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Contact / Glass-Break Sensor: Hall & Acoustic AFE + ULP Radio

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Contact / Glass-break sensors become reliable when detection is built on measurable evidence: stable contact margins (reed/Hall), explainable acoustic features (two-band + timing), and power/RF proofs (VBAT droop@TX, RSSI/PER). Long battery life comes from managing the current waveform and duty-cycle, while false alarms are reduced by rules that can be traced and validated in production tests.

H2-1 • System Boundary & Sensor Variants

System Boundary & Sensor Variants

This page treats contact sensing (door/window open–close and tamper) and glass-break detection (event-level) as a single endpoint category because they share the same long-life power, ULP MCU, and Thread/Zigbee radio. The sensor front-end and decision logic are intentionally separated: contact uses magnetic state; glass-break uses acoustic signatures. The goal is a design that is measurable, explainable, and robust against false alarms.

What this page covers (and what it does not)

Covers: sensor front-ends (Reed/Hall, mic AFE), wake-on-event logic, false-alarm control, battery-life budgeting, radio burst side-effects (VBAT droop), and EMC/ESD evidence on the endpoint.
Does not cover: hub/alarm panel architecture, cloud rules, app UX, commissioning flows, or protocol-stack deep dives.

Deliverable: Variant selector (choose the sensing path by goal)

The selector below forces a clean split: pick the user-visible outcome first, then bind to a measurable evidence chain.

Goal → Variant
What must be proven (first evidence)
Open/Close Lowest false triggers Longest battery
Preferred path: Reed (digital) when geometry is stable; Hall (analog) when thresholds must be tuned.
Evidence #1: magnet geometry margin (closed-distance + misalignment window).
Evidence #2: edge behavior at the threshold (single transition vs edge burst).
Tamper Magnet attack Enclosure open
Typical signals: unexpected magnetic field shape or cover switch change; all must remain ultra-low leakage in sleep.
Evidence #1: baseline sensor reading vs known “normal” installation state.
Evidence #2: event log (time-stamped tamper flags) without increasing sleep current.
Glass Event Explainable local logic Noise-robust
Path: MEMS mic + acoustic AFE with two-band energy + timing gates (no cloud inference required).
Evidence #1: background noise floor (two-band baseline) in the installation environment.
Evidence #2: signature order: low-frequency impact followed by high-frequency shatter burst.
Evidence chain (minimum instrumentation)
  • VBAT droop during radio TX burst: measure VBAT with a scope at the moment of transmission; confirm UVLO margin and reset behavior.
  • Raw sensor observables: contact edges/time-stamps (Reed) or analog readings (Hall); acoustic two-band envelopes (glass-break).
  • Event log: store the last N events with timestamps and key scalars (edge count, peak envelope, noise floor) for field debug.
Contact / Glass-Break Endpoint Boundary Same platform • different sensing branches • evidence-first decisions Shared Platform Battery + Power Path UVLO • droop margin ULP MCU event log • thresholds Thread / Zigbee Radio TX bursts • coexistence Contact Sensing Branch Reed Switch edge / debounce Hall Sensor threshold / hysteresis Outputs: Open/Close • Tamper (local) Glass-Break Branch MEMS Mic noise floor Acoustic AFE LF/HF gates Output: Glass Event (local) Evidence taps: VBAT • raw sensor • event log
Figure F1. Boundary map: contact and glass-break share power + ULP + radio, but each branch owns its own AFE and local decision logic.
Cite this figure • Suggested caption: “Contact/Glass-break endpoint boundary with shared ULP platform and separate sensing branches.”
H2-2 • Event Physics & Signal Signatures

Event Physics & Signal Signatures

Sensor front-ends must be sized from what the real-world event looks like at the sensor pins. This section defines the minimum signatures needed to build an explainable detector: contact events are dominated by magnetic geometry and threshold crossings; glass-break events are dominated by a two-stage acoustic pattern (impact → shatter burst). Each signature is framed with a measurement plan so thresholds can be tuned without guessing.

Contact: magnetic change vs threshold chatter
  • True open/close: a clean transition that crosses the threshold once, with stable settle after closure.
  • Chatter near threshold: edge bursts (multiple crossings) caused by door vibration, loose magnet, or insufficient geometry margin.
  • Geometry drift: the “closed” state sits too close to the threshold (metal frame, misalignment, door warp), making small motion look like an event.

Minimum proof for contact reliability:
(1) Measure closed-state margin (distance/misalignment window).
(2) Log edge count / time-stamps during a vibration test. A high edge-burst rate indicates chatter, not genuine open/close.

Glass-break: two-stage acoustic signature (no cloud inference)
  • Stage A — impact energy: a lower-frequency rise from an удар/knock; common in false triggers (slam, thunder, door hit).
  • Stage B — shatter burst: a short, high-frequency-rich burst; the most discriminative local evidence.
  • Sequence gate: Stage B must follow Stage A within a defined time window; this filters random noise spikes.

Minimum proof for glass-break detection:
(1) Capture two-band envelopes (LF and HF) for background noise to set a stable baseline.
(2) Confirm the event order (LF rise → HF burst) and that the HF burst is not simply steady fan noise.

