DDR5 PMIC on-DIMM: Standards & Rationale
DDR5 localizes power conversion on the module: the motherboard typically delivers 12 V (and in some platforms 5 V), while the PMIC on-DIMM generates the required rails for DRAM core, I/O, wordline pump, SPD, and reference. This reduces high-current distribution on the motherboard, improves transient response at the load point, and aligns with JEDEC’s rail/timing requirements for reliable bring-up and operation.
From a JEDEC perspective, typical rails include: VDD ≈ 1.1 V (core), VDDQ ≈ 1.1 V (I/O), VPP ≈ 1.8 V (wordline pump), VDDSPD ≈ 1.8 V (SPD/thermal sensor), and Vref ≈ 0.5×VDDQ (low-noise reference). Sequencing places constraints on Vref vs VDDQ and ensures VPP and other rails are within window during initialization.
- Applies to: UDIMM / RDIMM / LRDIMM / SODIMM families (scope: power rails only).
- Not covered here: motherboard multiphase VRM, eFuse/Hot-Swap, detailed sequencing—see sibling pages.
Power Tree on-DIMM
The motherboard supplies 12 V (and sometimes 5 V). The on-DIMM PMIC converts these to VDD and VDDQ (ampere-level rails for core and I/O), VPP (~1.8 V, hundreds of mA typically), VDDSPD (~1.8 V, tens of mA for SPD/Temp sensor), and Vref (~0.5×VDDQ, sub-mA, low noise). The diagram shows the load association and indicative current classes for system sizing and routing decisions.
Rails & Transients
DDR5 local rails on the DIMM include VDD and VDDQ (≈1.1 V, ampere-class for core and I/O), VPP (≈1.8 V, hundreds of mA for wordline pump), and Vref (≈0.5×VDDQ, sub-mA, ultra-low noise). Ripple targets, transient windows, and the coupling to bring-up timing follow the JEDEC view; use exact numeric limits per the applicable standard. Engineering focus: probe correctly, log steady-state ripple and step-load ΔV/settling.
VDD — ~1.1 V
Core rail; A-class load. Keep ripple low across DC–MHz; capture step ΔV under burst traffic.
VDDQ — ~1.1 V
I/O rail; A-class. Watch simultaneous switching; Vref tracking to VDDQ is time-windowed.
VPP — ~1.8 V
Wordline pump supply; 100 mA+. Ensure within window during init; transient critical at training.
Vref — ~0.5×VDDQ
Reference; sub-mA. Ultra-low noise; filter and sense near receivers; observe VDDQ coupling.
Protections & Telemetry
On-DIMM PMICs implement OVP/OCP/UVLO/OTP per input and rail domains, expose PG/FLT for system sequencing, and support I²C/PMBus telemetry. Fault handling typically chooses between hiccup, latch-off, foldback, or constant-current limiting. Use PMBus/I²C to capture voltage, current, temperature, status, and fault counters; keep a minimal polling set during run time and faster sampling in anomaly windows.
| Current limiting mode | Behavior | When to use |
|---|---|---|
| Hiccup | Periodic retry after cool-down; average power kept low. | Shorts / uncertain recovery, protect connectors. |
| Latch-off | Trips once; requires host or power-cycle to restart. | Safety-critical paths; avoid oscillatory stress. |
| Foldback | Limits current vs. voltage; reduces thermal load. | Startup into heavy caps; soft-fault scenarios. |
| Constant-current | Holds at limit; output droops as needed. | Predictable soak tests; coordinated thermal design. |
Minimal telemetry set (I²C/PMBus)
- Vin, Iin; per-rail V/I for VDD, VDDQ, VPP; PMIC temperature.
- PG/FLT status; UVLO/OVP/OCP/OTP last cause; fault counters with timestamp.
- Polling: 10–100 ms typical during run; increase rate on anomalies.
Bring-up checklist
- Confirm UVLO thresholds/tolerances before power-in.
- All PG pins valid within window; verify Vref vs VDDQ.
- Inject short over-current; observe limit mode & recovery.
- Log PMBus status/fault counters with timestamps.
Site loop
Return to the PMIC hub or related pages without duplicating content.
