

TI BQ25180 → TI BQ25185
ST STBC15 → ST STBC08
Cloud: no change (fields compatible).

A → B (cross-brand, same wake)

TI BQ25180 → onsemi NCP1852
ST STBC15 → Microchip MCP73831 (+ gated NTC)
Cloud: must update mapper.

A → A’ (same brand, new payload)

NXP PF1550 option → newer NXP PF1550 code
Renesas ISL9205A → ISL9205D
Cloud: change field names.

Procurement decision tree for nano-leakage wearable chargers Procurement decision tree for swapping nano-leakage wearable chargers across seven major brands while preserving ship-mode and telemetry. Need nano-leakage + ship-mode + telemetry? Same brand / same series available? OK Need swap Match wake sources? (VBUS / button / timed) Update cloud telemetry mapper! Always stay inside TI / ST / NXP / Renesas / onsemi / Microchip / Melexis and write leakage + ship-mode conditions into the BOM.
Figure — Procurement decision tree for swapping nano-leakage wearable chargers across seven major brands while preserving ship-mode and telemetry.

BOM-style examples

  • “Use TI BQ25180 or BQ25185. Ship-mode leakage ≤ 2 µA @ VBAT = 4.2 V, NTC gated.”
  • “If TI BQ25180 is not available, use ST STBC15 or STBC08 with external NTC gating. Update cloud-side telemetry mapping before use.”
  • “Do NOT approve chargers that cannot expose both charging_state and JEITA_zone to gateway.”

BOM remarks & telemetry hooks (wearable edition)

This section is the copy-ready version for small-batch orders. All lines below assume a single-cell wearable battery (30–200 mAh) and a nano-leakage charger that must sleep together with the MCU.

This page specific BOM lines

1. Charger / gauge must expose charging_state and JEITA_zone to edge gateway.

2. Ship-mode leakage ≤ 2 µA @ VBAT = 4.2 V, NTC gated, VBUS=0.

3. Cloud-side telemetry mapping must be updated before using cross-brand alternatives.

4. Devices that only support fixed-temperature charging must NOT replace NTC / JEITA-enabled parts.

5. If using Microchip MCP73831 / MCP73871, add NTC/power gating to keep nano-leakage profile.

6. If using onsemi NCP1852 / NCP1855, enable post-charge low-power and report wake source.

7. If using NXP PF1550, configure wearable low-power profile and map telemetry fields.

Telemetries to bind in cloud

Minimum telemetry set for this page:

  • charging_state
  • JEITA_zone
  • wake_reason (VBUS / button / timed)
  • hw_brand (TI / ST / NXP / Renesas / onsemi / Microchip / Melexis)
  • fw_mapper_ver (so we know mapper was updated after replacement)

When to reject supplier alternatives

Reject if: (1) charger has no ship/deep-sleep mode; (2) NTC/TS divider cannot be gated; (3) wake reason cannot be reported; (4) supplier says “standby 20 µA” but no 4.2 V ship-mode number; (5) cloud mapper not updated after TI ↔ ST ↔ NXP ↔ Renesas ↔ onsemi ↔ Microchip ↔ Melexis swap.

BOM remarks connected to cloud telemetry hooks BOM remark lines for a nano-leakage wearable charger connected to cloud telemetry hooks. BOM lines (wearable) leakage, NTC gating, JEITA Supplier rules only 7 brands, no fixed-temp only Cross-brand note update cloud mapper first Cloud / gateway charging_state + JEITA_zone wake_reason + hw_brand fw_mapper_ver BOM → Cloud hook → Telemetry dashboard “Cloud-side telemetry mapping must be updated before using cross-brand alternatives.”
Figure — BOM remark lines for a nano-leakage wearable charger connected to cloud telemetry hooks.

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Testing & validation: how to prove “it really does not leak” on a bench

This procedure is for small-batch buyers, FAE teams and factories that need to verify leakage on a table-top setup without a full validation lab. We assume a wearable charger built from the seven allowed brands (TI BQ25180/BQ25185/BQ25120A, ST STBC15/STBC08, NXP PF1550, Renesas ISL9205, onsemi NCP1852, Microchip MCP73831/MCP73871, Melexis for sensing retention). The goal: show that in ship/deep-sleep, at VBAT=4.2V, with NTC gated, the current is in the µA (or sub-µA) range — and that it still wakes on VBUS and then goes back to µA.

Test supply

Bench supply → set VBAT = 4.2 V (repeat at 3.8 V). 4-wire or low-R wires preferred.

No system load

SYS / VSYS left open or high-Z. We only measure what the charger consumes.

Ship / deep-sleep asserted

Pull the ship/deep-sleep pin (TI BQ25180/BQ25185), or use the lowest-power enable (STBC15), then measure.

Step-by-step procedure

  1. Set VBAT. Configure bench supply to 4.2 V (full cell). Repeat later at 3.8 V to emulate a partially charged wearable device.
  2. Remove system load. Disconnect VSYS / system rail / LED drivers. We must measure charger-only leakage.
  3. Assert ship/deep-sleep. For TI BQ25180/BQ25185/BQ25120A pull the ship line; for STBC15/STBC08 put the device into its storage/low-power mode; for Microchip MCP73831/MCP73871 make sure TS/NTC is gated externally.
  4. Insert a µA meter in series with the battery side. Place the meter between bench supply and BAT to read actual shipping current. Zero/relative the meter if you work in nA range.
  5. Apply VBUS / dock. Connect a 5 V source to the VBUS/pogo pad to wake the charger. Watch the current spike and, after 1–3 s, confirm that current returns to the µA range.
  6. Repeat at 40–50 °C. Put the board inside a desktop thermal box, re-run steps 3–5. Record if shipping current increases at high temperature.

