Skew & Alignment for Clock Trees: Budget, Deskew, Verify
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Skew & Alignment is about controlling when each channel’s clock edge arrives at the receiver decision point—so the relative timing stays inside your system’s tolerance window across temperature, supply, and time. This page turns that goal into a repeatable method: define the measurement point and window W, allocate a skew budget, choose correction architecture (ZDB/trim/deskew), and verify with clear pass gates.
What “Skew & Alignment” really means
Skew is the relative arrival time difference (Δt) between two (or more) clock channels, measured at a defined reference point. For system correctness, the only reference point that consistently matches real failures (setup/hold loss, sampling phase error, alignment slips) is the receiver decision point—the threshold crossing that actually triggers downstream logic or sampling.
Alignment is the set of circuit and calibration actions that compress Δt into the system tolerance window and keep it there across temperature, supply, and time. Alignment is not “pretty waveforms”—it is margin control with measurable pass criteria.
- Channel-to-channel: Δt between outputs/channels inside the same distribution tree or module.
- Edge-to-edge: Δt between specific edges (e.g., rising-to-rising) under the same trigger condition.
- Time-of-arrival @ receiver (default): Δt measured at the receiver decision point; other definitions must be translated to this point before budgets or pass/fail decisions.
- Δt_static: steady-state offset at a fixed condition (room/steady temperature).
- Δt_drift/°C: differential thermal sensitivity; a primary cause of “passes at room, fails during temperature ramps.”
- Δt_over_time(W): observed drift/wander within an observation window W. Choose W to match the system decision horizon (training period / calibration interval / control update cadence).
- Δt_pkpk and Δt_RMS: worst-case vs statistical views within W. RMS is used here as a measurement statistic only (not a substitute for phase-noise/jitter integration).
- This page focuses on inter-channel skew/drift, alignment architectures, and verification gates.
- Phase-noise integration and RMS jitter window math are covered in Phase Noise & Jitter.
- PLL loop bandwidth design is covered in Loop Bandwidth.
Why skew is the hidden margin killer
Timing success is controlled by the remaining valid window. Skew consumes that window directly. When the window becomes thin, systems that look “fine” on the bench can fail intermittently under temperature ramps, supply variation, or longer observation periods.
- Skew appears as equivalent phase error between channels, degrading cross-channel consistency and increasing calibration burden.
- The correct budgeting entry is the allowed alignment error Δt_allow derived from the application’s phase tolerance (not from trace length alone).
- Skew reduces effective setup/hold margin. A small reduction can flip a stable link into occasional training failures.
- Debug focus should be on receiver-level arrival time, not transmitter-only waveforms.
- Short-term: dispersion observed inside a window W (often looks noise-like).
- Long-term: differential movement with temperature or time, captured by Δt_drift/°C and Δt_over_time(W).
- If failures correlate with warm-up, ramps, or long runs, drift terms dominate—static skew alone is not sufficient.
Skew taxonomy that actually helps debugging
Skew problems are easiest to solve when each observation is mapped into a small set of classes. The classification must be driven by what moves (static vs dynamic), how it behaves (deterministic vs random), and who moves together (common-mode vs differential).
- Constant under fixed conditions? (repeat three times; compare Δt_static vs Δt_pkpk over a fixed window W)
- Moves with a single variable? (temperature ramp, supply step, load change; observe drift slope/trend)
- Moves together or pulls apart? (correlation check; same fanout output vs different outputs; A−B method)
- Deterministic terms first: topology/trace mismatch, termination/threshold definition, channel delay deltas.
- Random terms second: describe with windowed statistics (Δt_pkpk, Δt_RMS in a defined W) without expanding into phase-noise theory.
Skew budget & allocation
A skew budget is a traceable contract: define the allowed alignment error Δt_allow, allocate it to measurable contributors, and recover it during verification and production. The budget must reference the same anchor point used throughout this page: arrival time at the receiver decision point.
- Δt_allow comes from system tolerance (sampling phase tolerance, interface window, or algorithm margin).
- Define the observation horizon W (training period / calibration interval / control update cadence) for windowed statistics.
Endpoint terms describe how the receiver converts edges into a decision time. If endpoint sensitivity is high, small waveform differences can appear as large arrival-time deltas.
Distribution terms are created by the clock-tree stages (fanout, ZDB, crosspoint, mux) and their path asymmetries. These terms are usually the most controllable in architecture and placement.