Deliverable: event-to-signature mapping (order-of-magnitude, evidence-first)
Event
Signature → discriminator (what proves it)
Door opensDoor closes
Contact path (Reed/Hall)
Single threshold crossing with stable settle.
Prove with: edge time-stamps (Reed) or monotonic reading change (Hall).
Door vibrationLoose magnet
False triggers
Edge burst near threshold (multiple crossings).
Prove with: edge-count rate vs vibration amplitude; adjust hysteresis / debounce window.
Glass break
Event-level
Two-stage pattern: LF impact then HF shatter burst.
Prove with: two-band envelope trace + timing gate (HF burst must be short and strong vs baseline).
ThunderDoor slamFan noise
False glass triggers
Often LF-heavy without a qualifying HF burst, or HF is steady not burst-like.
Prove with: HF burst duration and energy ratio vs baseline; enforce sequence gate.
Event Signatures (Evidence-First) Keep thresholds tied to measurable shapes, not assumptions Contact clean transition vs chatter near threshold A) Clean open/close threshold B) Chatter (edge bursts) threshold Evidence: edge-count rate ↑ when vibration ↑ Glass-break LF impact → HF shatter burst (time-gated) Two-band envelopes energy time noise floor LF impact HF burst Gate: HF follows LF Evidence: two-band trace + timing window + baseline ratio
Figure F2. Minimum signatures to tune thresholds locally: contact chatter produces edge bursts near threshold; glass-break shows a two-stage LF→HF pattern.
Cite this figure • Suggested caption: “Contact chatter vs clean transitions; glass-break LF impact followed by HF burst under a timing gate.”

Practical rule: if thresholds cannot be explained by the above shapes (edge bursts, two-band timing, baseline ratio), the design is not field-debuggable and will drift into false alarms.

H2-3 • Reference Architecture Block Diagram

Reference Architecture Block Diagram

A reliable endpoint is defined by a single evidence chain: battery → power tree → wake event → sampling window → local decision → radio burst → event log. This reference diagram prevents scope drift by forcing every design choice to map to a measurable node: VBAT droop, raw sensor observables, and time-stamped decisions.

Deliverable

Figure F3 unifies the shared platform (power, MCU, radio) with two sensing branches (contact and acoustic). Evidence “taps” are explicitly marked so field debug does not depend on guesswork.

Evidence chain (minimum proof)
Stage
What to capture (evidence)
Power VBAT & rails
VBAT droop during TX burst; UVLO/BOR flags; rail enable timing.
Wake event source
Which wake fired: reed edge, optional hall threshold, or acoustic comparator.
Sample window
Raw observable: edge count/time-stamps (contact) or LF/HF envelopes (glass).
Decide local logic
Store scalars (noise floor, peak envelope, edge burst length) + decision result.
Transmit burst
Align TX marker with VBAT waveform; record retries and link quality statistics.
Reference Architecture (Endpoint) battery → power tree → wake → sample → decide → TX burst → event log Power Path Coin Cell VBAT source ESD / TVS return path Load Switch AFE rail gate Buck / LDO VDD_MCU • VDD_RF UVLO / BOR margin Tap: VBAT waveform Core Platform ULP MCU wake routing • timers • counters Event Log last N events BOR reset Radio Thread / Zigbee TX burst current Antenna detune risk Tap: TX time marker Sensing Branches Contact reed edge • debounce GPIO Acoustic LF/HF envelopes AFE Tap: raw edges / envelopes → event scalars
Figure F3. Reference endpoint architecture with explicit evidence taps: VBAT droop, raw observables, decision scalars, and reset flags.
Cite this figure • Suggested caption: “Endpoint reference architecture tying power, wake, sampling, decision, and TX burst to measurable taps.”

Debug discipline: any field failure must map to one of the taps above (VBAT droop, raw signal shape, decision scalars, reset flags). If it cannot be measured, it cannot be stabilized.

H2-4 • Contact Sensing Path A (Reed Switch)

Contact Sensing Path A: Reed Switch

A reed switch is the lowest-power contact sensor because it can behave like a near-zero-leakage state input. The engineering challenge is not the switch itself, but magnetic geometry margin and threshold chatter: small vibrations can produce edge bursts that look like multiple opens. A robust design turns those edges into measurable evidence and filters them without hiding real opens.

Deliverable A: Reed wiring checklist (hardware + firmware boundary)
Block
Checklist (what to lock)
GPIO input pull strategy
Choose pull-up/down to minimize leakage and susceptibility; prefer Schmitt input when available.
ESD & spikes
Add series-R close to the MCU pin; ensure ESD return path does not inject into the sensor node.
Debounce method
Set debounce window using measured edge-burst duration, not a fixed default. Merge repeats within a holdoff window.
State policy sleep
Prefer event-driven wake + timestamp logging. Avoid always-on sampling that increases sleep current.
Deliverable B: False-alarm triage tree (symptom → evidence → isolate → first fix)

Symptom: “open” event while the door/window is closed.
First evidence (capture 2 signals): (1) GPIO edge time-stamps / edge count; (2) VBAT waveform aligned to TX marker.
Discriminator:
• Edge bursts correlate with vibration → chatter near threshold (geometry or debounce).
• Edge bursts correlate with TX burst → power/EMI coupling into the input node.
• No edge bursts but state flips → state machine/logging bug or intermittent leakage path.
First fix (highest leverage): increase geometry margin, tune debounce/holdoff, add series-R/Schmitt/RC as needed, then re-measure edge-burst statistics.

Evidence chain (what makes reed “field-debuggable”)
  • Geometry margin: closed-state distance and misalignment window must sit far from the effective threshold.
  • Edge-burst statistics: measure burst length and edge count under controlled vibration; tune debounce to cover typical bursts.
  • TX-aligned checks: verify whether false edges cluster at radio transmit moments (VBAT droop or EMI injection).
Reed Contact Path (Evidence-Based) front-end wiring + edge signatures → debounce tuned from measurements Front-End Wiring Reed contact Pull up / down Series-R ESD / spike RC (opt.) extra filter MCU GPIO Schmitt input edge timestamp Tap: edges Edge Signatures clean transition vs chatter → debounce window A) Clean open/close threshold B) Chatter (edge bursts) threshold debounce window Tune debounce from burst duration statistics
Figure F4. Reed contact wiring blocks and the two critical edge signatures: clean transitions vs chatter bursts that must be absorbed by a tuned debounce window.
Cite this figure • Suggested caption: “Reed front-end wiring and edge-burst evidence used to set debounce and holdoff windows.”

