This topic distills everything you need to ship a reliable charger subsystem: CC/CV profiles and JEITA, USB-C/PD negotiation, power-path/OTG and system sequencing, protections and compliance, thermal/layout guardrails, quick sizing math, and bring-up/troubleshooting. It stays scoped to charger PMICs (not general PMICs or BMS) to avoid overlap with sibling pages.
- Clear boundaries: device + adapter + charger PMIC + fuel gauge + eFuse + SYS (typical block).
- Engineer-ready: one-line formulas, probe maps, JEITA tables, and PD/PPS rules you can copy.
- Decision flow: adapter power → I_CHG & time → path & protections → thermal/layout → validation.
Battery Charger PMICs — What Problems Do They Solve?
A charger PMIC coordinates adapter input, battery charging, and the system rail. It implements CC–CV with JEITA temperature rules, safety timers, power-path control (IN/BAT/SYS), and optional OTG boost for peripherals. Neighbor topics such as Fuel Gauge, eFuse/Hot-Swap, and PMBus PSM are covered on their own pages.
I_adapter ≳ 1.3 × I_CHG × (V_batt / (V_adapter × η))
Architectures & Topologies
Linear (LDO-style)
Simple, low noise, minimal externals; heat is the limiter:
P_loss ≈ (V_IN − V_BAT) × I_CHG. Best for compact/low-power (≤1–2 A).
Switching (Buck / Buck-Boost / Charge-Pump)
High efficiency and current. Buck is most common; Buck-Boost covers adapter–battery cross-over; Charge-Pump suits medium power with good EMI/size trade-offs. Synchronous rectification improves light-load.
Single-Cell vs Multi-Cell
1S for handheld/wearables (often USB-C/PD). 2–6S for tools/robots/industrial; balancing is handled by the BMS (see sibling page). External FETs scale power and protections.
Selection flow: Power level → Topology (Linear / Switching) → Cell count (1S / nS) → Interface (USB-C/PD/BC1.2) → Protections & thermals.
Charge Profiles & Chemistry — CC/CV, JEITA, and Cell Types
A practical charger profile follows pre-charge → constant-current (CC) → constant-voltage (CV) → termination/trickle. JEITA temperature rules adapt ICHG and VCV across zones to keep the pack safe. Cell chemistry (Li-ion/LiPo/LFP) sets the CV setpoint and termination behavior; NiMH uses a different algorithm and is included as a compatibility note.
I_pre ≈ 0.1–0.2 × I_CHG (cell below VTH_pre, typically 2.8–3.0 V/1S)I_term ≈ 0.05–0.1 × I_CHG (stop or trickle per chemistry)t_charge ≈ 1.2 × (Capacity_Ah / I_CHG) (includes taper/overhead)Li-ion / LiPo
High energy density. Typical VCV=4.2/4.35 V. Trickle/termination policy per cell vendor. Ensure safety timer and cable-drop margin.
LiFePO4 (LFP)
Flat plateau, robust at temperature. VCV=3.6/3.65 V. Use slightly higher Iterm to avoid “never-finish” near plateau.
NiMH (Supplement)
Not CC-CV; use ΔV/ΔT + timer. Keep as compatibility mode in mixed portfolios; primary focus is Li-based chemistries.
USB-C/PD & BC1.2 Negotiation — Getting Real Power In
PD exposes voltage/current PDOs (SPR 5/9/15/20 V; EPR 28/36/48 V). A charger PMIC as Sink (or DRP) requests a suitable PDO or PPS window. BC1.2 and Type-C default current ads provide a baseline when PD is absent. Always validate cable limits (E-Marker for 5 A) and input foldback behavior under load steps.
P_PD ≥ 1.25 × V_CV × I_CHG / η_path
- Sniff PD logs: request matches PDO, and PS_RDY arrives before enabling CC.
- Verify input foldback (IIN_LIMIT/FOLDBACK) and brown-in/out thresholds.