Interconnect terms come from PCB routing, connectors, and cables. Even if trace lengths match, discontinuities and temperature coefficients can create differential delay under real operating conditions.
- Deterministic terms (trace/topology, fixed channel deltas, defined threshold offsets) add as worst-case.
- Random terms measured within a window W combine as RSS to represent typical statistical spread.
- Compression priority: reduce deterministic contributors first to protect worst-case tails.
- Allocate margin for Δt_drift/°C across expected gradients and ramp rates.
- Reserve tail margin for lot-to-lot and channel-to-channel distributions.
- Define pass criteria using “X / your budget” placeholders until the system budget is finalized.
Root causes map (from common to deadly)
A practical root-cause map prioritizes high-probability and low-cost fixes first, then moves to high-impact mechanisms that often only appear under ramps, load steps, or long observation windows. Each item below is written to produce a measurable next test and a clear stop condition.
- Topology / length mismatch (most common; cheapest to confirm/fix)
- Output standard / termination error (threshold & ringing → crossing-time drift)
- Device channel delay mismatch (output-to-output skew; PVT sensitivity)
- Supply coupling (VDD noise/steps → delay/threshold modulation)
- Thermal gradient / mechanical stress (most “deadly” during ramps and long runs)
- Symptom: stable offset between channels; board-to-board differences repeatable.
- Quick verify: swap endpoints (or swap the two paths at the entry) and check whether Δt follows the path; compare same-layer/same-via-count routes.
- Typical fix: enforce symmetric topology (layer, via count, reference return); align closer to the receiver (reduce post-alignment asymmetry).
- Pass criteria: Δt_static < X / your budget and remains consistent over repeated measurements.
- Symptom: amplitude looks “fine”, yet Δt changes with probe/cable/termination; ringing crosses the decision threshold.
- Quick verify: compare correct termination vs mild mismatch and observe the threshold-crossing time shift; check if overshoot/undershoot spans the threshold line.
- Typical fix: restore standard-compliant termination (source/endpoint/differential); control return paths and discontinuities; reduce ringing before adding calibration.
- Pass criteria: termination changes no longer push Δt_pkpk(W) beyond X / your budget.
- Symptom: Δt changes when switching output ports or replacing the distributor; drift grows under temperature or supply changes.
- Quick verify: keep interconnect fixed; compare outputs within the same device and across devices; log Δt across a small temperature range.
- Typical fix: select lower-skew/lower-drift distribution parts; keep critical channels within the same bank; add programmable trim to cover tail cases.
- Pass criteria: Δt_drift/°C < X / your budget across the operating temperature range.
- Symptom: Δt correlates with load activity or rail ripple; alignment slips appear after system mode transitions.
- Quick verify: apply a controlled VDD step (or change load state) while logging Δt; compare rail filtering paths and local decoupling.
- Typical fix: isolate sensitive rails, add local filtering/decoupling, avoid shared return paths, keep noisy domains away from clock-tree stages.
- Pass criteria: Δt_over_time(W) under VDD disturbance remains < X / your budget.
- Symptom: passes at steady temperature but fails during ramps; airflow, local heating, or mounting changes shift Δt.
- Quick verify: local heat/cool perturbation vs global ramp; change airflow direction; check repeatability after mechanical re-seat.
- Typical fix: reduce gradients (placement, shielding, airflow), avoid stress points, add periodic re-trim or closed-loop deskew when needed.
- Pass criteria: under specified ramp/airflow conditions, drift and windowed variation remain < X / your budget.
Alignment architectures (which path to choose)
Alignment architectures differ by where skew is created, where it can be corrected, and whether the system has a reliable observable (monitor/TDC) for closed-loop deskew. The options below are ordered from lowest complexity to highest capability.
- Use when: deterministic skew dominates and the alignment point is close to the receiver.
- Benefit: lowest risk; improves worst-case tails by removing structural asymmetry.
- Risk: “equal length” is not equal delay under discontinuities and return-path differences.
- Use when: multiple domains need consistent timing from a single tree stage.
- Key detail: define where the feedback “alignment reference point” sits; align to the correct node, not just inside the buffer.
- Risk: asymmetric feedback routing shifts skew to the next stage rather than eliminating it.
- Use when: board-to-board, cable links, or fine channel trims are required.