A reed design is stable only when the closed-state geometry margin is large enough that vibration produces few or no threshold crossings. Debounce should be a measured parameter (burst duration/edge count), not a fixed default.

H2-5 • Contact Sensing Path B (Hall Sensor)

Contact Sensing Path B: Hall Sensor

Hall sensing turns “magnet geometry” into a measurable signal with tunable thresholds. Compared with a reed switch, Hall enables programmable hysteresis and installation-aware calibration, which directly reduces false opens caused by door vibration, magnet misalignment, and metal door-frame distortion. The design objective is not higher sensitivity, but stable margin: the closed-state reading must remain far from the switching region across temperature and mechanical drift.

Deliverable A: Threshold & hysteresis setting (from distance→output curve)

Method: build a distance→output curve under worst geometry (offset/tilt), then place thresholds so both states retain margin.
Step 1 — curve capture: sweep magnet distance (and typical misalignment) and log raw codes.
Step 2 — drift envelope: repeat at hot/cold to measure temperature drift and offset shift.
Step 3 — hysteresis width: measure vibration-induced peak-to-peak code swing near the boundary; set hysteresis above that swing plus drift margin.
Step 4 — threshold placement: choose open/close thresholds inside the “safe gap” so closed never sits near the switch region.

Deliverable B: Local calibration strategy (no cloud)
Stage
What to store / update (local)
Factory trim
Offset / gain normalization so raw codes are comparable across units; store as small constants.
Install learn
Capture a stable “closed baseline” (and optional open baseline). Derive thresholds within bounded limits.
In-field slow update
Update baseline only in stable windows; freeze learning during suspected tamper or rapid motion.
Evidence chain (what proves root cause)
  • Distance curve: raw Hall code vs distance/offset; confirm the “safe gap” between closed and open distributions.
  • Temperature curve: raw code drift vs temperature; verify thresholds remain outside drift envelope.
  • Replay buffer: on any false event, store the last N seconds of raw codes + threshold/hysteresis values for replay.
Hall Thresholding from Distance Curve tunable thresholds + hysteresis + local learn + replay evidence Geometry magnet direction • distance • metal frame frame Magnet N/S Hall distance Metal frame shifts curve (distortion) Factory Learn Replay Distance → Output place thresholds inside the safe gap raw code distance TH_open TH_close hysteresis Keep closed away from boundary Replay: last N sec raw codes + thresholds + decision
Figure F5. Hall sensing uses distance→output curves to set thresholds and hysteresis with explicit margin under drift and metal distortion, backed by local replay evidence.
Cite this figure • Suggested caption: “Hall distance curve thresholding with hysteresis, local learn, and replay evidence for false-event forensics.”

A Hall design is stable when the closed-state distribution (across temperature and alignment) remains well separated from the switching band. Calibration should be bounded and replayable so that false events can be proven with raw data.

H2-6 • Glass-Break AFE (Mic → AFE → ADC/Comparator)

Glass-Break AFE: Mic → AFE → ADC/Comparator

Glass-break detection succeeds when the analog front-end preserves the signature without distortion. The key engineering variables are bias stability, gain and dynamic range, band shaping, and clipping avoidance. A practical endpoint can separate noise from true events using two-band energy (LF impact + HF shatter burst) and a time gate, without relying on cloud inference.

Front-end parameter table (keep it measurable)
Parameter
Why it matters + how to verify
Mic bias / Vref
Bias drift lifts LF envelope and triggers false events; verify by long baseline capture in quiet room.
PGA gain
Too high causes clipping during impact; verify time-domain waveform for flat tops and envelope collapse.
LF band (impact)
Provides “event start” evidence; verify LF envelope rises before HF burst in real break recordings.
HF band (shatter)
Most discriminative; verify HF is burst-like (short) and not steady fan noise.
Sampling rate
Must capture HF burst without aliasing; verify with HF envelope stability across units.
Trigger thresholds
Use ratios to noise floor + time gate; verify using false-alarm recordings (slam/thunder/fan).
Evidence chain (minimum proof without complex models)
  • Time-domain snippet: confirm no clipping and that the burst exists (impact + shatter segment).
  • Two-band envelopes: LF rises first, HF shows a short burst above baseline, within a defined window.
  • Baseline capture: noise floor measured in the installation environment to prevent fan/voice false triggers.
Failure modes tied to AFE parameters

False alarms: LF-heavy noise or bias drift raises the envelope baseline; fix by stabilizing bias, tightening LF threshold, and enforcing HF burst requirement.
Missed events: gain too low hides HF burst, or gain too high clips impact and distorts burst; fix by prioritizing headroom, then re-tuning thresholds to baseline.
Unstable thresholds: noise floor not tracked locally; fix by storing baseline scalars and using ratio-based triggers.

Glass-Break AFE (Two-Band Gate) bias • gain • band-pass • envelope • time gate • decision (no cloud) MEMS Mic Bias Vref PGA Gain Split LF / HF LF BPF impact LF Env envelope HF BPF shatter HF Env envelope Gate LF → HF Decide Baseline (Noise Floor) store LF/HF baseline scalars locally for ratio triggers Clipping check Two-Band Evidence energy time LF HF time gate
Figure F6. Glass-break AFE reference: stable bias and sufficient headroom preserve signatures; two-band envelopes plus a time gate separate noise from true events.
Cite this figure • Suggested caption: “Mic AFE with LF/HF band-pass, envelope detection, clipping awareness, baseline tracking, and LF→HF time-gated decision.”

