Return to Hub — Buck / Boost / Buck-Boost Regulators
This page explains how to generate stable negative rails with an inverting buck-boost: core principles, soft-start and dual CV/CC control, practical layout & EMI tips, validation steps, and an IC selection guide. It helps engineers design, verify, and choose parts for −V rails.
Inverting Buck-Boost (−V Rail) — Intro
An inverting buck-boost converts a positive input into a regulated negative rail with a single inductor and a ground-referenced switch node. It excels at −3.3 V/−5 V/−12 V supplies for op-amps, sensor bias, and mixed-signal cards. Stability is constrained by a right-half-plane zero (RHPZ) and by hand-off between constant-voltage (CV) and constant-current (CC) behavior. Robust designs implement soft-start, pre-bias protection, and tight hot-loop layout to prevent reverse discharge and start-up glitches. Start by checking VIN range vs target −VOUT, stress across switch/diode (≈ VIN + |VOUT|), RHPZ-aware compensation, and CC limit sized for safe analog biasing.
Principle
Ideal transfer (CCM) |VOUT| = ( D / (1 − D) ) · VIN (sign is negative by inversion)
Duty trend As |VOUT| increases, D → 1 and device stress rises ≈ VIN + |VOUT|.
Inductor ripple ΔIL ≈ ( VIN · D ) / ( L · fS ) (watch the DCM corner at light load).
RHPZ ωRHPZ ≈ ( IOUT · (1 − D)² ) / ( L · |VOUT| ) lowers allowable crossover; grows with load current.
Output pole ωPO ≈ 1 / ( RLOAD · COUT ) • ESR zero ωZESR ≈ 1 / ( RESR · COUT )
Compensation Choose fC well below ωRHPZ; place a compensator zero near the power pole and account for ESR zero lift. Coordinate the outer CV loop with CC clamp/loop to avoid oscillation at the boundary.
Example. From +12 V to −12 V at 0.5 A using L = 10 µH and D ≈ 0.5: ΔIL ≈ (12 · 0.5)/(10e−6 · fS). For fS = 500 kHz, ΔIL ≈ 1.2 App. As load increases, ωRHPZ rises, so keep fC comfortably lower and verify with loop-gain injection.
Architectures
Single-Inductor Inverting Buck-Boost
Smallest BoM and footprint; straightforward CV+CC implementation, suitable for −3.3/−5/−12 V rails ≤≈1 A.
- Pros: Compact, simple control, easy to add foldback/CC clamp.
- Trade-offs: Device stress ≈
VIN + |VOUT|; RHPZ limits bandwidth; diode loss unless synchronous. - Use when: Bias rails for op-amps/sensors; moderate load; tight space.
2-Switch Inverting
Higher efficiency and improved CC behavior for heavier loads or larger |VOUT|.
- Pros: Lower rectifier loss; better thermal headroom; robust CC region.
- Trade-offs: More components, tighter layout/drive timing, compensation detail ↑.
- Use when: −12/−15 V at higher current; thermal margins are critical.
Synchronous vs Diode
- Diode: Quick design, lower cost; loss =
I · VF; good at light/intermittent loads. - Synchronous: Efficiency ↑ at heavy load; requires reverse-current control and safe dead-time.
I·VF vs I²·RDS(on). Choose diode for light/peaky loads, sync for sustained heavy load.Current Sensing
- Low-side shunt: Simple, large signal; requires Kelvin and PGND noise control.
- Inductor DCR: Low loss; RC model & temperature compensation needed.
- High-side/NEG shunt: Needs diff-amp; check common-mode and headroom.
- Limit style: Valley reduces sub-harmonic risk; Peak is intuitive but edgy near boundaries.
Dual Loops: CV + Current
- Outer CV loop sets −V; inner current-mode loop stabilizes power stage.
- CC function as clamp or dedicated loop; tune the hand-off to avoid oscillation.
- PFM/burst at very light load may hinder loop measurement; consider PWM-only during validation.
Design Rules
Inductor Sizing
Target ripple: ΔIL ≈ 20–40% · IL(avg) at mid-VIN.