- Swap cables (3 A vs 5 A E-Marker) and repeat thermal runs.
Power-Path, OTG & System Rail — IN/BAT/SYS Priority & Switching
A charger PMIC arbitrates adapter (IN), battery (BAT), and the system rail (SYS). Typical priority is IN→SYS, then IN→BAT (charge). BAT→SYS is used on brown-in/out or in OTG mode. Robust paths block reverse current and respect soft-start on SYS to avoid brown-outs.
t_SS ≈ C_SYS × ΔV_SYS / I_LIMIT (estimate SYS soft-start)P_OTG_avail ≈ η × V_BAT × I_DISCHARGE (upper bound for OTG peripherals)ΔV_SYS ≈ I_step × ESR_SYS + I_step × (t_resp / C_SYS) (load step droop)Power-Path Modes
Direct IN→SYS, controlled path with ideal-diode FETs, and parallel assist with BAT. Gate control limits inrush and enforces priorities.
SYS Rail Bring-Up
Order: IN_VALID → SYS_SOFTSTART → CHG_EN → (optional) OTG_EN. Capture IN/SYS/BAT/EN pins on a scope to confirm sequencing.
Reverse Blocking & Brown Events
Detect/stop reverse current on IN and SYS. Verify brown-in/out thresholds and foldback behavior (IIN_LIMIT/FOLDBACK).
Protections & Compliance — Electrical, Thermal, and Timers
Safety depends on a stacked strategy: electrical limits (OVP/UVP/OCP/short-circuit), thermal control (OTP/thermal foldback), and time windows (pre-charge/fast-charge/overall timers, watchdog). Couple these with JEITA zones and clear fault→action policies (retry/derate/shutdown/latch).
T_j ≈ T_amb + P_loss × θ_JA (predict junction temp)P_loss_linear ≈ (V_IN − V_BAT) × I_CHG (linear path worst-case)P_loss_switch ≈ P_FET + P_ind + P_switch (switching budget)Electrical Limits
IN/BAT/SYS OVP/UVP with hysteresis, input OCP & foldback, short-circuit response, reverse-polarity & reverse-current block.
Thermal Strategy
OTP + thermal foldback: reduce ICHG and/or VCV, or suspend charging. Validate heatspread and vias under pad.
Timers & Watchdog
Pre-charge/fast-charge/overall safety timers, watchdog keep-alive. Define fault recovery: retry, cooldown, or latch-off.
- Verify OVP/UVP thresholds (IN/BAT/SYS) with hysteresis; inject shorts & foldback.
- Thermal runs: log Tamb, I/V, throttling events; confirm OTP shutdown.
- Safety timers: pre-charge, fast-charge, overall; watchdog keep-alive & recovery.
- EMC pre-scan (conducted/radiated), ESD (contact/air); product-level certification per region.
Thermal & Layout — Heat Paths, Switching Loops, Kelvin Sense & EMI
A robust charger layout starts with clear heat paths, a tight SW loop, clean Kelvin sense, and well-placed NTC. Validate with LISN/near-field probes and keep GND planes continuous.
ΔT ≈ P_loss × θ_JA_eff (reduce by copper area + dense thermal vias)Minimize HS-FET ↔ SW ↔ CIN loop (place CIN at pins; short return to GND)Kelvin sense: star ground (keep sense away from SW node / high dv/dt)Heat Path & Vias
Large copper under power FETs/IC pad; dense via array to inner planes; avoid long necks to the plane; keep mask-less via field for better conduction.
Switching Loop
Shrink HS-FET–SW–CIN loop; optional RC snubber on SW; route SW away from sensors/NTC; solid inner GND plane as return shield.
Kelvin Sense & NTC
BAT/SYS sense pairs as Kelvin connections; star to analog ground; NTC close to the cell hotspot, avoid self-heating and SW coupling.
- Dense thermal via field under hot parts; mask-less if allowed.
- Shortest HS-FET–SW–CIN loop; solid return to GND plane.