Efficiency & Thermal
On-DIMM conversion keeps high current local to the load. Buck efficiency for VDD and VDDQ depends on switching loss, conduction loss, and light-load policy (AAM/PSM). Thermal paths run from die → package pad → top copper → via-in-pad & stitching vias → backside copper plane. Validate with IR/thermocouple and log power (I²R + switching) vs. temperature rise; throttle or derate per datasheet/JEDEC guidance.
Efficiency curve
Show light-load region, rated range, and hot-ambient derating. Record VOUT, IOUT, VIN, T_PMIC.
Thermal path
Use via-in-pad + dense stitching to spread heat; keep high-speed routing out of hot copper islands.
Hotspot control
Balance planes, keep decoupling close, and verify ΔT under burst traffic; log PG/FLT transitions.
Decoupling & Power Integrity (PI)
Use layered decoupling to meet target PDN impedance across frequency. Place bulk near inputs, distribute mid values to DRAM clusters, and put high-frequency parts at PMIC/DRAM pins with the shortest loops. Compute a Ztarget = ΔV / Istep goal per rail; smooth multi-resonance created by parallel ESL/ESR with value spread and occasional damping.
Bulk (µF)
Low-frequency energy and start-up; place near 12 V/5 V entry while keeping IO quiet.
Mid (100–470 nF)
Mid-band suppression; distribute across DRAM groups and PMIC outputs.
High-freq (10–47 nF)
Close to pins; smallest packages (0402/0201); minimize loop and inductive leads.
Layout & EMI on DIMM
Place the on-DIMM PMIC, inductor, and high-frequency decoupling to keep switch loops short and return paths locally closed. Prefer a continuous ground plane; only introduce functional splits when required and bridge them with a via-fence. Treat Vref (and VTT where applicable) as sensitive: isolate, filter, and sense close to receivers. To suppress EMI, shrink high di/dt loops, add input π/CM filters, consider an RC snubber at the SW node, and use edge stitching and fences near board boundaries.
Placement
Keep PMIC–inductor–decoupling tight. Minimize SW copper and distance to output caps.
Return paths
Close loops on the nearest plane. Avoid slots under noisy loops; stitch across any gap.
Sensitive nets
Route Vref/VTT with isolation and RC filter; Kelvin sense near receivers, shortest loops.
EMI controls
π/CM filter at input, RC snubber at SW (as needed), via-fence & edge stitching.
Timing & Sequencing
Power-up must satisfy UVLO first, then PMIC soft-start until rails are within window; Vref must track VDDQ within the specified time and level relationship (per JEDEC). Per-rail PG pins feed a merging stage before the host sees system PG. For power-down, avoid losing Vref ahead of VDDQ and discharge under control to prevent back-powering. For hot-plug or brown-out, choose a protection mode (hiccup, latch, foldback), log the fault cause, and retry according to policy.
Bring-up checklist
- Confirm UVLO thresholds; verify soft-start slopes.
- Check Vref vs VDDQ timing window (per JEDEC).
- Validate PG chain logic and debounce parameters.
- Inject hot-plug/brown-out and observe recovery logs.
Validation & ATE
Validate the on-DIMM PMIC with a combined bench and ATE flow: steady-state ripple, step-load ΔV and tsettle, noise, and thermal rise. Under a DDR5-like workload, drive current bursts that emulate read/write duty, capture per-rail voltages/currents, and log PMBus/I²C status and fault codes. Use exact numeric limits per JEDEC and datasheets.
Bench equipment
- DC + dynamic electronic load (scriptable)
- Oscilloscope with bandwidth limit + spring-ground probe
- Infrared camera / thermocouple
- PMBus/I²C adapter for telemetry
Connections
- Kelvin sense at rails; coax ground spring
- Enable input π/CM filter A/B testing
- Thermal vias to backside copper for worst case
Logging (ATE)
- Timestamp, Vin/Iin, V/I per rail, T_pmic
- PG/FLT bits and last fault reason
- Pass/Warn/Fail with ΔV and tsettle
DDR-like dynamic script (outline)
- Set VIN, enable PMIC; poll PG and telemetry.