Priority order for stable detection: prevent clipping first, then set ratio-based thresholds to the local baseline, and finally enforce LF→HF timing. This keeps the decision explainable and field-debuggable without complex models.

H2-7 • Local Classification & False-Alarm Control

Local Classification & False-Alarm Control (Explainable)

False-alarm control must be explainable on the endpoint. A robust local decision uses two-band energy (LF impact + HF shatter burst), duration limits, and a time gate (LF → HF order) with thresholds referenced to an adaptive noise floor. Each report should carry a compact “why” record: Rule ID, thresholds, baseline, and feature snapshots.

Deliverable: Rule table (condition → purpose → false source → suppression)
Condition (Local Rule)
Purpose • Common false source • Suppression
R1 LF_env > k·Baseline_LF
Marks event start • door slam / low-frequency bumps • require R2/R3 to confirm.
R2 HF_env burst present
Confirms shatter-like burst • steady fan / appliance noise • enforce burst-like duration (R4).
R3 Time gate: HF within Δt after LF
Forces correct order • unrelated HF spikes • reject out-of-window HF.
R4 HF_dur within [min, max]
Rejects long HF • continuous noise / whistles • upper-bound HF duration.
R5 HF/LF ratio above threshold
Blocks “impact only” events • knocks / slams • require sufficient HF energy vs LF.
R6 Clipping flag = 0
Avoids distorted features • too-high gain • treat clipped frames as low-confidence or re-sample.
R7 Holdoff window (merge repeats)
Prevents multiple reports • burst train • merge events within a short window.
R8 Multi-condition vote (min set)
Explainable confidence • single-feature spikes • require a minimum rule set (R1+R2+R3).
Adaptive noise floor (local, bounded, non-polluting)

Update only in quiet windows: baseline_LF/HF moves slowly when no event is suspected.
Freeze on triggers: when any pre-trigger condition occurs, freeze baseline to avoid “learning” a real event.
Ratio triggers: compare envelopes to baseline (k·baseline) to stay stable across night/AC/rain changes.

Evidence chain (how a false alarm is proven)
  • Rule ID hit list: which rules fired (e.g., R1+R3 but missing R2).
  • Baseline snapshot: Baseline_LF/HF at trigger time (night/AC/rain drift visibility).
  • Feature snapshot: LF_peak, HF_peak, HF_dur, Δt, ratio — logged for replay.
Explainable Local Rules + Evidence two-band features • adaptive baseline • rule IDs • replayable logs LF Env impact HF Env burst Features peak dur Δt ratio Baseline noise floor LF HF Rules R1 R2 R3 R4 R5 R6 R7 R8 Gate Vote ratio-to-baseline duration limits Decision event / no event Evidence Rule ID thresholds baseline features TX Marker align decision time with VBAT droop
Figure F7. Local decision stays explainable by logging rule IDs, baseline snapshots, and feature values that triggered (or failed) each condition.
Cite this figure • Suggested caption: “Explainable local rules with adaptive baseline and evidence logging for false-alarm forensics.”

A stable endpoint report is one that can be replayed and explained: which rules fired, what baseline was assumed, and what feature values crossed thresholds.

H2-8 • Long-Life Power Architecture

Long-Life Power Architecture (Current Waveform Managed)

Long battery life is achieved by managing the current waveform, not by slogans. The lifetime loop closes only when sleep current, wake sampling window, TX burst peak, and battery internal resistance (especially at low temperature) are measured together. The critical failure mode is VBAT droop during peaks crossing BOR/UVLO, causing resets and missed events.

Deliverable: Battery life budget table (replace with measured numbers)
State
What to measure (evidence)
S0 Deep sleep
nA/µA sleep current; confirm with low-leak measurement and stable VBAT.
S1 Event listen
always-on AFE/comparator current (if used); verify no drift over hours.
S2 Wake + sample
sample window duration + average current; align to trigger timestamp.
S3 TX burst
peak current + VBAT droop; scope VBAT and align to TX marker.
Evidence chain (three measurements that close the loop)
  • Sleep current (S0): measure nA/µA-class current after stabilization.
  • TX peak & VBAT droop (S3): scope VBAT and tag the TX moment; verify droop margin vs BOR/UVLO.
  • Low-temp reproduction: repeat bursts at low temperature to reveal increased internal resistance and deeper droop.
Primary mitigations (local, measurable)

Domain gating: power the mic/AFE only during the sampling window to shrink duty cycle.
Peak awareness: align TX scheduling to safe VBAT conditions; log BOR flags for forensics.
Headroom first: ensure TX peaks do not cross BOR/UVLO across temperature; validate by VBAT waveform, not averages.

Current Waveform + VBAT Droop Budget sleep • sample window • TX burst peak • low-temp internal resistance Current manage peaks and duty cycle I time Sleep Sample Compute TX burst peak duty cycle VBAT droop during peaks vs BOR/UVLO V time BOR / UVLO droop low-temp TX marker Budget S0 sleep S2 sample S3 TX events/day
Figure F8. Battery life is dominated by peak management and duty cycle. Align TX timing to VBAT droop evidence and validate margin vs BOR/UVLO, especially at low temperature.
Cite this figure • Suggested caption: “Current waveform states (sleep/sample/TX) and VBAT droop vs BOR line, including deeper droop at low temperature.”

A credible lifetime claim requires replacing all placeholders with measured currents, measured durations, measured event rates, and scoped VBAT droop under worst temperature.