ΔIL ≈ ( VIN · D ) / ( L · fS ) ⇒ L ≈ ( VIN · D ) / ( ΔIL · fS )
IPK ≳ IOUT · ( |VOUT| / VIN ) + ΔIL/2. Ensure core saturation rating ≥ 1.2× IPK.At very light load, DCM/skip alters dynamics—limit bandwidth and validate loop stability in PWM-only mode if needed.
Switches & Diodes
- Voltage stress: both sides ≈
VIN + |VOUT|; choose ≥20–30% margin. - Current stress: size for conduction RMS and IPK; consider thermal rise with copper spreading.
- Diode choice: Schottky favored; check
Iavg ≥ IOUT, Tj at worst case; fast-recovery noise matters for EMI. - Synchronous: gate timing prevents reverse discharge; limit reverse current; optimize dead-time without sacrificing rectification integrity.
Output Network
Combine low-ESR bulk with small HF MLCC near the negative output return. Keep NEG ground local and route with care to avoid polluting analog ground.
ωZESR ≈ 1 / ( RESR · COUT )
Compensation
ωRHPZ ≈ ( IOUT · (1 − D)² ) / ( L · |VOUT| )
fC ≤ fRHPZ/5 with phase margin ≥ 45–60°.- Place compensator zero near the power pole; leverage ESR zero to lift phase where appropriate.
- Use adequate slope compensation in current-mode; narrow bandwidth near mode boundaries.
- Validate with injection (see Validation section): document fC, PM, GM across VIN/IOUT corners.
Soft-Start & Pre-Bias
- Use reference ramp and/or current clamp for predictable inrush and glitch-free startup.
- Block reverse discharge paths (body diode/sync FET) when −V is pre-biased before start.
- Sequence with UVLO/OVP awareness; log startup profile with/without load.
CC Loop / Current Limit
- Options: foldback, true constant-current, or power-limit. Define accuracy and thermal envelope.
- Valley vs peak limit: valley eases boundary behavior; peak is intuitive but can overshoot near transitions.
- Coordinate CV↔CC boundary (ILIM vs VREF) and add hysteresis/bandwidth shaping if “ping-pong” occurs.
Protections
- UVLO / OVP / OCP / SCP / OTP — OCP should be cycle-by-cycle.
- Short-to-ground on −V: verify foldback curve and thermal shutdown.
- Negative discharge isolation: ideal-diode FETs or back-to-back FETs; snubber to tame SW ringing.
Layout & EMI
Snubber & Damping
Use an RC snubber from SW to PGND to tame ringing. Start with small C and sweep (e.g., 100–680 pF) while observing spike reduction and efficiency.
Heuristic: choose R near the SW-node impedance; place RC close to the switch and rectifier with a short return to PGND.
Input/Output Decoupling
Input RMS current is “boost-like”; rate input capacitors accordingly. Place small HF MLCCs at the switch input and between rectifier and Cout to form the shortest HF return.
Layout Checklist
Validation
Test Matrix
- Startup & pre-bias: cold start with/without load; pre-biased −V; shutdown/restart.
- CV→CC transitions: slow ramp and step into CC; stability and recovery.
- Short & overload: hard/soft shorts; foldback, thermal trip, recovery conditions.
- Line/load transients: VIN dips/surges; load steps in CV and CC regions.
- Thermal: steady-state at 25/55/85 °C; component hot-spots and derating.
- Loop gain (Bode): injection points; disable spread-spectrum; PM and fC across corners.
CV→CC — Slow Ramp
Increase load until reaching ILIM; observe voltage/current hand-off. Tune hysteresis or bandwidth if “ping-pong” oscillation appears at the boundary.
CV→CC — Step
Apply +ΔI step from CV region to force CC, then step back. Measure settling time and undershoot/overshoot; ensure stability in both directions.
Validation Checklist
Measurement Log (copy-ready)
VIN: _______ V VOUT−: _______ V IOUT: _______ A fS: _______ kHz COMP values: R= _______ Ω, C= _______ nF | fC: _______ kHz PM: _______ ° Modes: PWM-only (Y/N) Spread-spectrum OFF (Y/N) Temp: _______ °C Startup: clean (Y/N) Pre-bias reverse discharge (Y/N) CV→CC hand-off: stable (Y/N) settle: _______ μs overshoot: _______ % Short: foldback curve logged (Y/N) thermal trip at: _______ °C Line/load: ΔV/V= _______ % settle: _______ μs Notes: ____________________________________________________________________
IC Selection Guide
Optimize selection by VIN, target −V, IOUT, efficiency/thermal limits, CC needs, rectification (Sync/Diode), and AEC-Q100 requirements. Use the matrix to filter, then jump to a brand bucket or a quick-pick scenario.