- Kelvin sense routed as a pair; star ground; isolate from SW.
- NTC close to cell; verify β table; avoid self-heating.
- EMI: input π/LC near connector; common-mode choke for long USB cables.
Sizing Rules & Quick Math — Adapter, Current, Time, Loss & JEITA
Start with adapter power, back-solve charge current to meet timeline and thermal limits, then pin down JEITA/NTC parameters. The quick math below is copy-and-paste friendly for early sizing.
P_PD_min ≈ 1.25 × V_CV × I_CHG / η_patht_charge ≈ 1.2 × (Capacity_Ah / I_CHG)I_ADP_est ≈ I_CHG × (V_BAT / (V_ADP × η)) × 1.3Adapter Sizing
Budget power with margin for cable loss and efficiency. Prefer PPS to trim voltage/current for thermal headroom.
Charge Current & Time
Pick ICHG from thermal/adapter limits; estimate total time with taper factor α=1.1–1.3; ensure Iterm is appropriate.
Loss & Thermal
Linear worst-case loss (V_IN−V_BAT)×I_CHG; switching loss split across FET/inductor/switching; keep Tj < limit − margin.
Capacity_Ah, I_CHG, V_CV, η_patht_charge = 1.2 × Capacity_Ah / I_CHG,
I_ADP_est = I_CHG × (V_BAT/(V_ADP×η)) × 1.3,
P_PD_min = 1.25 × V_CV × I_CHG / η_pathBring-Up & Troubleshooting — Steps, Probe Points, Remedies
Follow this bring-up path: wiring checks → adapter attach → SYS soft-start → enable charging → verify CC→CV→termination. Capture PD logs if present, and scope IN/SYS/BAT/SW/NTC.
t_SS ≈ C_SYS × ΔV_SYS / I_LIMIT (SYS soft-start time)t_charge ≈ 1.2 × Capacity_Ah / I_CHG (with taper)I_ADP_est ≈ I_CHG × (V_BAT/(V_ADP×η)) × 1.3 (adapter current estimate)- Pre-power checks: polarity, shorts, eFuse orientation, NTC wiring, SYS bulk cap ESR.
- Attach adapter: verify 5 V then PD/BC1.2; confirm
IIN_LIMITand brown-in. - SYS sequence: IN_VALID → SYS_SOFTSTART → CHG_EN → (optional) OTG_EN.
- Charge path: Pre-charge → CC → CV → Termination; log thresholds and times.
- Don’ts: no long thermal runs without monitoring; set safety timers before EVT/DVT.
Troubleshooting — Symptoms → Causes → Actions
| Symptom | Likely Cause | Action |
|---|---|---|
| Not reaching 100% | I_TERM too high; cable drop; NTC mis-zoned | Lower I_TERM; better cable/PDO; calibrate NTC/JEITA |
| Early CV transition | Adapter limiting; input foldback; trace resistance | Increase PDO/IIN_LIMIT; thicken path; reduce drop |
| Thermal current throttling | High θ_JA; copper/vias insufficient | Add copper/vias; improve airflow; use PPS lower V |
| OTG disconnects | Limit too low; cable lacks 5 A E-Marker | Raise limit; use 5 A cable; cap load inrush |
| Ripple / pulse jitter | Loop compensation; sense coupling | Snubber; better Kelvin; ground shielding |
Bring-Up Record Template
Project/Board: _______ Ambient (°C): _______ Airflow: _______
Adapter: PDO/PPS _______ Cable: Model/Length _______
Key Params: I_CHG _____, I_TERM _____, V_CV _____, IIN_LIMIT _____, JEITA table rev _____
Waveforms: IN / SYS / BAT / SW / PD logs | Notes: Risks & Actions → Owner / Due
Chip Shortlist — 7 Brands at a Glance
Below are concise charger PMIC picks per brand (series-level), highlighting cell count, power/path features, interface, and package. For pin-to-pin or cross-brand replacements, ask us—we provide register maps and thermal/loop validation support.