H2-9 • Thread/Zigbee Radio Coexistence

Thread/Zigbee Radio Coexistence (Power + Antenna Evidence)

Endpoint radio stability is determined by two measurable chains: TX burst → VBAT droop (and possible BOR) and antenna efficiency under metal/battery shielding. Coexistence here focuses on hardware evidence only: align the TX moment to VBAT waveform and correlate packet performance statistics with distance and installation geometry.

Deliverable: Two must-measure items (hard evidence)
Must-measure
Why it matters • How it proves root cause
M1 VBAT droop @ TX burst
Separates power collapse from RF geometry • scope VBAT and tag TX marker; check margin vs BOR/UVLO.
M2 RSSI/LQI + PER vs distance
Separates antenna/shielding from noise • record stats at fixed points; compare near metal door frame vs free-space.
Antenna / layout checklist (mechanically verifiable)
  • Keepout: reserve a no-metal/no-battery region around the antenna area; avoid screws and large copper islands in the near-field.
  • Ground reference: provide a controlled ground reference; avoid “floating” grounds that make tuning unstable across units.
  • Metal proximity risk: door frame and battery can detune and block radiation; validate by rotating/offsetting a few centimeters and re-logging RSSI/LQI.
Power-side checklist (TX burst sensitivity)

Peak dominates: verify TX peak does not pull VBAT below BOR/UVLO across temperature.
Shared impedance: avoid RF bursts modulating AFE/MCU rails; correlate baseline jumps with TX marker.
Low-temp repeat: internal resistance rises at low temperature, deepening droop and shortening usable range.

Evidence chain (minimum closure)
  • VBAT waveform aligned to TX marker: droop depth + recovery time + BOR flag correlation.
  • Packet performance vs distance: simplified PER curve and RSSI/LQI distribution; compare “near metal” vs “free-space.”
Radio Evidence: Power + Antenna VBAT droop aligned to TX • RSSI/LQI/PER vs distance under metal shielding TX burst → VBAT droop TX burst VBAT droop BOR TX marker Must-measure M1: droop depth + recovery + BOR flag align to TX marker Antenna under metal Antenna keepout no metal Metal frame Battery PER vs distance RSSI / LQI stats distance PER free near metal Must-measure M2: RSSI/LQI + PER curve (metal vs free)
Figure F9. Two root-cause chains are proven with two measurements: VBAT droop aligned to TX burst, and packet statistics vs distance under metal/battery shielding.
Cite this figure • Suggested caption: “Radio reliability evidence chain: TX-burst VBAT droop and antenna shielding impact on RSSI/LQI/PER vs distance.”

A “range drop” is not a protocol mystery until VBAT droop and antenna shielding have been ruled out with aligned evidence.

H2-10 • Ruggedness: ESD/EMC/Tamper

Ruggedness: ESD/EMC/Tamper (Minimum Set + Local Flags)

Endpoint sensors most often fail from the real environment: ESD from touch and door frames, EFT-like fast transients from long leads, and repeated coupling into sensitive inputs. Ruggedness is achieved by a minimum protection set (TVS + series-R + RC where needed) and by verifying return paths. Tamper mechanisms must remain local and evidence-based: case-open and magnet interference should set local flags and freeze adaptive learning.

Deliverable: Minimum protection set (verifiable checklist)
Protection element
Goal • Common pitfall • What to verify
P1 TVS (at entry)
Clamp ESD energy • too far from entry • verify low-inductance return path to reference/ground.
P2 Series-R (near pin)
Limit injected current • placed too far • verify reduced edge spikes and less pin overstress.
P3 RC (selective)
Filter fast spikes / debounce noise • over-filtering • verify response time still meets event needs.
P4 Return path check
Keep surge current out of sensitive reference • “ground bounce” surprises • verify AFE baseline stability under stress.
Local tamper (endpoint only)

Case-open: a local switch/optical/capacitive indicator sets tamper_flag and records a timestamp.
Magnet attack: Hall saturation or abnormal direction/level patterns set a local magnet_tamper flag.
After tamper: freeze baseline learning and store a compact evidence snapshot (raw value + thresholds + time).

Evidence chain: post-ESD degradation diagnosis
  • Sleep current drift: rising sleep current indicates leakage damage; compare pre/post stress measurements.
  • GPIO behavior: input threshold/leakage changes show up as unstable levels or abnormal edge counts.
  • AFE baseline drift: mic/AFE bias shift raises noise floor and increases false triggers; log baseline before/after.
First isolation actions (fast triage)
  • Separate power vs input damage: if sleep current rises immediately, suspect leakage; if only triggers rise, suspect input baseline shift.
  • Check return-path effectiveness: repeat stress while observing baseline and droop; improvements should be visible in waveforms/logs.
  • Freeze learning on instability: prevent adaptive baselines from masking damage and making faults non-replayable.
Ruggedness: Minimum Set + Tamper ESD/EFT/touch injection paths • TVS/R/RC • return path • local tamper flags Threat ESD EFT Touch Long wire Endpoint inputs Reed / Hall input GPIO / ADC TVS R RC Mic AFE input bias / gain / env TVS R RC Return path check Tamper Case open Magnet tamper_flag freeze learn log evidence post-ESD check sleep I GPIO AFE
Figure F10. Ruggedness is dominated by injection paths and return paths. A minimal protection set (TVS + series-R + selective RC) and local tamper flags keep the endpoint replayable and diagnosable after stress.
Cite this figure • Suggested caption: “Threat injection paths, minimal protection set, return-path focus, and local tamper flags with post-ESD degradation checks.”