−5 V @ 100 mA — Op-Amp Bias
Low noise, small size, light-load efficiency.
−12 V @ 500 mA — Analog Cards
Thermals & efficiency dominate.
−3.3 V Tracking +3.3 V
Sequencing & tracking with PG.
Fixture CC Mode — Protect DUT
Stable CC region, calibrated limit.
AEC-Q −12/−15 V
Wide VIN, cranking, EMC options.
Cost-Sensitive −5 V @ 200–300 mA
BOM priority; acceptable diode loss.
Comparison Matrix (Fields)
| Electrical | Topology | Control | Start & Loops | Protections | Analog UX | System | Commerce | Notes |
|---|---|---|---|---|---|---|---|---|
|
VIN 5–18 V
VOUT− −3.3…−12 V
IOUT up to 0.5 A
fS 300 kHz–2 MHz
Eff. mid/heavy load points
|
Single-inductor
Rect: Diode
|
Current-mode
PFM (switchable)
Slope comp
|
Soft-start: ref-ramp
Pre-bias safe
CC: Clamp
|
UVLO / OCP (cycle) / OVP / SCP / OTP
Neg. discharge block
|
PG/RESET
Rail tracking
Vref acc. noted
|
Iq low
QFN/SOIC
θJA reference
|
Active
Good availability
Cost: $$
|
Layout: small hot loop; PWM-only for Bode.
|
|
VIN 6–40 V
VOUT− −5…−15 V
IOUT 0.5–2 A
fS 200 kHz–600 kHz
Eff. optimized for heavy load
|
2-switch inverting
Rect: Sync
|
Current-mode
PWM-only (test)
Spread-spectrum (switchable)
|
Soft-start: ramp + I-clamp
Pre-bias safe
CC: Foldback/True-CC
|
UVLO/OVP/OCP(SCP)/OTP
Reverse current limit
|
PG/RESET
Tracking/Sequencing
Diagnostic flags
|
AEC-Q100 options
QFN/HTSSOP
θJA/θJC listed
|
Active
Automotive supply
Cost: $$$
|
Thermal copper required; snubber near SW.
|
Tip: keep PFM off during loop-gain tests; set fC ≤ fRHPZ/5; ensure OCP is cycle-by-cycle.
Brand Buckets (Capabilities by Series)
TI
Wide VIN & series depth; current-mode, spread-spectrum, rich PG/tracking; multiple AEC-Q.
ST
Controller + integrated options; EMI-friendly; industrial & auto lines.
NXP
Automotive/industrial focus; EMC & diagnostics strong.
Renesas
Low-noise analog bias orientation; refined startup/loop behavior; auto variants.
onsemi
Efficiency & thermal emphasis; power devices synergy; auto-grade options.
Microchip
Straightforward designs; extensive eval resources; long lifecycle.
Melexis
Automotive/ sensor interface contexts; diagnostics & temp drift control.
Quick FAQ
When to prefer synchronous over a diode? Choose sync for sustained heavy load or tight thermal budgets. For light/intermittent loads, a diode is simpler and often adequate.
How to spot pre-bias-safe ICs? Look for controlled startup paths and reverse-discharge blocking in the datasheet; verify with a pre-biased test.
PFM off? Disable PFM during loop-gain and EMI validation; re-enable only if light-load efficiency is critical and stability is confirmed.
AEC-Q100 vs industrial? AEC-Q100 adds automotive stress/EMC/diagnostic criteria; ensure VIN range and spread-spectrum options suit your EMI plan.
FAQs
When is an inverting buck-boost better than a charge pump?
Choose an inverting buck-boost once load current exceeds a few tens of milliamps, the input varies widely, or strict regulation/EMI control is required. Closed-loop duty control maintains −V across line/load. Charge pumps excel at light loads and fixed ratios, but scale poorly with current and ripple.
How do I estimate duty and device stress?