- Key parameters: step size, range, and drift. Step too coarse or range too small prevents convergence.
- Risk: configuration management (boot defaults, EEPROM versioning, field updates) becomes part of production quality.
- Use when: dynamic differential drift is the dominant failure mode and must be tracked.
- Critical risk: measurement noise/quantization injects error into calibration; update strategy must avoid chasing noise.
- Boundary: loop theory details belong to the Loop Bandwidth page; this section focuses on architecture and risk paths.
- Use when: redundancy and failover are required; routing must be switchable without service interruption.
- Skew impact: different routes create different delays and drift; switching may introduce a step that must be budgeted.
- Risk: “hitless” does not mean “phase-invariant”; treat path deltas as budget contributors.
Calibration & compensation flow (power-up, online, thermal)
Alignment is not a one-time action. A production-ready deskew strategy needs a repeatable loop with clear triggers, measurable outputs, safety guardrails, and logs that support root-cause analysis when drift appears in the field.
- Power-up deskew: establish baseline offset0 and store “last-good” settings.
- Online re-trim: periodic or event-driven updates to keep Δt inside the budget window.
- Thermal compensation: use d(Δt)/dT to predict slow drift; avoid full recalibration when not required.
- Thermal trigger: recalibrate when |ΔT| exceeds X°C / your policy with hysteresis to prevent ping-pong updates.
- Quality trigger: run deskew when Δt_over_time(W) approaches X / your budget or when training/lock alarms occur.
- Time trigger: a periodic sweep is acceptable only with minimum sample and confidence gates.
- Use the same definition: measure at the receiver decision point (consistent threshold definition).
- Capture context: temperature proxy, rail state, load state, mux route, fanout output, termination snapshot.
- Window W: log W and sample count; compute pk-pk and drift curve; RMS can be recorded as a window statistic only.
- Baseline: store offset0 from power-up calibration and treat it as the reference for later comparisons.
- Separate drift: distinguish common-mode drift (both channels move together) from differential drift (relative movement that kills margin).
- Quality gate: require minimum samples and repeatability before updating parameters to avoid “learning noise”.
- Step limit: cap each update to |Δcode| ≤ X / your policy to avoid overshoot.
- Hold last-good: if measurement noise rises or data is insufficient, freeze at the last verified configuration.
- Rollback: if verification fails, revert to last-good and reduce update rate or widen the confidence gate.
- Verify: re-measure with the same definition and window W; confirm Δt_static and Δt_over_time(W) remain within X / your budget.
- Sanity check: swap channels or probes and confirm the measured Δt behaves consistently (detect measurement-induced skew).
- Log: store environment + configuration + stats + decision; use versioning and CRC for persistent settings.
Measurement setups that don’t lie (true skew)
Many “skew” problems are measurement artifacts: trigger noise, probe loading, threshold mismatches, and inconsistent timebases can create apparent Δt that does not exist at the receiver. Reliable setups enforce common reference/trigger paths and validate with swap tests.
- Why: removes common timebase and trigger drift from the measurement result.
- How: measure edge-to-edge difference under the same trigger; keep threshold definition consistent.
- Pass criteria: swapping probes/channels mirrors the sign or relocates Δt predictably (detects setup bias).
- Why: separates common-mode movement from differential drift that kills margin.
- How: compare two taps from the same fanout output against two taps from different outputs.
- Pass criteria: same-output taps show stronger correlation; different-output taps expose differential behavior.
- Why: separates short-term variation from long-term drift that causes intermittent failures.
- How: record Δt_pkpk(W), Δt_RMS(W), and Δt_over_time(W) with explicit W and sample count.
- Pass criteria: changing W shifts metrics predictably; unexpected sensitivity indicates setup artifacts.
- Use a common reference and common trigger for A−B timing.
- Keep threshold definition consistent with the receiver decision point.
- Use swap tests (swap probes/channels/paths) to detect setup bias.
- Document W, sample count, and instrument settings for repeatability.
- Verify with the same termination and loading expected in the system.
- Do not mix timebases or triggers across channels and call the result “true skew”.
- Do not change probe type/bandwidth/grounding between channels without logging it.
- Do not ignore probe loading that shifts crossing time under ringing.
- Do not change threshold definitions between measurements (50% vs fixed threshold vs receiver point).
- Do not interpret a single short capture as long-term drift evidence.