Many “passing” units still degrade: higher sleep current, unstable GPIOs, or elevated AFE noise floors. Logging these before/after stress is the fastest proof of damage.

H2-11 • Validation & Production Test Plan

Validation & Production Test Plan (Manufacturable, Reproducible)

A sensor is manufacturable only when failure modes are caught by a minimum, repeatable test set. This chapter defines a 3-layer closure loop: EOL (factory)Sampling (QA)Field repro. Every test has: pass criteria + failure code + next evidence to isolate the root cause.

Minimal instrument set (the “no-excuses” kit)

DMM sleep current + static VBAT
Scope VBAT droop aligned to TX marker + input/AFE baselines
PSU/Battery jig repeatable supply and series-R insertion (IR simulation)
Audio playback fixed-distance replay for glass-break scenario set (speaker/phone + simple stand)

Reference MPNs (examples; replace with approved alternates)
Function Example MPNs Why it appears in the test plan
Hall switch TI DRV5032 (e.g., DRV5032FADBZR) Contact path B validation (distance curve, temp drift, hysteresis window).
Reed contact Littelfuse 59025 series (e.g., 59025-1-S-02-A) Contact path A validation (mechanical bounce, placement tolerance).
Analog MEMS mic SPU0410LR5H-QB (-7) Glass-break AFE validation (noise floor, clipping risk, scenario replay).
Nanopower comparator TI TLV3691 Low-power trigger stage for envelope/threshold gating (baseline + hysteresis check).
Thread/Zigbee SoC Silicon Labs EFR32MG21 (e.g., EFR32MG21A010F512IM32) TX burst droop test (VBAT_min@TX, BOR flags, PER vs distance evidence).
ESD diode Nexperia PESD5V0S1UL Post-ESD degradation checks (sleep current, GPIO leakage, AFE bias drift).
Load switch TI TPS22910A Power isolation for repeatable droop capture and controlled rail sequencing in test.
Test taxonomy (EOL / Sampling / Field)
  • EOL (End-of-Line): fast screens for assembly, thresholds, and gross defects (minutes, not hours).
  • Sampling (QA): stress the corner conditions (distance/angle/temp, noise scenes, IR simulation) to catch systematic drift.
  • Field repro: minimum evidence capture with aligned markers: VBAT_min@TX + rule_id + PER/RSSI stats.
Deliverable — Contact matrix (distance / angle / temperature)

The goal is not to test “everything”, but to lock a repeatable tolerance window for installation. The same matrix structure works for reed and Hall; only the logged fields differ.

Tier Distance & Angle Temp Procedure (minimal) Log fields (evidence) Pass / Fail code
D1 Near / aligned RT 10 open/close cycles; hold closed 60s; repeat. Reed edge_count_after_debounce, false_edges_60s
Hall raw_code, threshold, hysteresis, drift_60s
Pass: 0 false triggers; ≥99% correct cycles
Fail: F-C1 / F-C2
D2 Mid / aligned RT Repeat D1; add light vibration (door shake) 10s. jitter_count, min/max raw, event timestamps Fail: F-C2 / F-C3
D3 Far / aligned RT Repeat D1; verify margin at the far limit. missed_events, raw_margin_to_threshold Fail: F-C1
A1 Mid / off-axis RT Offset magnet/actuator; 10 cycles; hold 60s. raw_vs_angle snapshot, edge bounce density Fail: F-C2 / F-C4
T1 Mid / aligned Cold Cold soak; repeat D2; check drift and margin. raw_vs_temp, baseline shift, missed/false events Fail: F-C3 / F-C5
Deliverable — Glass-break scenario set + threshold robustness

Glass-break validation must stay locally explainable: two-band energy + duration + time order + adaptive noise floor. The scenario set focuses on “looks similar but should not trigger”.

Scenario Playback setup Expected rule behavior Log fields (evidence) Pass / Fail code
S1 HVAC wind noise Fixed distance (e.g., 1 m), 60s No trigger; baseline adapts upward without “event latch”. noise_floor, LF_energy, HF_energy, rule_id (if any) Pass: 0 triggers
Fail: F-G1
S2 Door slam Impulse + decay, repeat ×10 LF spike allowed; must fail HF/time-order condition. LF_peak, HF_dur, time_gate_hit, rule_id Fail: F-G2
S3 Metal clank / keys Sharp HF, repeat ×10 HF spike alone must not pass “LF→HF order”. HF_peak, LF_energy, order_check, rule_id Fail: F-G2
S4 Target glass-break sample Replay ×10, same volume step Trigger with consistent rule path; no clipping. rule_id, feature_snapshot, clipping_flag, threshold Pass: ≥99% trigger
Fail: F-G3
S5 Robustness sweep Gain: low/nom/high No false triggers at high gain; no missed at low gain. gain_setting, noise_floor, clipping_flag Fail: F-G4
Deliverable — Power stress: series-R IR simulation (TX + event)

“Range drop” and “random reset” often collapse to one measurable chain: TX burst → VBAT droop → BOR. IR simulation uses a series resistor to emulate battery internal resistance rise at low temperature or aging.