TI — 1S Switching + Path
1S, 2–5 A; power-path, OTG, JEITA; I²C; some variants with USB-C/PD sink; QFN/WLCSP.
ST — 1–2S Compact
NTC table, timers, OTG; up to mid-power; I²C/GPIO; QFN.
NXP — Portable 1S
BC1.2/Type-C front-end friendly, ship mode, low I_Q; I²C; WLCSP/QFN.
Renesas — Multi-Cell Ctrl
2–6S controller + external FETs; telemetry; I²C/PMBus; QFN/TQFP.
onsemi — Efficient 1S
Buck charger, thermal foldback, OTG; good EMI; GPIO/I²C; QFN.
Microchip — USB-Powered
1S charger + path; flexible timers; I²C/SPI; QFN; BC1.2/Type-C friendly.
Melexis — Sensing Front-Ends
Complements chargers with accurate NTC/current sense; improves protection telemetry; small packages.
Frequently Asked Questions — Charger PMICs
Practical answers for bring-up, USB-C/PD negotiation, power-path/OTG, JEITA/thermal, and sizing rules. See also USB-C/PD, Power-Path, Thermal & Layout, and Sizing Rules.
1) Why does charging enter CV “too early”? Cable drop vs. adapter current limit?
I_ADP ≈ I_CHG × (V_BAT/(V_ADP×η)) × 1.3. See #usbc.
2) How should I set termination current (I_TERM)? Will it affect “100%” readout?
0.05–0.1 × I_CHG.
Too high → stops early (capacity left); too low → long taper and heat.
SOC gauges may still show ~100% with different I_TERM; rely on runtime tests as well.
3) What pre-charge threshold (V_TH_pre) and current (I_pre) should I use?
I_pre ≈ 0.1–0.2 × I_CHG.
Keep a safety timer; do not stay in pre-charge for long without monitoring.
4) Which PDO should a Sink request — 9/15/20 V? When is PPS better?
P_PD ≥ 1.25 × V_CV × I_CHG / η_path.
PPS is ideal for thermal tuning: reduce voltage as current drops to minimize loss and inductor ripple. See #usbc.
5) How do Type-C 3 A vs. 5 A cables (E-Marker) cap my maximum charge current?
6) Recommended priority across IN/BAT/SYS? Any brown-in/out tips?
IIN_LIMIT).
7) OTG boost keeps dropping — what are the usual causes?
8) How do JEITA zones map to I_CHG and V_CV adjustments?
9) Thermal foldback vs. OTP — what’s the difference on the scope?
T_j ≈ T_amb + P_loss × θ_JA.
10) My ripple looks “jittery”. Could the SW loop or sensing be the culprit?
11) Where should the NTC go? Do I need calibration?
12) Linear vs. switching charger — how do time and heat trade off?
(V_IN − V_BAT) × I_CHG; switching is efficient but needs layout care.
For ≥1–2 A, switching is usually preferred thermally.
13) How do I estimate adapter power and input current quickly?
P_PD_min ≈ 1.25 × V_CV × I_CHG / η_path and
I_ADP_est ≈ I_CHG × (V_BAT/(V_ADP×η)) × 1.3.
Add margin for cable drop and EMI filtering.
14) Cross-brand pin-to-pin replacement — what must I verify?
15) A full charge stops at ~95–98%. Is it a fault?
Downloads & RFQ
Fixed-name resources (each ≤30 KB) plus fast RFQ. Replace the URLs with your actual file paths if needed.
charger-sizing-worksheet.xlsx
Quick current/time & adapter power estimator (≤30 KB).
jeita-curve-cheatsheet.pdf
JEITA zones and I/V adjustments (≤30 KB).
power-path-reference.pdf
IN/BAT/SYS path, OTG & ship reference (≤30 KB).
charger-bringup-checklist.pdf
Bring-up steps, probe points & logs (≤30 KB).
charger-layout-emi-notes.pdf
Layout & EMI quick notes (≤30 KB).