- Apply burst pattern: read/write duty, pulse width, idle gaps; sweep amplitude and repetition rate.
- Record ripple (limited BW), ΔV and tsettle, temperature, PG/FLT and fault log.
- Repeat across temperature corners and rails; export CSV with timestamps.
IC Selection (7 Brands)
Compare on-DIMM PMIC solutions from Renesas, TI, Infineon, Analog Devices, onsemi, MPS, and Richtek under consistent test conditions. Score efficiency (full/half/light load), package/thermal factors, telemetry coverage, protection behavior, and supply/lead-time risk. Use project-specific weights and maintain a sourcing fallback plan.
| Brand | Efficiency (full/half/light) | Package / Thermal | Telemetry (I²C/PMBus) | Protections | Supply / Lead time | Notes | Score (0–5) |
|---|---|---|---|---|---|---|---|
| Renesas | |||||||
| TI | |||||||
| Infineon | |||||||
| Analog Devices | |||||||
| onsemi | |||||||
| MPS | |||||||
| Richtek | |||||||
| Weights (%) | 30 | 15 | 20 | 20 | 15 | — | — |
DDR5 PMIC on-DIMM — Frequently Asked Questions
How do I keep Vref stable versus VDDQ?
Keep Vref quiet and time-aligned to VDDQ. Generate Vref from VDDQ with a low-noise divider and RC filter, route with a dedicated return/Kelvin sense, and avoid crossing noisy splits. During bring-up, ensure Vref follows VDDQ within the spec window (per JEDEC).
- Place RC close to the receiver pins; shortest loop and isolated return.
- Limit scope bandwidth for ripple measurements; probe at the load.
- Log Vref vs VDDQ timing on power-up and power-down.
What transient targets matter on VPP?
Meet ΔV and recovery during training/initialization. VPP (~1.8 V) powers the wordline pump; verify droop and settling under burst load patterns and across temperature. Use DDR-like current pulses and compare against spec windows (per JEDEC/datasheet).
- Exercise burst read/write scripts; capture ΔV and tsettle.
- A/B test local decoupling and routing options.
- Record PG events and fault logs during stress.
See also: #rails, #validation.
How should I layer decoupling (bulk/mid/high-freq)?
Design to a target PDN impedance. Define Ztarget=ΔV/Istep per rail, then place bulk at the entry, distribute mid-band caps to clusters, and put high-freq caps at pins in tiny packages to minimize loop inductance.
- Spread values/ESL to avoid sharp multi-resonance dips.
- Use damping only where necessary to flatten peaks.
- Validate in both frequency (VNA) and time domain (step load).
Why does my PG chatter and how do I stop it?
Rail oscillation around the valid window causes chatter. Add PG debounce, confirm window thresholds, and check that compensation/decoupling keeps the rail stable through load steps. Merge per-rail PG with proper timing before asserting system PG.
- Scope rails and PG on the same timeline; add timing markers.
- Inspect return paths and plane slots under high-di/dt loops.
- Correlate with PMBus status and last-fault registers.
See also: #sequence, #protections, #layout.
Common noise coupling paths into Vref/VDDQ?
SW flux, detoured returns, and shared impedance. Large switch copper near references, slots under loops, and long common returns inject ripple and spikes. Close loops locally, fence edges with stitching vias, and isolate Vref routing.
- Use near-field probes around SW and inductors.
- Reduce loop area; avoid crossing splits; add via fences.
- Apply RC at Vref and evaluate snubbers on SW if needed.
How big should DDR-style load steps be?
Cover the worst-case Istep and edge rates you expect. Build burst patterns (duty/pulse/idle) that bracket system behavior; measure ΔV, tsettle, and ripple with bandwidth-limited probing at the load.
- Parametric sweep of amplitude and repetition rate.
- Run across cold/room/hot to reveal compensation margins.
- Log PG/FLT for correlation with droop events.
See also: #validation, #rails.
How do efficiency drops relate to hotspots?
Loss → heat; heat → higher loss. Conduction and switching losses raise PMIC temperature, which can further reduce efficiency and provoke protection/derating. Spread heat with via-in-pad/stitching and backside copper; log power vs temperature.