PCB/layout rules that dominate skew (what really decides alignment)
Board-level skew is dominated by a small set of layout details that change effective group delay and receiver edge crossing time. The rules below focus on what reliably moves Δt (static) and what makes Δt drift with temperature, supply, and loading.
- Geometry: length/phase match, same layer and dielectric, equal via count/stack, consistent neck-downs.
- Return path: avoid plane splits/slots; keep reference continuity under the pair to prevent edge shape drift.
- Termination & standard: wrong location or common-mode window issues change crossing time and make Δt drift.
- Supply isolation: rail noise modulates buffer delay/threshold; treat clock rails as delay-sensitive.
- Connector/cable: group delay mismatch and thermal/mechanical sensitivity must be measured and budgeted.
- Match electrical length to the receiver point: treat length as effective group delay; keep mismatch below X (mm or ps) / your budget.
- Same layer & dielectric where possible: layer swaps can change delay per unit length and introduce systematic skew even when “mm match” looks correct.
- Equal via count and style: one extra via (or different anti-pad/return path) can shift delay and increase edge distortion that moves the crossing time.
- Never cross plane splits or slots: return current detours change edge shape, making apparent skew temperature- and load-dependent.
- Keep reference continuity under the pair: avoid long voids or cut-outs under either leg; local discontinuities can dominate skew more than mm-level length match.
- Avoid aggressive via stubs near the pair: stubs and nearby discontinuities create ringing; ringing changes crossing time and raises Δt_pkpk(W).
- Place termination where the standard expects: wrong location increases reflections; reflections move the edge crossing time differently per channel, creating skew.
- Respect common-mode windows: if the receiver threshold region is stressed, crossing-time sensitivity increases and Δt becomes supply/temperature dependent.
- Make both channels “see the same impedance profile”: symmetry matters; small asymmetry turns into different ringing and different effective ToA at the decision point.
- Treat clock rails as delay-critical: rail noise modulates output buffer delay and threshold behavior, causing Δt_over_time(W) growth.
- Use local filtering and short return loops: reduce coupling from digital rails into clock drivers and fanout devices that set relative timing.
- Keep channel symmetry in decoupling: asymmetry in supply impedance can create channel-to-channel delay differences under dynamic load.
- Assume tolerance unless proven otherwise: connector and cable pairings can add deterministic Δt and temperature-dependent drift.
- Control pair mapping and symmetry: consistent pin assignments and return pin patterns reduce skew sensitivity across builds.
- Measure and budget it: treat it as an interconnect term; if it varies with temperature, plan compensation hooks.
Use the system skew budget to set X. Express criteria in mm (layout) or ps (measurement) depending on the review gate.
Pass criteria & verification gates (prove alignment in real conditions)
Alignment must be proven across the conditions that create drift. These three verification gates provide a repeatable acceptance path for integration and production: static skew at room temperature, drift across temperature, and stability over the application window W.
- Setup: stable supply, fixed routing/path, consistent termination and threshold definition.
- Measure: Δt_static at the receiver decision point.
- Pass: Δt_static < X / your budget.
- Setup: temperature ramp with defined points and stabilization policy (avoid mixing steady-state and ramp data).
- Measure: Δt_drift (ps/°C) or Δt_pkpk over the temperature range.
- Pass: Δt_drift < X ps/°C or Δt_pkpk(T-range) < X / your budget.
- Setup: run the system in its normal mode and capture timing for the defined window W (application-dependent).
- Measure: Δt_pkpk(W) and Δt_over_time(W) (RMS can be recorded as an additional metric).
- Pass: metrics remain < X / your budget across repeated captures and reboot cycles.
Use a small, consistent set of stress conditions to reveal hidden drift. Keep measurement definition and window W fixed while changing only one condition at a time.
- Fail Gate-1: first suspect interconnect geometry, termination placement/symmetry, and receiver threshold definition.
- Pass Gate-1, fail Gate-2: suspect PVT sensitivity (device delay vs supply/temperature, thermal gradient, rail coupling).
- Pass Gate-2, fail Gate-3: suspect slow drift sources (warm-up effects, time-dependent rail behavior, background switching, mechanical movement).
- Next step: attribute to endpoint / distribution / interconnect and reconcile with the allocation in the skew budget section.