IR step Temp Action Measure (aligned) Pass / Fail code
R0 (0Ω) RT TX burst ×N; event detect ×N; repeat. VBAT_min@TX, recovery_time, BOR_flag, PER/RSSI Fail: F-P1
R1 (small) RT Repeat; confirm margin and no silent resets. VBAT droop depth vs BOR line; reset counter Fail: F-P2
R2 (large) Cold Cold soak; repeat; log PER vs distance point. aligned TX marker + VBAT; PER curve snapshot Fail: F-P3
Failure codes → next evidence (the closure loop)
Fail code What it means (most likely) Next evidence to capture First fix direction
F-C1 Contact missed Threshold window too tight at far distance / off-axis raw_margin_to_threshold + repeat at D3/A1 Adjust threshold/hysteresis or tighten installation window
F-C2 Contact false trigger Bounce/vibration or coupled noise into GPIO/ADC edge_count_after_debounce + timestamps under shake Debounce/time gate; improve input RC and return path
F-C3 Cold drift Hall offset/temp drift or mechanical tolerance shift raw_vs_temp curve + drift_60s snapshot Re-center thresholds; local install calibration window
F-C4 Metal sensitivity Door frame detunes magnetic path / shifts curve raw_vs_angle + raw_vs_distance near metal Change magnet orientation/spacing; add tamper heuristic
F-C5 Leakage after stress ESD/EFT damage elevates leakage and noise floor sleep current pre/post + GPIO leakage check Strengthen TVS/series-R placement and return path
F-G1 Baseline not stable Noise floor estimator too slow/too fast noise_floor trend + rule_id trace Tune baseline time constant; clamp adaptation rate
F-G2 False glass trigger Rule gating incomplete (order/duration) LF/HF energies + order_check + time_gate flags Strengthen LF→HF order and duration constraints
F-G3 Missed glass Gain too low / threshold too high / mic placement feature snapshot + threshold at failure Increase gain margin or lower threshold within false rate
F-G4 Clipping AFE saturates → distorted features clipping_flag + waveform peak stats Reduce gain or add attenuation; protect headroom
F-P1 Droop near BOR Insufficient decoupling / shared impedance VBAT droop depth + recovery_time aligned to TX Improve power path, decoupling, or burst scheduling
F-P2 BOR resets VBAT crosses BOR during TX or event BOR_flag + reset counter + VBAT_min@TX Raise droop margin: reduce peak, add capacitance, optimize rails
F-P3 Range collapse under IR Power collapse masquerading as RF issue PER vs distance + VBAT_min@TX at same points Fix power chain first; then re-check antenna keepout
Validation → Manufacturable Closure EOL screen • QA sampling • Field repro with aligned evidence EOL (Factory) Sampling (QA) Field repro Contact quick screen Glass quick screen VBAT droop @ TX Pass → ship Fail → code + evidence Contact matrix distance • angle • temp Noise scenario set threshold robustness IR simulation series-R • cold Aligned capture Rule trace RF + Power stats VBAT_min@TX RSSI/LQI/PER Unified log fields: unit_id • fw_rev • rule_id • noise_floor • threshold • VBAT_min@TX • BOR_flag • RSSI/LQI • PER • result_code repro → refine limits
Figure F11. Manufacturable closure loop: EOL screens catch gross defects, QA sampling locks the tolerance windows, and field repro aligns droop/rules/RF stats to isolate root cause.
Cite this figure • Suggested caption: “EOL → QA sampling → field repro closure with unified evidence logging for contact and glass-break sensors.”

A test is only “production-ready” when a failure automatically produces: (1) a code, (2) a minimum evidence snapshot, and (3) a deterministic next step.

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H2-12 • FAQs ×12 • Evidence-based • Scope-locked

FAQs (Answers + On-page Accordions + Structured Data)

Rule trace VBAT droop @ TX RSSI/LQI/PER Edge/bounce counters Noise floor Post-ESD drift

1) Door is closed but “open alarm” appears sometimes. Check reed debounce or magnet geometry first?

Start with two captures: (1) false_edges_60s and edge_count_after_debounce while the door is static, and (2) contact margin (Hall raw_margin_to_threshold or reed stable level dwell time) across small door vibrations. High edge counts indicate bounce/EMI; a near-zero margin indicates geometry/offset. First fix: tighten debounce/holdoff, then reposition magnet or widen hysteresis.

Evidence anchors: edge counters + margin-to-threshold (→H2-4/H2-5/H2-11)
2) Sensing range drops a lot after mounting on a metal door frame. Magnetic path or antenna detune—what two measurements first?

Measure (1) the Hall raw curve versus distance near the metal frame (raw_vs_distance, same fixture) and (2) RSSI/LQI plus simplified PER vs distance in the same orientation. If the magnetic curve shifts (offset/slope change) while RF stats remain stable, it’s magnetic-path distortion. If Hall remains normal but PER collapses, it’s antenna detune/shielding. First fix: adjust magnet orientation/spacing or enforce antenna keepout.

Evidence anchors: raw curve + RSSI/LQI/PER curve (→H2-5/H2-9)
3) Battery drains faster in cold weather. Internal resistance rise or more wakeups—what two current evidences distinguish?

Capture (1) VBAT_min@TX (and recovery time) at cold temperature and (2) daily wake_count/tx_count (or rule-trigger count) from the event log. Deep VBAT droop with higher PER/retries points to internal resistance and peak-current stress. A stable droop but exploding wake_count points to more triggers (noise floor or contact chatter). First fix: run series-R IR simulation and update the duty-cycle budget with measured counts.

Evidence anchors: VBAT droop + wake/tx counters (→H2-8/H2-11)
4) Device reboots or drops link right when it transmits. Measure VBAT droop first or redesign the power tree first?

Measure first. Align a TX marker with scope captures of VBAT droop and read BOR_flag/reset_counter. If VBAT crosses the BOR/UVLO line or BOR flags increment, the root cause is power-path impedance or insufficient decoupling, not RF. If droop is small yet PER/RSSI spikes at the same distance/orientation, suspect antenna detune or metal shielding. First fix: reduce peak current / improve decoupling, then re-check keepout and ground reference.

Evidence anchors: VBAT_min@TX + BOR flags + PER/RSSI (→H2-8/H2-9)
5) No glass breaks, but thunder or door slams trigger alarms. Which band rule was breached, and how to tune without missing true events?