- Correlate I²R + switching estimates with IR/thermocouples.
- Check airflow and DIMM stacking scenarios.
- Apply derating policy; monitor OTP/PG behavior.
See also: #thermal, #validation.
Minimum PMBus/I²C telemetry set and rate?
Track inputs, per-rail V/I, temperature, and states. Poll Vin/Iin, V/I for VDD/VDDQ/VPP, PMIC temperature, PG/FLT bits, and fault logs. Use ~10–100 ms during run, accelerate when anomalies are detected.
- Timestamped logs with cause codes and counters.
- Snapshot around events (pre/post buffers).
- Export CSV for matrix scoring.
See also: #protections, #validation.
Which current-limit mode should I choose?
Match to fault profile and thermal goals. Hiccup limits average power under shorts; latch-off avoids oscillatory stress; foldback helps large startup caps; constant-current gives predictable soak tests with careful thermal design.
- Record recovery behavior and last-fault reason.
- Verify connector/device ratings under repeated faults.
- Document policy in the bring-up checklist.
See also: #protections, #sequence.
Can VDD and VDDQ share a source and remain independent?
They can share input but need independent regulation/feedback. Avoid cross-coupling by isolating compensation, providing per-rail decoupling, and validating that simultaneous switching does not violate windows.
- Scope both rails under mixed bursts.
- Place decoupling at each domain’s pins.
- Confirm Vref relation to VDDQ remains valid.
Does VDDSPD need special handling?
Yes—treat it as a small but sensitive 1.8 V rail. Keep it quiet, verify its sequencing relative to the PG chain, and ensure down-time ordering prevents unintended resets or false reads of SPD/thermal sensors.
- Local decoupling and short routing.
- Check power-cycle behavior with logging.
- Confirm host restart policies.
See also: #powertree, #sequence.
Top causes of EMI failures and quick fixes?
Oversized SW copper, detoured returns, and leaky edges. Shrink high-di/dt loops, add input π/CM filtering, consider RC snubber at SW, and stitch edges with via fences to contain fringing fields.
- Scan with near-field probes to localize sources.
- Move Vref/VTT away from inductors and SW nodes.
- Re-route to avoid plane slots under loops.
Didn’t meet Ztarget—tune caps or change layout first?
Fix geometry before piling capacitance. Shorten loops and place high-freq caps at pins; then diversify values/ESL and add light damping where needed. Re-verify in time and frequency domains.
- Prioritize proximity and return integrity.
- Stagger values to smooth multi-resonance.
- Confirm stability margins after edits.
See also: #pi.
How should hot-plug/brown-out recovery be defined?
Write a state machine and log everything. Detect UVLO/OVP/OCP events, protect rails, record fault cause/temperature/counters, then retry per policy or latch off. Validate Vref/VDDQ ordering throughout.
- Document retry cadence and limits.
- Confirm PG timing on re-entry.
- Store last-fault for post-mortem.
See also: #sequence, #protections.
How do I grade lots on ATE: Pass / Warn / Fail?
Use a rail×condition matrix with thresholds. Score ΔV, tsettle, ripple, temperature rise, and PG/FLT events across cold/room/hot, burst, and endurance. Keep timestamped telemetry for traceability.
- Define margins for “Warn” to catch drift.
- Automate CSV export and lot summaries.
- Gate release on matrix pass rate.
See also: #validation.
Resources & RFQ
Download ready-to-use power design templates and submit your on-DIMM PMIC requirements for a response within 48 hours.
Power Tree Template (.xlsx)
Editable tree for VDD/VDDQ/VPP/Vref with load notes and PG chain placeholders.
Updated: 2025-09-01 · ~25 KB
DownloadPDN Target Impedance Calculator (.xlsx)
Compute Ztarget=ΔV/Istep, allocate bulk/mid/high-freq caps, and export BOM slices.
Updated: 2025-09-01 · ~36 KB
DownloadValidation Log Sheet (.csv)
Standardized fields for ripple, ΔV, tsettle, ΔT, PG/FLT and PMBus snapshots.
Updated: 2025-09-01 · ~8 KB
Download