In CCM, |VOUT|=(D/(1−D))·VIN so D=|VOUT|/(VIN+|VOUT|). Switch and rectifier see ≈ VIN+|VOUT|; add 20–30% voltage margin. Size current for conduction RMS and inductor peak during CC/short testing, not just nominal load.
Where should crossover sit vs the RHPZ and ESR zero?
Set crossover comfortably below the right-half-plane zero: fC ≤ fRHPZ/5. Place a compensator zero near the power pole; use the ESR zero to lift phase if beneficial. Verify phase margin 45–60° across VIN/IOUT corners with PWM-only (no PFM/spread-spectrum) during Bode sweeps.
How to ensure a clean CV↔CC hand-off?
Align the CC threshold with the CV loop’s maximum controllable current. Near the boundary, reduce bandwidth and add small hysteresis if “ping-pong” occurs. Valley current limiting usually transitions more smoothly than peak. Test both slow ramps and steps into/out of CC; log settling and thermal limits.
What soft-start works best with pre-biased −V?
Use a reference ramp combined with a current clamp. Block reverse discharge through body diodes or sync FETs until control is active. Record startup with and without pre-bias; any negative glitch indicates insufficient blocking or clamp headroom. Consider back-to-back FETs or an ideal-diode controller.
Valley vs peak current limit—why prefer valley?
Valley limiting mitigates sub-harmonic tendencies at high duty and yields smoother CV→CC transitions. Peak limiting is intuitive yet can overshoot as ripple adds to the command. If peak mode is required, increase slope compensation and lower crossover near the limit to avoid chatter.
How do I Kelvin-sense the shunt and Cout return?
Use four-terminal routing: carry the shunt’s sense traces separately back to the amplifier/AGND, not through power vias. Kelvin the Cout return to the feedback reference point so the controller senses the same node the load sees. Keep FB/COMP entirely within the AGND island.
How big should the snubber be—where do I start?
Start small and sweep: 100–680 pF with a resistor near the SW-node impedance. Place RC tight to the switch/rectifier and return directly to PGND. Tune by observing ringing reduction versus efficiency/temperature. Over-snubbing raises loss without meaningful EMI benefit.
Why does input RMS look “boost-like”, and how do I size Cin?
The inverting buck-boost draws pulsating current from VIN similar to a boost stage, increasing input capacitor RMS stress. Choose low-ESR bulk plus small HF MLCC close to the switch, and verify RMS/temperature limits. Keep loop area tight to reduce conducted EMI and ripple injection.
How do I track −3.3 V with +3.3 V?
Use a controller with tracking/soft-start that accepts a ramped reference or dedicated tracking pin. Tie PG/RESET and sequencing so both rails rise together and meet POR timing. Confirm pre-bias-safe behavior and disable PFM during validation to avoid skewed timing measurements.
What changes in DCM or with PFM enabled?
In DCM, plant dynamics shift and the effective RHPZ behavior changes, complicating compensation. PFM/burst improves light-load efficiency but disrupts repeatable loop measurements. Validate stability in PWM-only mode first; then enable PFM and re-check output ripple, audio-band noise, and transient response.
How do I test short-to-ground on the negative rail safely?
Use a low-value power resistor for “soft short” before a true short; monitor current limit, foldback, and temperature. Ensure cycle-by-cycle OCP and reverse-discharge blocking. After removal, confirm clean recovery to CV without latch-up or oscillation; log worst-case thermal rise.
Spread-spectrum on or off during loop-gain measurements?
Turn spread-spectrum off for Bode plots. Frequency dithering smears phase/gain and hides crossover/peaks. Use fixed PWM, then re-enable spread-spectrum for EMI work and confirm the margin still meets target. Document both states in your report to avoid confusion later.
Where are thermal hotspots, and how do I predict them quickly?
Expect heat at the rectifier or sync FET, the main switch, and the snubber network. Estimate loss with I·VF (diode) or I²·RDS(on) (sync), plus switching/snubber dissipation. Use copper pours and vias under hotspots; validate with IR imaging at typical and CC conditions.
How accurate can the CC loop be for analog bias, and how to calibrate?
Accuracy depends on shunt tolerance, amplifier offset/drift, and sense filtering. Use a precision shunt, Kelvin routing, and temperature-aware gain calibration. Characterize error over current and temperature; if needed, implement a trim resistor or digital calibration to meet bias-current limits without nuisance limiting.