Engineering checklist: make alignment repeatable
This section turns skew control into an SOP: frozen definitions, a chosen correction point, layout review checklists, bring-up scripts, and a logging schema that supports root-cause mapping back to endpoint / distribution / interconnect.
Spec freeze (definitions that must not move)
Freeze the measurement meaning first. A drifting definition creates “phantom skew” and invalidates all later gates.
- Skew definition uses receiver decision point time-of-arrival (ToA); no source-side substitution.
- Alignment reference point is named and physically measurable (ZDB feedback point / RX threshold point / monitor node).
- Window W is fixed (duration + sampling method), used everywhere for pk-pk / drift / stability checks.
- Outputs to report are fixed: Δt_static, Δt_pkpk(W), Δt_over_time(W), Δt_drift/°C (RMS optional as a label only).
- Measurement consistency rule is frozen: same reference, same trigger, same threshold definition, same path conditions.
- Spec artifact exists: “Spec Freeze Sheet v1” signed off (single source of truth).
Architecture freeze (where skew is corrected)
Lock the correction layer and reference point. Late topology changes often create unmonitored skew paths.
- Correction strategy chosen: passive match / ZDB / programmable delay / closed-loop deskew (TDC/monitor → delay trim).
- Correction point fixed (distribution vs endpoint). Avoid “half-corrected” paths.
- Redundancy path defined: main/backup switching does not introduce uncontrolled Δt step beyond Δt_allow.
- Observability defined: phase/frequency monitor and missing-pulse/LOS monitoring nodes exist (bench + field).
- Calibration permission set: power-up only vs online (trigger conditions defined using placeholders: ΔT > X°C, alarm, time > X).
Layout freeze (reviewable board rules)
Convert layout rules into review items. Every exception must map to an explicit Δt increment and still fit Δt_allow.
- Diff pairs are routed with the same dielectric / layer preference; via count and via type are symmetric.
- Length/phase mismatch is bounded: length mismatch < X mm or Δt < X ps (as defined by the budget).
- Return path is continuous: no plane split crossing, no slot under the pair, no forced detours around keep-outs.
- Termination and standard are consistent (LVDS/HCSL/LVPECL): placement is symmetric and does not shift crossing time unequally.
- Clock supply and ground isolation plan is executed: delay vs supply path is minimized and repeatable across channels.
- Connector/cable contribution is bounded or made measurable (test points / calibration hooks exist).
Bring-up & production (scripts + ATE + monitoring)
Alignment is not a one-time bench win. Gate-based verification and log completeness enable repeatability across resets, temperature ramps, and field drift.
- Trigger: power-up / reset / ΔT > X°C / alarm / time > X.
- Measure: common reference and a fixed window W; report Δt_static + Δt_pkpk(W) + drift trend.
- Estimate: update only when measurement quality is sufficient (avoid over-tuning when noise dominates).
- Apply: delay/phase trim or path selection; keep a rollback point (offset0).
- Verify: run Gate-1/2/3 (room / temperature / time-window stability) as a minimal set.
- Log: always log context (temp, vdd, mode, path) plus results and gate outcomes.
- Repeatable Δt_static measurement in fixture; correlation check (same fanout output vs different output).
- Temperature proxy when full sweep is unavailable: two-point comparison + drift direction sanity check.
- Alarm chain verification: missing pulse / LOS / phase-offset alarm triggers and is logged.
- Configuration capture: mode, output standard, termination option, correction setting snapshot.
Log schema (field-ready, root-cause friendly)
Use a list (not a wide table) to stay mobile-safe. Each field must be short, measurable, and stable across firmware versions.
- timestamp — time reference used for correlation.
- board_id, channel_id, path_id — includes main/backup/bypass.
- ref_point — alignment reference point identifier.
- W — measurement window setting.
- Δt_static_ps — room/static offset.
- Δt_pkpk_ps_W — peak-to-peak within window W.
- Δt_over_time_ps_W — drift across window W.
- Δt_drift_ps_per_C — slope when temperature is available.
- temp_C, vdd_mV — key environment/context.
- mode — output standard / divider / correction setting snapshot.
- gate_result — Gate-1/2/3 pass/fail tags.
- alarm_flags — missing pulse / LOS / phase-offset / unlock indicators.
Applications & IC selection notes (skew-focused)
This section is the only place that discusses application mapping and part categories. Earlier sections stay definition/measurement/budget oriented. All part numbers below are reference starting points only—verify package, suffix, output format, voltage, temperature grade, and availability.