Inspect the trigger record: rule_id, LF/HF energy, order_check, and time_gate. If triggers show strong LF energy with weak HF burst, the LF threshold/duration gate is too permissive—tighten LF duration or raise LF threshold while keeping HF/order constraints. If triggers come from isolated HF spikes, strengthen LF→HF sequence and HF_dur limits. After tuning, regress against the noise scenario set to preserve true-event detection probability.

Evidence anchors: rule_id + LF/HF + order/time gate (→H2-6/H2-7)
6) False alarms increase when HVAC fan runs. Structure-borne sound or power noise into AFE—how to separate with evidence?

Use two tracks: (1) noise_floor trend (LF/HF) over minutes during fan on/off and (2) an electrical sanity check: AFE baseline shift and sleep-current stability (AFE_bias_shift, sleep_current). A smooth noise_floor rise that follows fan states points to structure-borne acoustics; a step-like baseline jump or higher sleep current points to injected noise/ESD damage or return-path issues. First fix: tune baseline estimator time constant, then verify protection/return path and input RC if electrical symptoms exist.

Evidence anchors: noise_floor + bias/current stability (→H2-6/H2-10)
7) Microphone path saturates easily. Reduce gain first or adjust bandpass/AGC? How to prove clipping-driven misclassification?

Check (1) a clipping_flag (or peak-histogram showing flat-topped samples) and (2) the feature snapshot: HF/LF ratio and burst duration at trigger. If clipping is present, reduce analog gain or add attenuation/headroom first; clipped waveforms create artificial HF energy and break time-order logic. If clipping is absent but HF energy is dominated by non-target bands, tighten bandpass and duration gates before lowering thresholds. Re-validate with the scenario sweep across gain steps.

Evidence anchors: clipping evidence + HF/LF feature snapshot (→H2-6/H2-7)
8) Same product behaves differently in different rooms. Different noise floor or mounting orientation—how to quick re-test?

Run a quick A/B: (1) record the room’s noise_floor baseline (LF/HF) and (2) replay the same scenario sample at a fixed distance and compare trigger probability plus rule_id path. A high baseline that pushes features near thresholds indicates environment-noise dominance; similar baseline but large differences across small rotations indicates mounting orientation and reflections shaping LF/HF energy. First fix: refresh baseline adaptation after installation, and define a mounting window validated by the scenario set.

Evidence anchors: baseline noise + replayed rule path (→H2-2/H2-7/H2-11)
9) Door contact bounce causes multiple reports. Mechanical bounce or EMI—how to distinguish?

Compare (1) edge_count_after_debounce during a controlled open/close cycle and during a static 60-second hold, and (2) post-stress electrical health: sleep_current and GPIO leakage/threshold stability after ESD/EFT exposure. Bounce that appears only during motion is mechanical; edges that appear while static, especially after stress, indicate EMI coupling or leakage. First fix: increase debounce/holdoff for mechanical bounce; for EMI, add series-R/RC at the input and confirm the ESD return path does not traverse sensitive reference nodes.

Evidence anchors: edge counters + post-stress leakage/current (→H2-4/H2-10)
10) Battery-life estimate is off by 2×. Which duty-cycle assumption is most likely wrong?

Validate two realities: (1) tx_count and wake_count per day (from logs) and (2) the measured current waveform segments (sleep, wake-sample, compute, TX burst) to build mAh/day from real durations. If counts are far above the model, the event/trigger frequency assumption is wrong. If counts match but VBAT droop causes retries or resets, the peak-current and internal-resistance assumption is wrong. First fix: replace every “typical” number with measured values.

Evidence anchors: counters + measured waveform segments (→H2-8)
11) After ESD it still works, but draws more current and false alarms rise. Where to suspect bias drift first?

Capture (1) sleep_current_pre/post and (2) AFE bias/noise_floor and threshold margins under the same quiet condition. A large sleep-current increase suggests leakage in input protection or GPIO structures. A noise_floor step-up or baseline shift suggests mic/AFE bias drift or front-end damage, which pushes features across thresholds. First fix: inspect the minimal protection set (TVS placement, series-R, return path), then re-run EOL quick screens and update fail codes for post-ESD degradation.

Evidence anchors: pre/post current + baseline/bias shift (→H2-10/H2-11)
12) Want both contact and tamper without increasing sleep current. How to design it safely?

Prove it with (1) measured sleep current in “tamper enabled” mode and (2) a tamper_flag trace that shows triggers only during real events. A tamper design that continuously biases sensors will inevitably raise sleep current; prefer event-gated approaches (threshold comparator, intermittent sampling, or a low-power Hall state machine). On tamper detection, freeze self-learning and log evidence (rule_id/baseline) rather than increasing sampling permanently. First fix: move tamper sensing to a gated domain.

Evidence anchors: sleep-current delta + tamper flag trace (→H2-8/H2-10)
FAQ Evidence Loop Symptom → two measurements → discriminator → first fix → retest Symptom false alarm / miss / reset Two measurements VBAT@TX • rule_id edge counters • noise_floor Discriminator A vs B root cause First fix debounce / threshold gain / time-gate / RC Retest matrix • scenarios • IR same log fields Unified evidence fields: rule_id • noise_floor • VBAT_min@TX • BOR_flag • RSSI/LQI • PER • edge_count
Figure F12. Each FAQ answer is forced into a closed loop: two measurements → discriminator → first fix → retest with the same tables and log fields.
Cite this figure • Suggested caption: “Evidence-locked FAQ loop for contact and glass-break sensors (local rules + power/RF/EMC proofs).”