Test points to record

1) BAT / cell side — VBAT=4.2 V, SYS=NC, ship asserted → target ≤ 2–5 µA (adjust to your BOM value).

2) VIN / VBUS side — VBUS=0, dock absent → detect branch should also be in µA range.

3) NTC / TS line — ship-mode must gate the divider. If you see permanent current here, the part is not suitable for weekend-not-worn wearables.

Record everything at 25 °C and 40–50 °C. Some chargers only specify low Iq at room temperature. For small cells (30–200 mAh) this is not enough; high-temperature leakage must also be known and written into the BOM / cloud telemetry.

Bench validation setup for nano-leakage charger Bench validation setup: bench supply set to VBAT=4.2V, nano-leakage charger with ship pin pulled, µA meter in series, VBUS source to test wake and return to deep-sleep. Nano-leakage charger — bench validation setup Bench supply VBAT = 4.2 V repeat @ 3.8 V Nano-leakage charger ship / deep-sleep = asserted TS / NTC must be gated TI BQ25180 / STBC15 / NCP1852 / MCP73831… µA meter measure BAT leakage zero before test VBUS / dock 5 V for wake test wake → spike → fall back Record: 25 °C + 40–50 °C VBUS spike current return-to-µA time store in BOM / cloud
Figure — Bench validation setup for measuring nano-leakage charger shipping current and wake behavior. Supply VBAT=4.2 V, assert ship, measure with µA meter, apply VBUS, confirm return to µA, repeat at 40–50 °C.

Test results must be written into the BOM / cloud record, e.g.: “Ship-mode leakage ≤ 2 µA @ VBAT=4.2 V, TS gated, 25/50 °C, charger=TI BQ25180 → if replaced by ST STBC15 or onsemi NCP1852, update cloud-side telemetry mapping first.”

Frequently Asked Questions — Nano-leakage wearable charger

All questions below belong to this page. They focus on low-leakage, ship-mode, wearables (30–200 mAh) and on the seven-brand-only replacement rule (TI, ST, NXP, Renesas, onsemi, Microchip, Melexis). Use them directly in WordPress without extra styling.

Why do I still need ship-mode if the MCU already sleeps?

Because the charger itself can draw several µA even when the MCU is in deep-sleep. For weekend-not-worn wearables you must make both MCU and charger sleep, otherwise the cell will drain in 2–3 days.

What shipping current is acceptable for 80–150 mAh wearables?

Use ≤ 2–5 µA @ VBAT = 4.2 V, VBUS=0, SYS=NC, NTC gated. If the part cannot meet this, it is not for the nano-leakage branch.

How do I gate the NTC / TS divider but still report JEITA?

Enable the divider only on wake or on charge, read temperature, map to JEITA zone, then disable it again. The field JEITA_zone must still be sent to cloud even in ship-mode.

Can I keep dock/VBUS detect always-on for user convenience?

Yes, but its current must be counted in the leakage budget. If always-on detect exceeds the budget, make the charger path sleep as well.

What if the replacement charger cannot report JEITA zone?

Then it cannot be approved for this page. Either pick an alternative inside TI / ST / NXP / Renesas / onsemi / Microchip / Melexis that reports JEITA, or update the cloud mapper to synthesize the zone.

How do I test wake → charge → sleep again on a bench?

Supply 4.2 V, assert ship, apply VBUS and log the spike, confirm that within 1–3 s the current drops back to µA. Repeat at 40–50 °C like in Chapter 9.

Can I use a consumer USB charger IC here?

Usually no. Many consumer parts only have standby, not true ship. They may also keep TS divider powered. That breaks the nano-leakage requirement.

Which parts can I swap inside the same brand without cloud changes?

TI BQ25180 ↔ BQ25185 ↔ BQ25120A, ST STBC15 ↔ STBC08, onsemi NCP1852 ↔ NCP1855. Still re-measure leakage like in Chapter 9.

What should I write in BOM when I approve cross-brand alternatives?

Write: “Charger/gauge must expose charging_state and JEITA_zone; cloud-side telemetry mapping must be updated before using cross-brand alternatives; ship-mode leakage ≤ 2 µA @ VBAT=4.2 V, NTC gated.”

Why update cloud-side telemetry mapping before swapping TI ↔ ST ↔ onsemi?

Because each brand reports slightly different field names / payloads. Without mapping, the cloud cannot see the real JEITA zone or wake source and safety logic will fail.

What is the difference between standby and real ship/deep-sleep?

Standby can still draw tens of µA. Ship/deep-sleep must go to a few µA or lower and still allow VBUS/button/timed wake. For wearables only the second is acceptable.

How do I measure nano-leakage current in a desktop thermal box?

Same as Chapter 9: VBAT=4.2 V, SYS=NC, assert ship, insert µA meter in series, then raise temperature to 40–50 °C and confirm current stays within your BOM limit.