A) Multi-ADC synchronous sampling (coherent / array)
- Alignment object: sampling edge ToA across channels at the receiver/ADC clock input.
- Window W: short W for instantaneous coherence + long W for drift exposure.
- Dominant risk: differential drift across temperature and supply (static match alone is insufficient).
- Typical lever: multi-output distribution with per-output delay trim + a measurement hook for validation.
B) JESD204 subclass-1 style alignment (SYSREF/LMFC)
- Alignment object: device clocks and the alignment event reference at the endpoint(s).
- Window W: W must cover the alignment event and the stability window required by the system.
- Dominant risk: routing asymmetry + output delay drift breaks deterministic alignment.
- Typical lever: clock distribution with deterministic delay controls and repeatable synchronization/verification gates.
C) Multi-endpoint refclk distribution (PCIe/SerDes ecosystems)
- Alignment object: refclk ToA at each endpoint input threshold.
- Window W: both short stability and long drift window are relevant for field reliability.
- Dominant risk: switching/translation paths create unequal delay or threshold-dependent crossing shifts.
- Typical lever: fanout buffers with redundant input switching + monitoring (LOS/missing pulse) to prevent silent failures.
D) Multi-board / crate synchronization (board-to-board)
- Alignment object: board-to-board delay and drift (connector/cable adds group delay + temperature sensitivity).
- Window W: long window dominates; drift is often the failure trigger.
- Dominant risk: temperature gradient + mechanical stress changes differential delay.
- Typical lever: per-board trim + closed-loop deskew using a phase/time monitor; log-based trend detection.
Selection logic (choose by the control objective)
- Category: fanout buffer / ZDB.
- Key specs: output-to-output skew, additive jitter floor, output format/termination options.
- Verification hook: Gate-1 static + correlation check (same output bank vs different bank).
- Category: programmable delay/phase (or distribution chips with per-output delay blocks).
- Key specs: delay step size, total range, delay drift vs temperature/supply, update determinism.
- Verification hook: Gate-2 drift + Gate-3 window stability after applying trims.
- Category: crosspoint / glitchless mux / redundant-input buffers.
- Key specs: switchover behavior (no runt pulses / controlled phase bump), path delay symmetry, LOS behavior.
- Verification hook: switching stress test + re-check Δt against Δt_allow.
- Category: phase/frequency monitor, missing pulse/LOS monitors, TDC hooks.
- Key specs: monitor coverage (missing pulse / runt / frequency), resolution, alarm latency.
- Verification hook: forced-fault injection (missing pulse / frequency offset) + alarm logging correctness.
Reference material numbers (examples only)
These part numbers are provided to speed up datasheet lookup and field verification. Final selection must be driven by the skew budget, output format, voltage domain, temperature range, and verification gates.
- Texas Instruments:
LMK1C1102,LMK1C1104(fanout buffers). - Microchip:
ZL40213(1:2 LVDS fanout),ZL40260(2×10 LVPECL fanout). - Texas Instruments:
CDCF5801A(PLL-based phase alignment + programmable delay control).
- Texas Instruments:
LMK04828(clock distribution with phase/delay adjustment blocks). - Analog Devices:
AD9528(multi-output clock generator/distribution with coarse/fine delay features). - Texas Instruments:
CDCF5801A(phase align / delay control for alignment tasks).
- Renesas:
8V54816A(multi-port clock cross-point switch family). - Texas Instruments:
DS90CP02,SN65LVCP22(2×2 LVDS crosspoint switches). - Skyworks:
Si53301(any-format buffer with glitchless input switching + LOS monitor). - Microchip:
SY89838U(fanout buffer with redundant-input runt-pulse-eliminator MUX).
- Texas Instruments:
LMK05028(reference input monitoring blocks: missing pulse / runt pulse / frequency / phase validation options). - Texas Instruments:
LMK5C33216(reference monitoring: frequency/missing pulse/runt pulse monitors depending on input type). - Texas Instruments:
TDC7200(TDC hook for time-difference measurement / deskew loop prototyping).
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FAQs: Skew & Alignment troubleshooting
Short, executable fixes only. Answer format is always: Likely cause / Quick check / Fix / Pass criteria. Thresholds use X / your budget placeholders and must be tied to the same reference point and window W.